Abstract: A memory includes a global reference circuit for generating a signal that controls the resistance of a plurality of reference devices used to read data in memory cells by sense amplifiers of the memory. The signal is generated by an output of an operational amplifier of the global reference circuit. The operational amplifier includes a first input whose voltage is set by flowing current through a reference circuit and a second input whose voltage is set by flowing current through a master reference device. The signal controls the resistance of the master reference device such that the voltages of the inputs of the operational amplifier match.

Abstract: A sense amplifier circuit includes a sampling capacitor coupled to the input of an inverting amplifier. The output of the inverting amplifier is coupled to a transistor that includes a current terminal. The memory read operation includes two phases. During a first phase, a terminal of the capacitor is coupled to a first cell. During a second phase, the terminal of the capacitor is coupled a second cell.

Abstract: In one embodiment, a sense amplifier circuit includes two current paths. Each path includes a transistor configured as a current source during a memory read operation and a second transistor. During the first phase of a memory read operation, the first current path is coupled to one cell and the second current path is coupled to a second cell. The sense amplifier circuit includes a capacitor that during a first phase of a memory read operation, is coupled between two corresponding nodes of the two paths to store a voltage difference between the two nodes. During the second phase, the cell/current path couplings are swapped and the capacitor is coupled to the control terminal of one of the second transistors to control the conductivity of the transistor for adjusting a voltage of an output node to indicate the value of the data being read.

Abstract: A high-side, low-side driver that controls voltage from a voltage source to an inductive or resistive load includes a power transistor with a gate, a source and a drain. The driver is configured in a high-side configuration when the load is connected between the source and ground and the drain is connected to the voltage source and in a low-side configuration when the load is connected between the drain and the voltage source and the source is connected to ground. A gate drive circuit turns the power transistor on and off. The positive clamp circuit is connected to the drain and the voltage source. The positive clamp circuit provides a recirculation path for inductive energy that is stored in the inductive load when a loss of reverse battery condition occurs or when ground is lost.