Abstract: A method of forming a bulk metallic glass is provided. The method includes overheating the alloy melt to a temperature above a threshold temperature, Ttough, associated with the metallic glass demonstrating substantial improvement in toughness compared to the toughness demonstrated in the absence of overheating the melt above Tliquidus, and another threshold temperature, TGFA, associated with the metallic glass demonstrating substantial improvement in glass-forming ability compared to the glass-forming ability demonstrated in the absence of overheating the melt above Tliquidus. After overheating the alloy melt to above Ttough and TGFA, the melt may be cooled and equilibrated to an intermediate temperature below both Ttough and TGFA but above Tliquidus, and subsequently quenched at a high enough rate to form a bulk metallic glass.

Abstract: Ni—Fe—Si—B and Ni—Fe—Si—B—P metallic glass forming alloys and metallic glasses are provided. Metallic glass rods with diameters of at least one, up to three millimeters, or more can be formed from the disclosed alloys. The disclosed metallic glasses demonstrate high yield strength combined with high corrosion resistance, while for a relatively high Fe contents the metallic glasses are ferromagnetic.

Abstract: A machine includes a thermal ramp chamber; a thermal soak chamber coupled to the thermal ramp chamber; and a cooling chamber coupled to the thermal soak chamber. The cooling chamber can be an indirect cooling chamber including a thermal buffer that includes a substrate carrier. Each of the chambers can include an independently controlled elemental reactant source containing and supplying vapor having both i) independent control of a total vapor pressure of an elemental reactant containing vapor and ii) independent control of a partial vapor pressure of an elemental reactant vapor within that chamber.

Abstract: A bulk-glass forming Ni—Cr—Nb—P—B alloy is provided. The alloy includes Ni(100?a?b?c?d)CraTabPcBd, where the atomic percent a is between 3 and 11, the atomic percent b is between 1.75 and 4, the atomic percent c is between 14 and 17.5, and the atomic percent d is between 2.5 and 5. The alloy is capable of forming a metallic glass having a lateral dimension of at least 3 mm.

Abstract: An alloy comprising Fe, Ni, P, B and Ge is disclosed, having a composition according to the formula [Fe1-yNiy](100-a-b-c)PaBbGec, where a, b, c subscripts denote atomic percent; y subscript denotes atomic fraction, a is between 9 and 12, b is between 5.5 and 7.5, c is between 2 and 6, and y is between 0.45 and 0.55. Metallic glass rods with diameter of at least 1 mm can be formed from the alloy by rapid quenching from the molten state.

Abstract: A Ni-based bulk metallic glass forming alloy is provided. The alloy includes Ni(100-a-b-c-d)CraNbbPcBd, where an atomic percent of chromium (Cr) a ranges from 3 to 13, an atomic percent of niobium (Nb) b is determined by x?y*a, where x ranges from 3.8 to 4.2 and y ranges from 0.11 to 0.14, an atomic percent of phosphorus (P) c ranges from 16.25 to 17, an atomic percent of boron (B) d ranges from 2.75 to 3.5, and the balance is nickel (Ni), and where the alloy is capable of forming a metallic glass object having a lateral dimension of at least 6 mm, where the metallic glass has a stress intensity factor at crack initiation when measured on a 3 mm diameter rod containing a notch with length between 1 and 2 mm and root radius between 0.1 and 0.15 mm, the stress intensity factor being at least 70 MPa m1/2.

Abstract: The disclosure provides Ni—Mo—P—B, Ni—Mo—Nb—P—B, and Ni—Mo—Nb—Mn—P—B alloys capable of forming metallic glass objects. The metallic glass objects can have lateral dimensions in excess of 1 mm and as large as 3 mm or larger. The disclosure also provides methods for forming the metallic glasses.

Abstract: Nickel based alloys capable of forming bulk metallic glass are provided. The alloys include Ni—Cr—Si—B compositions, with additions of P and Mo, and are capable of forming a metallic glass rod having a diameter of at least 1 mm. In one example of the present disclosure, the Ni—Cr—Mo—Si—B—P composition includes about 4.5 to 5 atomic percent of Cr, about 0.5 to 1 atomic percent of Mo, about 5.75 atomic percent of Si, about 11.75 atomic percent of B, about 5 atomic percent of P, and the balance is Ni, and wherein the critical metallic glass rod diameter is between 2.5 and 3 mm and the notch toughness between 55 and 65 MPa m1/2.

Abstract: Porosity causing gas-based defects are detected, located, identified, and/or characterized by the use of defect information generated from gas flow data corresponding to gas flow characteristics measured by one or more sensors on a composite part processing piece such as a mould or membrane used during a composite manufacturing process. The defect information is generated using techniques including one or more of profiling the gas flow data, fingerprinting, line leak detection, analytical triangulation.

Abstract: Playback and distribution systems and methods for multimedia files are provided. The multimedia files are encoded with flags associated with the content data of the multimedia files. Through the use of the flags, playback of the content is enhanced without significantly increasing the file size of the multimedia file.

Abstract: Playback and distribution systems and methods for multimedia files are provided. The multimedia files are encoded with flags associated with the content data of the multimedia files. Through the use of the flags, playback of the content is enhanced without significantly increasing the file size of the multimedia file.

