Abstract: A method for performing a physical unclonable function generated by a non-volatile memory write delay difference includes a resetting step, a writing step, a detecting step, a terminating step and a write-back operating step. The resetting step includes resetting two non-volatile memory cells controlled by a bit line and a bit line bar, respectively. The writing step includes performing a write operation on each of the two non-volatile memory cells. The detecting step includes detecting a voltage drop of each of the bit line and the bit line bar, and comparing the voltage drop and a predetermined voltage difference value to generate a comparison flag. The terminating step includes terminating the write operation on one of the two non-volatile memory cells according to the comparison flag. The write-back operating step includes performing a write-back operation on another of the two non-volatile memory cells.

Abstract: A method for integrating a processing-in-sensor unit and an in-memory computing includes the following steps. A providing step is performed to transmit the first command signal and the initial data to the in-memory computing unit. A converting step is performed to drive the first command signal and the initial data to convert to a second command signal and a plurality of input data through a synchronizing module. A fetching step is performed to drive a frame difference module to receive the input data to fetch a plurality of difference data. A slicing step is performed to drive a bit-slicing module to receive the difference data and slice each of the difference data into a plurality of bit slices. A controlling step is performed to encode the difference address into a control signal, and the in-memory computing unit accesses each of the bit slices according to the control signal.

Abstract: A multi-bit current sense amplifier with pipeline current sampling of a resistive memory is configured to sense a plurality of bit line currents of a plurality of bit lines in a pipeline operation. A core sense circuit is connected to one part of the bit lines and generates a reference parallel resistance current and a reference anti-parallel resistance current. A plurality of bit line precharge branch circuits are connected to the core sense circuit and another part of the bit lines. The bit line currents of the bit lines, the reference parallel resistance current and the reference anti-parallel resistance current are sensed by the core sense circuit and the bit line precharge branch circuits in the pipeline operation so as to sequentially generate a plurality of voltage levels on the core sense circuit in a clock cycle.

Abstract: A memory unit is controlled by a first word line and a second word line. The memory unit includes a memory cell and a transpose cell. The memory cell stores a weight. The memory cell is controlled by the first word line and includes a local bit line transmitting the weight. The transpose cell is connected to the memory cell and receives the weight via the local bit line. The transpose cell includes an input bit line, an input bit line bar, an output bit line and an output bit line bar. Each of the input bit line and the input bit line bar transmits a multi-bit input value, and the transpose cell is controlled by the second word line to generate a multi-bit output value on each of the output bit line and the output bit line bar according to the multi-bit input value and the weight.

Abstract: The present disclosure provides a control circuit of a memory array. The control circuit includes a first switch and a set termination circuit. The first switch is connected between a first voltage source and a data line of a resistive memory cell of the memory array. The set termination circuit has a first terminal connected to a control terminal of the first switch and a second terminal connected to the data line of the resistive memory cell of the memory array. When a data line voltage of the data line decreases to be lower than a first voltage in a first duration of the resistive memory cell performing a set operation, the set termination circuit turns off the first switch to terminate the set operation by stopping providing the first voltage of the first voltage source to the data line.

Abstract: A sensing circuit with adaptive local reference generation of a resistive memory is configured to adaptively sense a first bit line current of a first bit line and a second bit line current of a second bit line via one sense amplifier. The sense amplifier has a first output node and a second output node. The adaptive local reference generator is electrically connected to the sense amplifier and generating a reference current equal to a sum of the second bit line current and a local reference current. A first bit line current flows through the first output node during a first bit line time interval. A second bit line current flows through the first output node during a second bit line time interval. The first bit line time interval is different from the second bit line time interval.

Abstract: A voltage-enhanced-feedback sense amplifier of a resistive memory is configured to sense a first bit line and a second bit line. The voltage-enhanced-feedback sense amplifier includes a voltage sense amplifier and a voltage-enhanced-feedback pre-amplifier. The voltage-enhanced-feedback pre-amplifier is electrically connected to the voltage sense amplifier. A first bit-line amplifying module receives a voltage level of the second input node to suppress a voltage drop of the first bit line and amplifies a voltage level of the first input node according to a voltage level of the first bit line. A second bit-line amplifying module receives the voltage level of the first input node to suppress a voltage drop of the second bit line and amplifies the voltage level of the second input node according to a voltage level of the second bit line. A margin enhanced voltage difference is greater than a read voltage difference.

