Patents by Inventor Matthew W. Derstine

Matthew W. Derstine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8698399
    Abstract: A method of sustaining a plasma, by focusing a first wavelength of electromagnetic radiation into a gas within a volume, where the first wavelength is substantially absorbed by a first species of the gas and delivers energy into a first region of a plasma having a first size and a first temperature. A second wavelength of electromagnetic radiation is focused into the first region of the plasma, where the second wavelength is different than the first wavelength and is substantially absorbed by a second species of the gas and delivers energy into a second region of the plasma region within the first region of the plasma having a second size that is smaller than the first size and a second temperature that is greater than the first temperature.
    Type: Grant
    Filed: February 12, 2010
    Date of Patent: April 15, 2014
    Assignee: KLA-Tencor Corporation
    Inventors: Ilya V. Bezel, Anatoly Shchemelinin, Eugene Shifrin, Matthew W. Derstine, Richard W. Solarz
  • Patent number: 8259771
    Abstract: A laser-sustained plasma light source with a bulb for enclosing a relatively cool gas environment, and an electrode disposed at least partially within the gas environment. A power supply applies a potential to the electrode, where the power supply is sufficient to create a corona discharge at the electrode within the gas environment, and the power supply is not sufficient to produce an arc discharge within the gas environment. The corona discharge thereby produces a relatively heated gas environment. A pump laser source focuses a laser beam within the gas environment, where the laser beam is sufficient to ignite a plasma in the relatively heated gas environment, but is not sufficient to ignite a plasma in the relatively cool gas environment.
    Type: Grant
    Filed: July 19, 2010
    Date of Patent: September 4, 2012
    Assignee: KLA-Tencor Corporation
    Inventors: Anatoly Shchemelinin, Ilya Bezel, Matthew W. Derstine
  • Patent number: 8178860
    Abstract: An inspection system for creating images of a substrate. A light source directs an incident light onto the substrate, and a light source timing control controls a pulse timing of the incident light. A stage holds the substrate and moves the substrate under the incident light, so that the substrate reflects the incident light as a reflected light. A stage position sensor reports a position of the stage, and a stage position control controls the position of the stage. A time domain integration sensor receives the reflected light, and a time domain integration sensor timing control controls a line shift of the time domain integration sensor.
    Type: Grant
    Filed: August 20, 2009
    Date of Patent: May 15, 2012
    Assignee: KLA-Tencor Corporation
    Inventors: Gregory L. Kirk, Matthew W. Derstine, Shiow-Hwei Hwang, Isabella T. Lewis
  • Publication number: 20110291566
    Abstract: A method of sustaining a plasma, by focusing a first wavelength of electromagnetic radiation into a gas within a volume, where the first wavelength is substantially absorbed by a first species of the gas and delivers energy into a first region of a plasma having a first size and a first temperature. A second wavelength of electromagnetic radiation is focused into the first region of the plasma, where the second wavelength is different than the first wavelength and is substantially absorbed by a second species of the gas and delivers energy into a second region of the plasma region within the first region of the plasma having a second size that is smaller than the first size and a second temperature that is greater than the first temperature.
    Type: Application
    Filed: February 12, 2010
    Publication date: December 1, 2011
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Ilya V. Bezel, Anatoly Shchemelinin, Eugene Shifrin, Matthew W. Derstine, Richard W. Solarz
  • Publication number: 20110043797
    Abstract: An inspection system for creating images of a substrate. A light source directs an incident light onto the substrate, and a light source timing control controls a pulse timing of the incident light. A stage holds the substrate and moves the substrate under the incident light, so that the substrate reflects the incident light as a reflected light. A stage position sensor reports a position of the stage, and a stage position control controls the position of the stage. A time domain integration sensor receives the reflected light, and a time domain integration sensor timing control controls a line shift of the time domain integration sensor.
    Type: Application
    Filed: August 20, 2009
    Publication date: February 24, 2011
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Gregory L. Kirk, Matthew W. Derstine, Shiow-Hwei Hwang, Isabella T. Lewis
  • Patent number: 6339503
    Abstract: An optical system for imaging an array of light sources includes an array of microlenses disposed to intercept light from respective light sources in the array of light sources to reduce the divergence angles of light emanating from the light sources, a first array of lenses (sometimes referred to as minilenses), a second array of lenses (minilenses), and an additional array of microlenses disposed to intercept and focus light from the second array of lenses. Each lens in the first array is sized to intercept light from a respective sub-plurality of the microlenses, and each lens in the second array intercepts and focuses light from a respective lens in the first array. The first and second arrays of minilenses are preferably configured to define a doubly-telecentric imaging system.
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: January 15, 2002
    Assignee: Oni Systems Corp.
    Inventors: Matthew W. Derstine, Suzanne Wakelin, James S. Wong
  • Patent number: 6339506
    Abstract: Optical systems are corrected for a variety of aberrations by a microlens array where an optical property of the individual microlenses varies as a function of position in the array. For example, the microlenses can be configured so that the focal length varies to correct field curvature. Representative environments for the microlens array may be characterized by a pixellated source (array of individual sources) in an object plane or a pixellated detector (array of individual detectors) in an image plane, or both.
    Type: Grant
    Filed: November 2, 1999
    Date of Patent: January 15, 2002
    Assignee: ONI Systems Corp.
    Inventors: Suzanne Wakelin, Matthew W. Derstine, James S. Wong