Patents by Inventor Medwin E. Schreher

Medwin E. Schreher has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8240912
    Abstract: A non-contact measurement device includes two or more detectors for sensing scene data from corresponding measurement zones within a target scene. Devices further include an optical system for imaging scene data from the target scene onto the detectors. The optical system is configured to provide a different optical profile for each detector, such that the device can be used to provide a best-fit optical profile for a variety of non-contact applications.
    Type: Grant
    Filed: August 15, 2008
    Date of Patent: August 14, 2012
    Assignee: Fluke Corporation
    Inventors: Medwin E. Schreher, Kenneth A. Pomper
  • Publication number: 20100040109
    Abstract: A non-contact measurement device includes two or more detectors for sensing scene data from corresponding measurement zones within a target scene. Devices further include an optical system for imaging scene data from the target scene onto the detectors. The optical system is configured to provide a different optical profile for each detector, such that the device can be used to provide a best-fit optical profile for a variety of non-contact applications.
    Type: Application
    Filed: August 15, 2008
    Publication date: February 18, 2010
    Applicant: FLUKE CORPORATION
    Inventors: Medwin E. Schreher, Kenneth A. Pomper
  • Patent number: 7352445
    Abstract: A radiometer includes a sighting system that generates a digital image of an object surface having an area that is to be imaged onto the IR detector. A shape outline is overlaid on the digital image of an object surface to indicate the extent of the energy zone that is imaged onto the IR detector. A distance entering interface is used to enter distance data indicating the distance between the radiometer and the object surface and the distance data is utilized to determine the size of the overlaid shape.
    Type: Grant
    Filed: May 2, 2006
    Date of Patent: April 1, 2008
    Assignee: Fluke Corporation
    Inventor: Medwin E. Schreher