Abstract: Techniques for determining flow properties of a fluid in a fluidic device comprising a light source configured to generate a plurality of optical signals, tracers suspended in a fluid, a plurality of photonic devices, each including a photonic element and flow channel, and a measurement device configured to: determine a first measurement based on the plurality of optical signals and the tracers in a flow channel of a first photonic device of the plurality of photonic devices, determine a second measurement based on the plurality of optical signals and the tracers in a flow channel of a second photonic device of the plurality of photonic devices, and determine a property associated with a flow of the fluid or the tracers based on the first measurement and the second measurement.

Abstract: Provided are embodiments for a computer-implemented method, system, and device for tracking multiphase flow in a microfluidic device. Embodiments include receiving first readings from a first sensor of the microfluidic device, the first reading representing a detection of a fluid at an interface between the fluid and the first sensor, and receiving second readings from a second sensor of the microfluidic device, the second readings representing a detection of the fluid at an interface between the fluid and the second sensor, wherein the first sensor is located at a distance from the second sensor. Embodiments also include calculating a flow speed of the fluid in the microfluidic device based at least in part on a difference of time between the detections by the first sensor and the second sensor, and the distance between the first sensor and the second sensor.

Abstract: Aspects of the invention include determining, by a first AFM tip, a first snap-off force of a solid surface immersed in a first fluid, determining, by a second AFM tip, a second snap-off force, determining, by a third AFM tip, a third snap-off force, determining, by the first AFM tip, a fourth snap-off force of a droplet of the first fluid immersed in the second fluid on the solid surface, determining, by the second AFM tip, a fifth snap-off force, determining, by the third AFM tip, a sixth snap-off force, determining a first capillary force for first AFM tip and first droplet based on first snap-off force and fourth snap-off force, determining a second capillary force for second AFM tip and first droplet and a third capillary force for third AFM tip and first droplet, and determining interfacial tension between first fluid and second fluid based on the capillary forces.

Abstract: A system is provided for performing metal trace analysis on a liquid sample. A sample holder holds an analysis substrate that includes a reference region and at least one test region. An ultraviolet (UV) light source emits ultraviolet light illuminating the liquid sample. An optical sensor detects radiation emanating from the liquid sample and converting the detected radiation into an electrical signal. A microcontroller processes the electrical signal. An external interface transmits the processed electrical signal to an external device. The analysis substrate is configured for manual movement by a user. A tracking system detects a sample scanning location for the metal trace analysis, and includes a light source, other than the UV light source, and another optical sensor. The other optical sensor detects light emitted by the light source.

Abstract: Provided are embodiments for a system for determining wettability of fluid-fluid-solid systems. The system includes a confocal optical microscope and a storage medium, the storage medium being coupled to a processor. The processor is configured to perform a scan of a sample of a multi-phase system using the confocal optical microscope, wherein a phase defines a structural phase of matter, identify each phase of the sample, and measure a three-phase contact line for the sample, wherein the three-phase contact line is along an interface of first fluid and a second fluid and an interface of a second fluid and solid. The processor is configured to obtain one or more characteristics from the sample based at least in part on the three-phase contact line, and provide the one or more characteristics for the sample. Also provided are embodiments for a method for determining the wettability of fluid-fluid-solid systems.

Abstract: An apparatus to perform tests on fluid flow and configured to operate at field conditions includes one or more vessels and one or more sets of fluid injecting devices corresponding to respective ones of the one or more vessels. Each set of fluid injecting devices includes one or more fluid injecting devices each configured to inject a respective fluid through its respective vessel. The apparatus further includes one or more measurement devices operatively coupled to respective ones of the one or more vessels and configured to measure data associated with fluid flow of the one or more fluids injected into its respective vessel. The measured data comprises one or more of pressure gradient data and flow rate data. The apparatus is in communication with at least one processor configured to calculate a model based on the measured data. In calculating the model, the at least one processor is configured to infer one or more parameters for the model from the measured data.

Abstract: A target sample to be chemically analyzed is received at a microfluidic device which is part of an analysis card. The microfluidic device includes at least one input layer configured to receive the target sample, at least one intermediary layer, and at least one readout layer configured to present one or more color attributes at one or more readout regions in response to one or more colorimetric reactions to the target sample. An image of the readout layer of the microfluidic device is obtained. A calibration file that corresponds to the analysis card is obtained. The calibration file includes a calibrated model of at least one color attribute based on data from at least one known chemical attribute of at least one standard sample processed by a calibration card.

Abstract: A slipform paving machine includes an offset mold, and a mold frame actuator which allows the height of the offset mold relative to the paving machine to be controlled. Internal actuators within the mold allow corresponding control of side form assemblies to control both height and profile of a resulting slipformed concrete structure.

Abstract: An adjustable width mold apparatus for a slipform paver includes a center portion and left and right sideform assemblies. The center portion has left and right lateral ends. Left and right adjustable width support assemblies are connected between the sideform assemblies and the center portion. One or more spacers may be received between each sideform assembly and the center portion to adjust the width of the mold apparatus. The spacers may be hung on a plurality of hanger rods. Each of the hanger rods may have a hydraulic nut on one end thereof for clamping the spacers between the sideform assembly and the center portion.