Abstract: Content description systems in accordance with embodiments of the invention are described. In many embodiments, the content description system includes files that combine RIFF chunks with metadata. In several embodiments, the content description system includes metadata stored as graph information and separate node information. One embodiment includes a storage medium and metadata recorded in the storage medium. In addition, the metadata includes graph information and separate node data.

Abstract: An optical system provides a lens cell having a generally cylindrical lens cell body and an optical lens system therein. The lens cell body has a lens cell central longitudinal axis and a lens cell optical axis, eccentrically offset from the lens cell central longitudinal axis. A sleeve has a generally cylindrical sleeve body, an outer surface with a first longitudinal axis, and an inner surface with a second longitudinal axis, eccentrically offset from the first longitudinal axis. The lens cell is inserted into the sleeve. A housing has a generally cylindrical body into which the sleeve is at least partially inserted. The lens cell and the sleeve are rotated relative to each other and to the housing such that the lens cell optical axis is aligned in a desired location. After the lens cell optical axis is aligned in the desired location, the lens cell is fixedly connected to the sleeve and the sleeve is connected to the housing to prevent rotation of the sleeve relative to the housing.

Abstract: An optical system provides a lens cell having a generally cylindrical lens cell body and an optical lens system therein. The lens cell body has a lens cell central longitudinal axis and a lens cell optical axis, eccentrically offset from the lens cell central longitudinal axis. A sleeve has a generally cylindrical sleeve body, an outer surface with a first longitudinal axis, and an inner surface with a second longitudinal axis, eccentrically offset from the first longitudinal axis. The lens cell is inserted into the sleeve. A housing has a generally cylindrical body into which the sleeve is at least partially inserted. The lens cell and the sleeve are rotated relative to each other and to the housing such that the lens cell optical axis is aligned in a desired location. After the lens cell optical axis is aligned in the desired location, the lens cell is fixedly connected to the sleeve and the sleeve is connected to the housing to prevent rotation of the sleeve relative to the housing.

Abstract: A method, apparatus, and computer instructions are provided by the present invention to automatically recover from a failed node concurrent maintenance operation. A control logic is provided to send a first test command to processors of a new node. If the first test command is successful, a second test command is sent to all processors or to the remaining nodes if nodes are removed. If the second command is successful, system operation is resumed with the newly configured topology with either nodes added or removed. If the response is incorrect or a timeout has occurred, the control logic restores values to the current mode register and sends a third test command to check for an error. A fatal system attention is sent to a service processor or system software if an error is encountered. If no error, system operation is resumed with previously configured topology.

Abstract: Localized generation of global flush requests while providing a means for increasing the likelihood of forward progress in a controlled fashion. Local hazard (error) detection is accomplished with a trigger network situated between execution units and configurable state machines that track trigger events. Once a hazardous state is detected, a local detection mechanism requests a workaround flush from the flush control logic. The processor is flushed and a centralized workaround control is informed of the workaround flush. The centralized control blocks subsequent workaround flushes until forward progress has been made. The centralized control can also optionally send out a control to activate a set of localized workarounds or reduced performance modes to avoid the hazardous condition once instructions are re-executed after the flush until a configurable amount of forward progress has been made.

Abstract: A trace array with added width is provided. Each trace array entry includes a data portion and a side counter portion. When a programmable subset of trace data repeats, a side counter is incremented. When the programmable subset of the trace data stops repeating, the trace data and the side counter value are stored in the trace array. The trace array may also include a larger counter. In this implementation, if the smaller side counter reaches its maximum value, a larger counter may begin counting. The larger counter value may then be stored in its own trace array entry instead of the trace data. A predetermined side counter value may mark the entry as a larger compression counter instead of as a data entry.

Abstract: In a processor, a localized workaround is activated upon the sensing of a problematic condition occurring on said processor, and then control of the deactivation of the localized workaround is superseded by a centralized controller. In a preferred embodiment, the centralized controller monitors forward progress of the processor and maintains the workaround in an active condition until a threshold level of forward progress has occurred. Optionally, the localized workaround may be re-activated while under centralized control, resetting the notion of forward progress. Using the present invention, localized workarounds perform effectively while having a minimal impact on processor performance.

Abstract: A method, an apparatus and computer instructions are provided for specifying multiple voltage domains of a signal and macros in a processor chip and validating physical implementation and interconnections of the signal and macros. A set of attributes is provided for designs to define multiple voltage domains of a signal and macros in a processor chip. A first validation mechanism is then provided to validate that no electrical or logical errors created by logical connections between macros as defined by the set of attributes. A translation mechanism is provided to translate logical voltage description to a physical netlist for designers to connect powers to macros and signals. A second validation mechanism is provided to validate physical implementation adhere to designers' intent according to the set of attributes defined in the logical design.

Abstract: A method in a data processing system for avoiding a microprocessor's design defects and recovering a microprocessor from failing due to design defects, the method comprised of the following steps: The method detects and reports of events which warn of an error. Then the method locks a current checkpointed state and prevents instructions not checkpointed from checkpointing. After that, the method releases checkpointed state stores to a L2 cache, and drops stores not checkpointed. Next, the method blocks interrupts until recovery is completed. Then the method disables the power savings states throughout the processor. After that, the method disables an instruction fetch and an instruction dispatch. Next, the method sends a hardware reset signal. Then the method restores selected registers from the current checkpointed state. Next, the method fetches instructions from restored instruction addresses. Then the method resumes a normal execution after a programmable number of instructions.