Abstract: An electronic instrument is described. The electronic instrument includes a transmitter circuit, wherein the transmitter circuit is configured to transmit a test signal to a device under test. The electronic instrument further includes a receiver circuit, wherein the receiver circuit is configured to receive an output signal from the device under test. The electronic instrument further includes a processing circuit, wherein the processing circuit is configured to determine at least one signal quality indicator based on the output signal received from the device under test. The at least one signal quality indicator is indicative of a signal quality of the output signal. Further, a signal analysis method of analyzing a signal received from a device under test is described.

Abstract: A method of determining a signal histogram having a predetermined number of bins. The method includes: receiving an input signal; decimating the input signal, thereby generating a decimated signal that includes a maximum signal value and a minimum signal value associated with the maximum signal value; assigning the maximum signal value to a maximum bin of a signal histogram; assigning the minimum signal value to a minimum bin of the signal histogram; and filling at least one intermediate bin of the signal histogram with an intermediate value, wherein the intermediate bin is located between the minimum bin and the maximum bin in the signal histogram.

Abstract: A method of determining a signal histogram having a predetermined number of bins. The method includes: receiving an input signal; decimating the input signal, thereby generating a decimated signal that includes a maximum signal value and a minimum signal value associated with the maximum signal value; assigning the maximum signal value to a maximum bin of a signal histogram; assigning the minimum signal value to a minimum bin of the signal histogram; and filling at least one intermediate bin of the signal histogram with an intermediate value, wherein the intermediate bin is located between the minimum bin and the maximum bin in the signal histogram.

Abstract: A method for analyzing a measured signal is described wherein at least a first segment and a second segment of said measured signal are acquired by a measurement device. At least said first segment and said second segment are stored in an acquisition memory of said measurement device. A search criterion is applied on at least said first segment and said second segment. At least a first timing event corresponding to said search criterion is stored into a memory, said first timing event being found in at least one of said segments. Further, an oscilloscope is described.

Abstract: The disclosure relates to an electronic control unit (ECU) for a vehicle. The ECU includes a 12V-domain controlling an electric load supplied with a first supply voltage and a 48V-domain controlling an electric load supplied with a second supply voltage. Both domains are arranged on a single printed circuit board (PCB) and are galvanically isolated from each other and connected with each other by a galvanically isolated data interface that transfers data between the domains according to a half-duplex or a full-duplex communication protocol. The 48V-domain includes a 48V-microcontroller and a 48V-power supply supplying the 48V-microcontroller, where the 48V-power supply is powered by the first supply voltage from the 12V-domain via a galvanically isolated supply interface.

Abstract: Methods for analyzing a measured signal, and a measurement unit for carrying out these methods, are provided. The method includes, acquiring at least a first segment and a second segment of the measured signal by a measurement unit; storing the at least a first segment and a second segment in an acquisition memory of the measurement unit; applying a filter on the at least a first segment and a second segment; and storing at least one segment of the at least a first segment and a second segment that corresponds to the filter into at least one of a display memory and a processor memory of the measurement unit.

Abstract: Methods for analyzing a measured signal, and a measurement unit for carrying out these methods, are provided. The method includes, acquiring at least a first segment and a second segment of the measured signal by a measurement unit; storing the at least a first segment and a second segment in an acquisition memory of the measurement unit; applying a filter on the at least a first segment and a second segment; and storing at least one segment of the at least a first segment and a second segment that corresponds to the filter into at least one of a display memory and a processor memory of the measurement unit.

Abstract: A method for analyzing a measured signal is described wherein at least a first segment and a second segment of said measured signal are acquired by a measurement device. At least said first segment and said second segment are stored in an acquisition memory of said measurement device. A search criterion is applied on at least said first segment and said second segment. At least a first timing event corresponding to said search criterion is stored into a memory, said first timing event being found in at least one of said segments. Further, an oscilloscope is described.