Abstract: A method and system for receiving, at a sampling location recommendation module, conventional and complementary information regarding a liquid distribution system, wherein the complementary information includes at least one of a social media post or a consumer report; processing the complementary information and a database of the liquid distribution system in the sampling location recommendation module, using computational and artificial intelligence algorithms, to generate a list of locations for sampling the liquid distribution system; displaying the list of locations; receiving a geo-tagged test record indicative of a sampled contaminant concentration value of at least one location of the list of locations; processing the geo-tagged test record, at a contamination source mapping module, to estimate a location and risk of a contamination source in the liquid distribution system; and displaying the estimated location and risk of the contamination source by modifying a map of the liquid distribution system.

Abstract: The invention relates to an electrical stringed instrument system comprising an electrical stringed instrument. The electrical stringed instrument comprises i) an audio output circuit electronically connected to said one or more pickups, and to a first channel of a multichannel output jack; and ii) a first communication circuit comprising a variable impedance unit, and electronically connected to a second channel of said multichannel output jack.

Abstract: A quantum light emitting device includes a carrier substrate, an insulator, a first semiconductor device, a second semiconductor device, a first contact, and a second contact. The quantum light device includes a carrier substrate comprising silicon and configured with an electrically insulating top surface. The quantum light device also includes an insulator configured on the carrier substrate. The quantum light device includes a first semiconductor structure comprising a first semiconductor material configured on the insulator. Further, the quantum light device includes a second semiconductor structure comprising a second semiconductor material configured on the insulator, with an overlap region of the second semiconductor structure electrically coupling with the first semiconductor structure, a dimensional characteristic of the overlap region being configured to limit a photon emission from the overlap region to a single photon.

Abstract: Provided are embodiments for a system for determining wettability of fluid-fluid-solid systems. The system includes a confocal optical microscope and a storage medium, the storage medium being coupled to a processor. The processor is configured to perform a scan of a sample of a multi-phase system using the confocal optical microscope, wherein a phase defines a structural phase of matter, identify each phase of the sample, and measure a three-phase contact line for the sample, wherein the three-phase contact line is along an interface of first fluid and a second fluid and an interface of a second fluid and solid. The processor is configured to obtain one or more characteristics from the sample based at least in part on the three-phase contact line, and provide the one or more characteristics for the sample. Also provided are embodiments for a method for determining the wettability of fluid-fluid-solid systems.

Abstract: A growth chamber chip includes a base surrounding a growth chamber; a growth medium within the growth chamber; a sensor package within the growth chamber; a sensor feedthrough extending from the sensor package through a portion of the base to an outer surface of the base; and a transparent seal covering the growth chamber. In one or more embodiments, the base includes a nutrient channel connected in fluid communication with the growth medium and exposed to an outer surface of the base. One or more embodiments provide an array of growth chamber chips, with a movable arm that is movable across the array to individually scan each of the growth chamber chips.

Abstract: A slipform paving machine includes an offset mold, and a mold frame actuator which allows the height of the offset mold relative to the paving machine to be controlled. Internal actuators within the mold allow corresponding control of side form assemblies to control both height and profile of a resulting slipformed concrete structure.

Abstract: A slipform paving machine includes an offset mold, including a mold frame, a form insert, a form insert actuator and a form insert sensor. A controller receives a signal from an external reference sensor and controls a position of the form insert actuator to control the height of the form insert relative to the mold frame and thereby control a height of at least a portion of a molded structure relative to a ground surface at least in part in response to the signal from the external reference sensor.

Abstract: A method of positioning nanomaterials includes patterning guiding dielectric features from a single layer of guiding dielectric material, and producing an electric field by at least one electrode disposed on a substrate that is attenuated through the guiding dielectric features to create an attractive dielectrophoretic force that guides at least one nanostructure abutting the guiding dielectric features to be positioned on a deposition surface of the substrate.

Abstract: A calibration apparatus for a tip-enhanced Raman microscope includes a substrate; a two-dimensional Raman scatterer that is mounted on an upper surface of the substrate; and a well-defined topographic structure that is formed at the upper surface of the substrate. The topographic structure may include convex geometric shapes such as triangles and squares arranged in one or more periodic lattices. Calibration is via adjusting a focal length of a laser beam until a signal from a spectrometer repeatedly exhibits a stepped response when a focal point of the laser beam traverses an edge of a two-dimensional Raman scatterer, then adjusting the relative lateral positions of a scanning probe microscope probe tip and the focal point until the signal from the spectrometer and a signal from the scanning probe microscope repeatedly change within an acceptable time delay while the focal point and the probe tip traverse edges of the topographic structure.

Abstract: A field effect transistor including a dielectric layer on a substrate, a nano-structure material (NSM) layer on the dielectric layer, a source electrode and a drain electrode formed on the NSM layer, a gate dielectric formed on at least a portion of the NSM layer between the source electrode and the drain electrode, a T-shaped gate electrode formed between the source electrode and the drain electrode, where the NSM layer forms a channel of the FET, and a doping layer on the NSM layer extending at least from the sidewall of the source electrode to a first sidewall of the gate dielectric, and from a sidewall of the drain electrode to a second sidewall of the gate dielectric.

Abstract: A system is provided for performing metal trace analysis on a liquid sample. A sample holder holds an analysis substrate that includes a reference region and at least one test region. An ultraviolet (UV) light source emits ultraviolet light illuminating the liquid sample. An optical sensor detects radiation emanating from the liquid sample and converting the detected radiation into an electrical signal. A microcontroller processes the electrical signal. An external interface transmits the processed electrical signal to an external device. The analysis substrate is configured for manual movement by a user. A tracking system detects a sample scanning location for the metal trace analysis, and includes a light source, other than the UV light source, and another optical sensor. The other optical sensor detects light emitted by the light source.