Patents by Inventor Michael C. Vella

Michael C. Vella has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6670623
    Abstract: A thermoregulation system for an ion implantation system to reduce the temperature in the ion implanter and components therein, or attached thereto, to a temperature at which an ion source material, used in the ion implanter, has a vapor pressure that yields a reduced concentration of vapors. Such arrangement markedly reduces the risk of exposure to harmful vapors from the ion source material.
    Type: Grant
    Filed: March 7, 2001
    Date of Patent: December 30, 2003
    Assignee: Advanced Technology Materials, Inc.
    Inventor: Michael C. Vella
  • Patent number: 6573510
    Abstract: Ions, particularly molecular ions with multiple dopant nucleons per ion, are produced by charge exchange. An ion source contains a minimum of two regions separated by a physical barrier and utilizes charge exchange to enhance production of a desired ion species. The essential elements are a plasma chamber for production of ions of a first species, a physical separator, and a charge transfer chamber where ions of the first species from the plasma chamber undergo charge exchange or transfer with the reactant atom or molecules to produce ions of a second species. Molecular ions may be produced which are useful for ion implantation.
    Type: Grant
    Filed: June 19, 2000
    Date of Patent: June 3, 2003
    Assignee: The Regents of the University of California
    Inventor: Michael C. Vella
  • Patent number: 6545419
    Abstract: An improved double chamber ion source comprising a plasma generating chamber, a charge exchange chamber and a divider structure therebetween. The charge exchange chamber includes magnetic shielding material to reduce exposure of interior components to magnetic field lines externally generated. The double compartment ion source further comprises inclusion of a heat shield and/or a cooling system to overcome deleterious effects caused by increased temperature in the plasma generating chamber. The divider structure has a plurality of apertures having a configuration to reduce surface area on the divider structure in the charge exchange chamber.
    Type: Grant
    Filed: March 7, 2001
    Date of Patent: April 8, 2003
    Assignee: Advanced Technology Materials, Inc.
    Inventor: Michael C. Vella
  • Publication number: 20020130278
    Abstract: A thermoregulation system for an ion implantation system to reduce the temperature in the ion implanter and components therein, or attached thereto, to a temperature at which an ion source material, used in the ion implanter, has a vapor pressure that yields a reduced concentration of vapors. Such arrangement markedly reduces the risk of exposure to harmful vapors from the ion source material.
    Type: Application
    Filed: March 7, 2001
    Publication date: September 19, 2002
    Applicant: Advanced Technology Materials Inc.
    Inventor: Michael C. Vella
  • Publication number: 20020125829
    Abstract: An improved double chamber ion source comprising a plasma generating chamber, a charge exchange chamber and a divider structure therebetween. The charge exchange chamber includes magnetic shielding material to reduce exposure of interior components to magnetic field lines externally generated. The double compartment ion source further comprises inclusion of a heat shield and/or a cooling system to overcome deleterious effects caused by increased temperature in the plasma generating chamber. The divider structure has a plurality of apertures having a configuration to reduce surface area on the divider structure in the charge exchange chamber.
    Type: Application
    Filed: March 7, 2001
    Publication date: September 12, 2002
    Applicant: Advanced Technology Materials Inc.
    Inventor: Michael C. Vella
  • Patent number: 5545257
    Abstract: Disclosed herein is a system and method for providing a plasma flood having a low electron temperature to a semiconductor target region during an ion implantation process. The plasma generator providing the plasma is coupled to a magnetic filter which allows ions and low energy electrons to pass therethrough while retaining captive the primary or high energy electrons. The ions and low energy electrons form a "cold plasma" which is diffused in the region of the process surface while the ion implantation process takes place.
    Type: Grant
    Filed: June 13, 1994
    Date of Patent: August 13, 1996
    Assignee: Electro-Graph, Inc.
    Inventor: Michael C. Vella