Abstract: An adapter for attaching an active probe to a device under test is disclosed. According to one aspect, an active probe adapter includes an adapter body for connecting an active probe to a device under test (DUT), the adaptor body having an impedance controlled conducting path for connecting a signal of the DUT to a signal input of the active probe, the path including a signal conductor and a reference conductor. The adapter body includes probe-side electrical contacts for electrically connecting an active probe to the signal and reference conductors of the adapter, and a set of DUT-side electrical contacts for electrically connecting the signal and reference conductors of the adapter to the DUT via one or more connectors attached to the contacts. The DUT-side electrical contacts are physically arranged to allow different orientations of the connector relative to the adapter body.

Abstract: An adapter for attaching an active probe to a device under test is disclosed. According to one aspect, an active probe adapter includes an adapter body for connecting an active probe to a device under test (DUT), the adaptor body having an impedance controlled conducting path for connecting a signal of the DUT to a signal input of the active probe, the path including a signal conductor and a reference conductor. The adapter body includes probe-side electrical contacts for electrically connecting an active probe to the signal and reference conductors of the adapter, and a set of DUT-side electrical contacts for electrically connecting the signal and reference conductors of the adapter to the DUT via one or more connectors attached to the contacts. The DUT-side electrical contacts are physically arranged to allow different orientations of the connector relative to the adapter body.