Abstract: A memory cell for computing-in-memory applications is controlled by a first bit line, a second bit line, a word line and a read word line. The read word line transmits an input value. The memory cell includes a plurality of read-decoupled cells. Each of the read-decoupled cells stores a weight and includes a first read-decoupled transistor and a second read-decoupled transistor. The first read-decoupled transistor has a first transistor width and is controlled by the weight. The second read-decoupled transistor has a second transistor width equal to the first transistor width and generates a read bit line signal according to the input value, the weight and the second transistor width. The second transistor width of the second read-decoupled transistor of one of the read-decoupled cells is two times larger than the second transistor width of the second read-decoupled transistor of another one of the read-decoupled cells.

Abstract: A voltage-enhanced-feedback sense amplifier of a resistive memory is configured to sense a first bit line and a second bit line. The voltage-enhanced-feedback sense amplifier includes a voltage sense amplifier and a voltage-enhanced-feedback pre-amplifier. The voltage-enhanced-feedback pre-amplifier is electrically connected to the voltage sense amplifier. A first bit-line amplifying module receives a voltage level of the second input node to suppress a voltage drop of the first bit line and amplifies a voltage level of the first input node according to a voltage level of the first bit line. A second bit-line amplifying module receives the voltage level of the first input node to suppress a voltage drop of the second bit line and amplifies the voltage level of the second input node according to a voltage level of the second bit line. A margin enhanced voltage difference is greater than a read voltage difference.

Abstract: The present disclosure provides a control circuit of a memory array. The control circuit includes a first switch and a set termination circuit. The first switch is connected between a first voltage source and a data line of a resistive memory cell of the memory array. The set termination circuit has a first terminal connected to a control terminal of the first switch and a second terminal connected to the data line of the resistive memory cell of the memory array. When a data line voltage of the data line decreases to be lower than a first voltage in a first duration of the resistive memory cell performing a set operation, the set termination circuit turns off the first switch to terminate the set operation by stopping providing the first voltage of the first voltage source to the data line.

Abstract: An operating method of the soft-verify write assist circuit of the resistive memory provides a voltage level applying step, a write operating step and a write voltage controlling step. The voltage level applying step is for applying a plurality of voltage levels to the reference voltage, the word line and the switching signal, respectively. The write operating step is for driving the memory cell to perform in a set process or a reset process via the first three-terminal switching element, the second three-terminal switching element and the soft-verify controlling unit during a write operation. The write voltage controlling step is for controlling the write voltage to be increased in the ramping cycle and decreased in the soft-verify cycle.

Abstract: A dynamic bit-line clamping circuit for computing-in-memory applications is configured to clamp a bit line via at least one reference signal and includes a clamping node, a first clamping unit, a second clamping unit, a first feedback controlling unit and a second feedback controlling unit. The first clamping unit is electrically connected between the bit line and the clamping node. The second clamping unit is electrically connected between the clamping node and a power source voltage and includes a switch. The second feedback controlling unit is electrically connected to the clamping node and the switch. The second feedback controlling unit generates a switching signal according to the at least one reference signal and a voltage level of the clamping node. The switch is switched by the switching signal so as to clamp the voltage level of the clamping node according to the at least one reference signal.

Abstract: Counting status circuits are electrically coupled to corresponding status elements. The status elements selectably store a bit status of a bit line coupled to a memory array. The bit status can indicate one of at least pass and fail. The counting status circuits are electrically coupled to each other in a sequential order. Control logic causes processing of the counting status circuits in the sequential order to determine a total of the memory elements that store the bit status. The total number of memory elements that store the bit status indicate the number of error bits or non-error bits, which can help determine whether there are too many errors to be fixed by error correction codes.

