Patents by Inventor Michael J. Van Riet
Michael J. Van Riet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9601393Abstract: Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided.Type: GrantFiled: February 5, 2010Date of Patent: March 21, 2017Assignee: KLA-Tencor Corp.Inventors: Chris Lee, Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet, Brian Duffy
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Patent number: 9483819Abstract: One embodiment relates to a method of inspecting an array of cells on a substrate. A reference image is generated using a cell image that was previously determined to be defect free. A reference contour image which includes contours of the reference image is also generated. The reference contour image is used to detect defects in the array of cells on the substrate. Another embodiment relates to a system for detecting defects in an array on a substrate. Other embodiments, aspects and features are also disclosed.Type: GrantFiled: October 24, 2013Date of Patent: November 1, 2016Assignee: KLA-Tencor CorporationInventors: Chien-Huei Chen, Ajay Gupta, Thanh Huy Ha, Jianwei Wang, Hedong Yang, Christopher Michael Maher, Michael J. Van Riet
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Patent number: 9310316Abstract: Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for a defect detection method are provided. One method includes selecting one or more parameters of a defect detection method using an optimization function and information for a set of classified defects, which includes defects of interest and nuisance defects, such that the one or more parameters satisfy an objective for the defect detection method.Type: GrantFiled: September 11, 2012Date of Patent: April 12, 2016Assignee: KLA-Tencor Corp.Inventors: Kenong Wu, Chris W. Lee, Michael J. Van Riet, Yi Liu
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Patent number: 9087367Abstract: Methods and systems for determining design coordinates for defects detected on a wafer are provided. One method includes aligning a design for a wafer to defect review tool images for defects detected in multiple swaths on the wafer by an inspection tool, determining a position of each of the defects in design coordinates based on results of the aligning, separately determining a defect position offset for each of the multiple swaths based on the swath in which each of the defects was detected (swath correction factor), the design coordinates for each of the defects, and a position for each of the defects determined by the inspection tool, and determining design coordinates for the other defects detected in the multiple swaths by the inspection tool by applying the appropriate swath correction factor to those defects.Type: GrantFiled: August 31, 2012Date of Patent: July 21, 2015Assignee: KLA-Tencor Corp.Inventors: Ellis Chang, Michael J. Van Riet, Allen Park, Khurram Zafar, Santosh Bhattacharyya
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Publication number: 20140212024Abstract: One embodiment relates to a method of inspecting an array of cells on a substrate. A reference image is generated using a cell image that was previously determined to be defect free. A reference contour image which includes contours of the reference image is also generated. The reference contour image is used to detect defects in the array of cells on the substrate. Another embodiment relates to a system for detecting defects in an array on a substrate. Other embodiments, aspects and features are also disclosed.Type: ApplicationFiled: October 24, 2013Publication date: July 31, 2014Applicant: KLA-TENCOR CORPORATIONInventors: Chien-Huei CHEN, Ajay GUPTA, Thanh Huy HA, Jianwei WANG, Hedong YANG, Christopher Michael MAHER, Michael J. VAN RIET
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Publication number: 20140072203Abstract: Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for a defect detection method are provided. One method includes selecting one or more parameters of a defect detection method using an optimization function and information for a set of classified defects, which includes defects of interest and nuisance defects, such that the one or more parameters satisfy an objective for the defect detection method.Type: ApplicationFiled: September 11, 2012Publication date: March 13, 2014Applicant: KLA-Tencor CorporationInventors: Kenong Wu, Chris W. Lee, Michael J. Van Riet, Yi Liu
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Patent number: 8669523Abstract: One embodiment relates to a method of inspecting a site location on a target substrate. Contours are obtained, the contours having been generated from a reference image using a design clip. A target image of the site location is acquired. The contours are aligned to the target image, and contrast values are computed for pixels on the contours. A threshold is applied to the contrast values to determine contour-based defect blobs. Another embodiment relates to a method of generating contours for use in inspecting a site location for defects. Other embodiments, aspects and features are also disclosed.Type: GrantFiled: March 2, 2012Date of Patent: March 11, 2014Assignee: KLA-Tencor CorporationInventors: Chien-Huei Chen, Peter White, Michael J. Van Riet, Sankar Venkataraman, Hai Jiang, Hedong Yang, Ajay Gupta
