Abstract: A technique and device (12) may be utilized to determine a characteristic of a crystallographic texture of a sample (10) based on a detected ultrasonic waveform. The device may be configured to receive ultrasonic waveform data representative of a reflected ultrasonic waveform that propagated through a sample from an ultrasonic detector (14). The device may select a portion of the ultrasonic waveform data and apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain. The device then may identify a dominant frequency (98) of the portion in the frequency domain and determine a characteristic of a crystallographic texture for the portion based on the dominant frequency of the portion.

Abstract: A fan for a turbofan engine includes a plurality of blades and a disk, the plurality of blades constructed of an anisotropic material, the anisotropic material is a plate, sheet, or forging. A first blade type has a first crystallographic texture and a first natural frequency, and a second blade type has a second crystallographic texture and a second natural frequency. The first natural frequency is at least 4% greater than the second natural frequency, and the first blade type and the second blade type are attached to the disk in an alternating pattern to provide a flutter damping effect. The fan blades may be cut from a plate of the anisotropic material along orthogonal directions or forged from round bar oriented along a first direction and a second orthogonal direction, respectively.

Abstract: A system may include a data analysis device that is configured to receive from an ultrasonic waveform detector ultrasonic waveform data representative of an ultrasonic waveform that propagated through a sample and resonated within a defect within the sample. The data analysis device may be further configured to select a portion of the ultrasonic waveform data, apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain, identify a characteristic frequency of the portion in the frequency domain, and determine a characteristic of the defect based on the characteristic frequency of the portion. In some examples, the characteristic of the defect may be at least one of an approximate size or an approximate shape of the defect.

Abstract: A system may include a data analysis device that is configured to receive from an ultrasonic waveform detector ultrasonic waveform data representative of an ultrasonic waveform that propagated through a sample and resonated within a defect within the sample. The data analysis device may be further configured to select a portion of the ultrasonic waveform data, apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain, identify a characteristic frequency of the portion in the frequency domain, and determine a characteristic of the defect based on the characteristic frequency of the portion. In some examples, the characteristic of the defect may be at least one of an approximate size or an approximate shape of the defect.

Abstract: A device for measuring crystal orientation with an x-ray source using the Laue method and includes an apparatus for mapping a polycrystalline surface having a grain orientation. The apparatus including an x-ray source creating an x-ray beam, the beam having polychromatic photons, the beam collimated to a point on the polycrystalline surface. A two-dimensional x-ray detector with an aperture, the x-ray beam passing through the aperture, the detector detecting and collecting polychromatic photons diffracted from the polycrystalline surface and onto the detector. A means for moving the polycrystalline surface with respect to the x-ray source to collect a plurality of diffracted x-rays which define a Laue pattern. A data processing means to collect Laue patterns of the polycrystalline surface based upon the plurality of diffracted x-rays, the Laue patterns identifying a plurality of crystallographic orientations and a plurality of grain surface areas on the polycrystalline surface.