Abstract: A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.

Abstract: A contact assembly for a Kelvin testing system for testing integrated circuit devices is disclosed. The contact assembly includes at least one grouping of blades including a first force blade, a second force blade, a first sense blade, and a second sense blade; an electrical insulation layer disposed between the first force blade and the first sense blade and between the second force blade and the second sense blade; and an elongated elastomer. The elastomer is configured to be retained by the first force blade, the second force blade, the first sense blade, and the second sense blade. Each of the first force blade, the second force blade, the first sense blade, and the second sense blade includes a recess having an opening and sized to receive and retain at least a portion of the elastomer.

Abstract: A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and is configured to be in a free state, a preload state, and an actuated state. The housing includes a housing backstop. When the contact is in the preload state, a contact backstop of the contact is biased against the housing backstop.