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Publication number: 20130064442Abstract: Methods and systems for determining design coordinates for defects detected on a wafer are provided. One method includes aligning a design for a wafer to defect review tool images for defects detected in multiple swaths on the wafer by an inspection tool, determining a position of each of the defects in design coordinates based on results of the aligning, separately determining a defect position offset for each of the multiple swaths based on the swath in which each of the defects was detected (swath correction factor), the design coordinates for each of the defects, and a position for each of the defects determined by the inspection tool, and determining design coordinates for the other defects detected in the multiple swaths by the inspection tool by applying the appropriate swath correction factor to those defects.Type: ApplicationFiled: August 31, 2012Publication date: March 14, 2013Applicant: KLA-TENCOR CORPORATIONInventors: Ellis Chang, Michael J. Van Riet, Allen Park, Khurram Zafar, Santosh Bhattacharyya
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Publication number: 20120298862Abstract: One embodiment relates to a method of inspecting a site location on a target substrate. Contours are obtained, the contours having been generated from a reference image using a design clip. A target image of the site location is acquired. The contours are aligned to the target image, and contrast values are computed for pixels on the contours. A threshold is applied to the contrast values to determine contour-based defect blobs. Another embodiment relates to a method of generating contours for use in inspecting a site location for defects. Other embodiments, aspects and features are also disclosed.Type: ApplicationFiled: March 2, 2012Publication date: November 29, 2012Inventors: Chien-Huei CHEN, Peter WHITE, Michael J. VAN RIET, Sankar VENKATARAMAN, Hai JIANG, Hedong YANG, Ajay GUPTA
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Publication number: 20110320149Abstract: Computer-implemented methods, computer-readable media, and systems for selecting one or more parameters for inspection of a wafer are provided.Type: ApplicationFiled: February 5, 2010Publication date: December 29, 2011Applicant: KLA-TENCOR CORPORATIONInventors: Chris Lee, Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet, Brian Duffy
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Patent number: 8000922Abstract: Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values for parameter(s) of a detection algorithm to detect defects on the wafer. The method also includes selecting a portion of the defects from results of the scan based on a predetermined maximum number of total defects to be used for selecting values for the parameter(s) of the detection algorithm. The method further includes storing information, which includes values for the parameter(s) of the detection algorithm determined for the defects in the portion. The information can be used to select the values for the parameter(s) of the detection algorithm to be used for the inspection recipe without performing an additional scan of the wafer subsequent to the scan.Type: GrantFiled: May 29, 2008Date of Patent: August 16, 2011Assignee: KLA-Tencor Corp.Inventors: Hong Chen, Michael J. Van Riet, Chien-Huei (Adam) Chen, Jason Z. Lin, Chris Maher, Michal Kowalski, Barry Becker, Stephanie Chen, Subramanian Balakrishnan, Suryanarayana Tummala
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Publication number: 20090299681Abstract: Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values for parameter(s) of a detection algorithm to detect defects on the wafer. The method also includes selecting a portion of the defects from results of the scan based on a predetermined maximum number of total defects to be used for selecting values for the parameter(s) of the detection algorithm. The method further includes storing information, which includes values for the parameter(s) of the detection algorithm determined for the defects in the portion. The information can be used to select the values for the parameter(s) of the detection algorithm to be used for the inspection recipe without performing an additional scan of the wafer subsequent to the scan.Type: ApplicationFiled: May 29, 2008Publication date: December 3, 2009Inventors: Hong Chen, Michael J. Van Riet, Chien-Huei (Adam) Chen, Jason Z. Lin, Chris Maher, Michal Kowalski, Barry Becker, Stephanie Chen, Subramanian Balakrishnan, Suryanarayana Tummala
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Patent number: 7345753Abstract: Disclosed are methods and apparatus for facilitating procedures implemented on an analysis tool are provided herein. In one embodiment, an apparatus includes an analyzer module arranged for managing an analyzer tool and causing a high resolution image generated by the analyzer tool to be presented in a display. The apparatus also includes an inspector interface module arranged for simulating an inspector interface in the display. The inspector interface includes features that are available on a corresponding inspection tool, and the inspector interface is based at least in part on defect results from the inspection tool. In one embodiment, the analyzer module executes without knowledge of the inspector interface module and visa versa, and the apparatus includes a synchronization mechanism that knows about these two modules and also is capable of communicating with these two modules.Type: GrantFiled: February 28, 2005Date of Patent: March 18, 2008Assignee: KLA-Tencor Technologies CorporationInventors: Kris Bhaskar, Ardis Liang, Michael J. Van Riet