Abstract: A reference-free multi-level sensing circuit for computing-in-memory applications is controlled by a first bit line and a second bit line. An encoding unit generates a first register output value and a plurality of encoded values. The first register output value feedback controls a precharging unit so as to enable the precharging unit to precharge one of the first bit line and the second bit line according to the first register output value. A voltage level of the one of the first bit line and the second bit line is lower than a voltage level of the other one of the first bit line and the second bit line. The encoded values and the first register output value are formed a multi-bit signal to estimate voltage levels of the first bit line and the second bit line.

Abstract: A multi-bit computing circuit for computing-in-memory applications is controlled by an input port and includes a memory cell array and a capacitor sharing unit. The memory cell array includes a plurality of memory cells connected to the input port. The memory cells store a weight which is formed in two's complement. The capacitor sharing unit includes a plurality of switches, a plurality of capacitors and a sense amplifier. The switches are electrically connected to the memory cells, respectively. The capacitors are electrically connected to the switches, respectively. The sense amplifier is electrically connected to the capacitors and generates a total operational value. The capacitors are located among the switches and the sense amplifier, and the switches are switched to enable the total operational value to be equal to the input value multiplied by the weight. The present disclosure utilizes 8T SRAM cells without an extra DAC structure.

Abstract: An input-pattern aware reference generation system for a memory cell array having a plurality of word lines crossing a plurality of bit lines includes an input counting circuit, a reference array, and a reference word line control circuit. The input counting circuit receives the input signal of the memory cell array, discovers input activated word lines according to the input signal and generates a number signal representing a number of the input activated word lines. The reference array includes a plurality of reference memory cells storing a predetermined set of weights. The reference word line control circuit is electrically connected between the input counting circuit and the reference array. Moreover, the reference word line control circuit controls the reference array to generate a plurality of reference signals being able to distinguish candidates of the computational result of the bit lines in the memory cell array.

Abstract: The present disclosure provides a control circuit of a memory array. The control circuit includes a first switch and a set termination circuit. The first switch is connected between a first voltage source and a data line of a resistive memory cell of the memory array. The set termination circuit has a first terminal connected to a control terminal of the first switch and a second terminal connected to the data line of the resistive memory cell of the memory array. When a data line voltage of the data line decreases to be lower than a first voltage in a first duration of the resistive memory cell performing a set operation, the set termination circuit turns off the first switch to terminate the set operation by stopping providing the first voltage of the first voltage source to the data line.

Abstract: The present disclosure provides a control circuit of a memory array. The control circuit includes a first switch and a set termination circuit. The first switch is connected between a first voltage source and a data line of a resistive memory cell of the memory array. The set termination circuit has a first terminal connected to a control terminal of the first switch and a second terminal connected to the data line of the resistive memory cell of the memory array. When a data line voltage of the data line decreases to be lower than a first voltage in a first duration of the resistive memory cell performing a set operation, the set termination circuit turns off the first switch to terminate the set operation by stopping providing the first voltage of the first voltage source to the data line.

Abstract: A selective bit-line sensing method is provided. The selective bit-line sensing method includes the steps of: generating a neuron weights information, the neuron weights information defines a distribution of 0's and 1's storing in the plurality of memory cells of the memory array; and selectively determining either the plurality of bit-lines or the plurality of complementary bit-lines to be sensed in a sensing operation according to the neuron weights information. When the plurality of bit-lines are determined to be sensed, the plurality of first word-lines are activated by the artificial neural network system through the selective bit-line detection circuit, and when the plurality of complementary bit-lines are determined to be sensed, the plurality of second word-lines are activated by the artificial neural network system.

Abstract: A transpose accessing memory device is provided, the global word-lines configured to be selected as horizontal word-lines in a row access mode in that at least one row of the memory array is selected to be access, and the corresponding local I/O circuit is configured to guide signals of the local bit-lines coupled to the selected SRAM memory cells to the corresponding horizontal global bit-lines in response to select signals from the global word-lines, and the global word-lines configured to be selected as vertical word-lines in a column access mode in that at least one column of the memory array is selected to be access, and the corresponding local I/O circuit is configured to guide signals of the local bit-lines coupled to the selected SRAM memory cells to the corresponding vertical global bit-lines in response to select signals from the global word-lines.