Patents by Inventor Meir Ben-Levy

Meir Ben-Levy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150377777
    Abstract: A method and apparatus for imaging a live cell object, the method including the steps of: (a) modulating the phase of an electromagnetic wave in a periodic pattern with a two dimensional phase grating to produce a phase modulated electromagnetic wave in two axes; (b) projecting a real image of the phase grating onto an object to produce phase modulated electromagnetic wave illumination of the object; (c) varying a location of the periodic pattern in time along the two axes to change the phase of the periodic pattern; (d) projecting a real image of the object to a detector; (e) recording multiple images of the object with the detector, each of the images is recorded with the periodic pattern in a different location; and (f) calculating a synthetic image of the object by extracting information 90 degrees out of phase with the illumination.
    Type: Application
    Filed: July 31, 2014
    Publication date: December 31, 2015
    Inventor: Meir BEN-LEVY
  • Publication number: 20140146543
    Abstract: An outdoor lighting device and method for achieving the same, the device including: (a) a light source; (b) a concentrator including only a first solid optical medium (SOM), the concentrator having an input surface optically coupled to the light source, a side surface and an output surface; and (c) a transparent cover optically coupled to the output surface, and covering substantially all of the output surface, wherein the side surface is shaped so as to provide a desired luminous intensity profile emerging from the transparent cover, and wherein a continuity from the light source to the transparent cover is uninterrupted by an air gap.
    Type: Application
    Filed: November 17, 2013
    Publication date: May 29, 2014
    Applicant: Magic Lighting Optics
    Inventor: Meir Ben Levy
  • Patent number: 8514385
    Abstract: A method for inspecting an object and an inspection system, the system includes: at least one primary light source followed by at least one illumination path imaging lens adapted to direct at least one primary light beam towards an area of an inspected object; at least one secondary light source followed by at least one collimating component and at least one concentrating component adapted to direct at least one secondary light beam towards the area; wherein the at least one primary light beam and the at least one secondary light beam illuminate the area such that substantially each point within an imaged portion of the area is illuminated over a large angular range characterized by substantially uniform intensity; a collection path that comprises an image sensor, a beam splitter path and a collection path imaging lens; wherein the beam splitter is positioned between the area and between the collection path imaging lens; and wherein the at least one collimating component defines a central aperture through whi
    Type: Grant
    Filed: August 24, 2006
    Date of Patent: August 20, 2013
    Assignee: Camtek Ltd
    Inventors: Meir Ben-Levy, Ophir Peleg
  • Publication number: 20120106190
    Abstract: A device and method for directing light from a non directed light source into a forward direction with a required angular distribution. The device may comprise a tapered light guide, a front refractor and a back reflector. The wedge angle of the light guide is selected such that light incident upon the entrance of the light guide and exits the light guide and is directed either by the front refractor or the back reflector into the desired angular distribution.
    Type: Application
    Filed: June 28, 2010
    Publication date: May 3, 2012
    Applicant: MGIC LIGHTING OPTICS LTD.
    Inventor: Meir Ben-Levy
  • Publication number: 20110310392
    Abstract: A method for inspecting an object and an inspection system, the system includes: at least one primary light source followed by at least one illumination path imaging lens adapted to direct at least one primary light beam towards an area of an inspected object; at least one secondary light source followed by at least one collimating component and at least one concentrating component adapted to direct at least one secondary light beam towards the area; wherein the at least one primary light beam and the at least one secondary light beam illuminate the area such that substantially each point within an imaged portion of the area is illuminated over a large angular range characterized by substantially uniform intensity; a collection path that comprises an image sensor, a beam splitter path and a collection path imaging lens; wherein the beam splitter is positioned between the area and between the collection path imaging lens; and wherein the at least one collimating component defines a central aperture through whi
    Type: Application
    Filed: August 24, 2006
    Publication date: December 22, 2011
    Inventors: Meir Ben-Levy, Ophir Peleg
  • Publication number: 20100260409
    Abstract: A patterned TDI sensor comprising an array of pixels having respective sensitivities to light that varies according to a periodic pattern across said array of pixels, for high throughput applications of imaging and measurement with patterned illumination such as structured illumination, Moire techniques, 3D imaging and 3D metrology. An object is measured by scanning the object with illumination that varies periodically across the object, imaging the object with a patterned TDI sensor having a repetition length matched with the repetition length of the illumination and analyzing the output signal of the TDI sensor to extract information such as height or image of the object.
    Type: Application
    Filed: April 6, 2008
    Publication date: October 14, 2010
    Applicant: MACHVISION, Inc.
    Inventor: Meir Ben-Levy
  • Patent number: 5867604
    Abstract: An apparatus for, and method of, improving the resolution of a conventional imaging system by effectively increasing the bandwidth of an imaging system's transfer function. An object is first illuminated with periodic illumination. The phase of the periodic illumination is varied while the periodic illumination is used to scan the object. A plurality of images are received by an imaging system whereby the images received correspond to variations in the phase of the periodic illumination. These images are subsequently processed to extract information in phase with the periodic illumination and information 90 degrees out of phase with the periodic illumination. In an optical microscope system, the periodic illumination also provides automatic focusing and three-dimensional imaging capabilities.
    Type: Grant
    Filed: January 5, 1996
    Date of Patent: February 2, 1999
    Inventors: Meir Ben-Levy, Eyal Peleg