Abstract: The invention provides a method and apparatus for monitoring processes in living cells by measuring optical reflectivity by Surface Plasmon Resonance at the surface and/or inside living cells attached to a thin metal film (28), wherein said thin metal film is attached or optically coupled to a base of a prism (27) such that a collimated and optically polarized light beam (6c) in the near-infrared and/or mid-infrared wavelength ranges directed to a side surface of the prism is internally reflected by said prism at its base (27b) and measured by detector means (33) capable of measuring the intensity and optionally also polarization or phase of the reflected beam (6r).

Abstract: A microwave microscope having a resonant slit formed in a highly conductive end of a microwave waveguide forming a probe tip. A short dielectric rod is fit into the waveguide near its conductive end. A longer dielectric rod is placed in back of the short dielectric rod with a small gap between the two rods. The length of the shorter rod and the size of the gap are chosen to form a dielectric resonator at the microwave frequency adjacent to the probe tip. Thereby, the impedance of the waveguide can be matched to the generally high impedance of the slit probe tip. Preferably, the dielectric constant of the materials is high, thereby reducing the size of the waveguide and probe tip relative to the microwave wavelength.

Abstract: A microwave microscope for measuring electrical characteristics of a sample, such as a semiconductor wafer, with fine resolution. A probe includes a microwave waveguide capable of supporting the two lowest orthogonal modes from a microwave source, e.g. of millimeter radiation. The probe tip includes a thin conductive wall formed at the probe end of the probe. Two perpendicularly arranged slits, that is cross slits, are formed in the conductive wall, each slit having a length nearly resonant with the microwave radiation and a width substantially smaller, e.g. of the order of 100 .mu.m, and of a size such that the radiation of the proper polarization nearly transparently passes through that slit. The sample to be tested is placed in the near field of the probe tip and scanned relative to the probe. Probing microwave radiation having the polarization which passes through one slit is launched in the waveguide. A non-rotated polarization component is reflected back from the sample through the same slit.

Abstract: A microwave microscope comprising a microwave waveguide having a probe end positioned closely above the surface to be probed such that the surface is in the near field of the microwave radiation. The end of the probe facing the surface is covered with a metallic foil or a conducting film deposited over a dielectric layer and having a rectangular slit formed therein. The long dimension of the slit is nearly resonant with the microwave, that is, just slightly longer than one-half the microwave wavelength. The short dimension is substantially shorter than long dimension and is chosen such that the slitted end is transparent to the microwave. Thereby, substantial microwave power is emitted through the slit with fine resolution that is determined by the short dimension of the slit. The probe is scanned across the surface in the direction of the short slit dimension, and its resolution is approximately equal to the short slit dimension.