Abstract: Signal conditioning circuitry includes logic circuitry, a low-pass filter, and comparator circuitry. The logic circuitry is configured to compare a data unit with a preceding data unit, from a sequence of data units, and provide a logic output signal. The low-pass filter is coupled to the logic circuitry, and the low-pass filter is configured to provide a data transition density measurement for the sequence of data units based on the logic output signal. The comparator circuitry is coupled to the low-pass filter, and the comparator circuitry is configured to compare the data transition density measurement to a threshold and, based on the comparison to the threshold, indicate a disruptive pattern in the sequence of data units.

Abstract: Signal conditioning circuitry includes logic circuitry, a low-pass filter, and comparator circuitry. The logic circuitry is configured to compare a data unit with a preceding data unit, from a sequence of data units, and provide a logic output signal. The low-pass filter is coupled to the logic circuitry, and the low-pass filter is configured to provide a data transition density measurement for the sequence of data units based on the logic output signal. The comparator circuitry is coupled to the low-pass filter, and the comparator circuitry is configured to compare the data transition density measurement to a threshold and, based on the comparison to the threshold, indicate a disruptive pattern in the sequence of data units.

Abstract: Signal conditioning circuitry includes logic circuitry, a low-pass filter, and comparator circuitry. The logic circuitry is configured to compare a data unit with a preceding data unit, from a sequence of data units, and provide a logic output signal. The low-pass filter is coupled to the logic circuitry, and the low-pass filter is configured to provide a data transition density measurement for the sequence of data units based on the logic output signal. The comparator circuitry is coupled to the low-pass filter, and the comparator circuitry is configured to compare the data transition density measurement to a threshold and, based on the comparison to the threshold, indicate a disruptive pattern in the sequence of data units.

Abstract: Signal conditioning circuitry includes logic circuitry, a low-pass filter, and comparator circuitry. The logic circuitry is configured to compare a data unit with a preceding data unit, from a sequence of data units, and provide a logic output signal. The low-pass filter is coupled to the logic circuitry, and the low-pass filter is configured to provide a data transition density measurement for the sequence of data units based on the logic output signal. The comparator circuitry is coupled to the low-pass filter, and the comparator circuitry is configured to compare the data transition density measurement to a threshold and, based on the comparison to the threshold, indicate a disruptive pattern in the sequence of data units.

Abstract: A circuit includes a phase and frequency detector circuit to generate a first phase detect signal indicative of whether a polarity of a first clock is the same as a polarity of a second clock upon occurrence of an edge of a data signal. The second clock being 90 degrees out of phase with respect to the first clock. A lock detect circuit determines, based on the first phase detect signal, that a third clock is one of frequency and phase locked to the data signal, frequency and quadrature locked to the data signal, and not frequency locked to the data signal.

Abstract: A circuit includes a phase and frequency detector circuit to generate a first phase detect signal indicative of whether a polarity of a first clock is the same as a polarity of a second clock upon occurrence of an edge of a data signal. The second clock being 90 degrees out of phase with respect to the first clock. A lock detect circuit determines, based on the first phase detect signal, that a third clock is one of frequency and phase locked to the data signal, frequency and quadrature locked to the data signal, and not frequency locked to the data signal.

Abstract: A circuit includes a phase and frequency detector circuit to generate a first phase detect signal indicative of whether a polarity of a first clock is the same as a polarity of a second clock upon occurrence of an edge of a data signal. The second clock being 90 degrees out of phase with respect to the first clock. A lock detect circuit determines, based on the first phase detect signal, that a third clock is one of frequency and phase locked to the data signal, frequency and quadrature locked to the data signal, and not frequency locked to the data signal.

Abstract: A circuit includes a phase and frequency detector circuit to generate a first phase detect signal indicative of whether a polarity of a first clock is the same as a polarity of a second clock upon occurrence of an edge of a data signal. The second clock being 90 degrees out of phase with respect to the first clock. A lock detect circuit determines, based on the first phase detect signal, that a third clock is one of frequency and phase locked to the data signal, frequency and quadrature locked to the data signal, and not frequency locked to the data signal.

Abstract: A data correction filter includes an equalizer circuit, first, second, and third asynchronous comparators, an error amplifier, a multiplexer, a delay circuit, first and second exclusive-OR gates, and first and second integrator circuits. The first asynchronous comparator is coupled to the equalizer circuit. The second and third asynchronous comparators are coupled to the equalizer circuit and the error amplifier. The multiplexer is coupled to the first, second, and third asynchronous comparators. The delay circuit is coupled to the first asynchronous comparator. The first exclusive-OR gate is coupled to the delay circuit and the multiplexer. The second exclusive-OR gate is coupled to the first asynchronous comparator and the multiplexer. The first integrator circuit is coupled to first exclusive-OR gate and the equalizer circuit. The second integrator circuit is coupled to the second exclusive-OR gate and the error amplifier.