Patents by Inventor Max J. Kennedy

Max J. Kennedy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of solid particle concentration in presence of a second particle type
    Patent number: 4969741
    Abstract: This invention pertains to a method and an apparatus for determining concentration of solid particles of interest in a sample in the presence of at least one other type of solid particle by measuring light scatter at a wavelength which is independent of solid particle concentration which is not of interest and related to solid particle concentration of interest. Preferably, solid particles of interest are cells grown in cell culture medium comprising a solid substrate.
    Type: Grant
    Filed: July 21, 1989
    Date of Patent: November 13, 1990
    Assignee: Massachusetts Institute of Technology
    Inventors: Max J. Kennedy, Daniel I. C. Wang, Gregory N. Stephanopoulos