Patents by Inventor Matthieu Hirrien

Matthieu Hirrien has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for the sorting of contaminated matter in continuous flow and corresponding device
    Patent number: 9676006
    Abstract: A method for sorting, in a continuous flow, contaminated materials, which includes: conveying materials from a point (A) to a point (B) by means of a conveyor; measuring the radioactive activity by means of a first sensor between the points (A) and (B) on the top surface (FSUP) of the first conveyor; and sorting the materials by means of a sorting device. The method may include measuring the radioactive activity of the contaminated material by means of a second sensor, either on the top surface (FSUP) of the conveyor and upstream from the point (A), or below the bottom surface (FINF) of said conveyor; calculating a differential measurement between a measurement from the second sensor and from the first sensor; and restricting the sorting to the comparison between a threshold value and the measurement from the first sensor or the differential measurement.
    Type: Grant
    Filed: January 31, 2014
    Date of Patent: June 13, 2017
    Assignees: GRS VALTECH, AREVA NC
    Inventors: Matthieu Hirrien, Marc Messalier
  • Method for the Sorting of Contaminated Matter in Continuous Flow and Corresponding Device (As Amended)
    Publication number: 20150352598
    Abstract: A method for sorting, in a continuous flow, contaminated materials, which includes: conveying materials from a point (A) to a point (B) by means of a conveyor; measuring the radioactive activity by means of a first sensor between the points (A) and (B) on the top surface (FSUP) of the first conveyor; and sorting the materials by means of a sorting device. The method may include measuring the radioactive activity of the contaminated material by means of a second sensor, either on the top surface (FSUP) of the conveyor and upstream from the point (A), or below the bottom surface (FINF) of said conveyor; calculating a differential measurement between a measurement from the second sensor and from the first sensor; and restricting the sorting to the comparison between a threshold value and the measurement from the first sensor or the differential measurement.
    Type: Application
    Filed: January 31, 2014
    Publication date: December 10, 2015
    Applicant: AREVA NC
    Inventors: Matthieu Hirrien, Marc Messalier