Patents by Inventor Michael L. Miller
Michael L. Miller has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20080266090Abstract: A system and method for automatically determining a physical location of one or more units in a rack, including: using one or more physical cables between rack units; cascading a first signal through the one or more units located in the rack, the first signal being encoded with a unit number and a physical parameter; and creating a rack ID by utilizing hardware parameters, the hardware parameters being determined by: detecting a second signal that exists from a bottom unit, the bottom unit located at the bottom of the rack; and using a third signal to send data between the one or more units in the rack by manipulating void spaces within the rack, the third signal being either cabled or an optical signal.Type: ApplicationFiled: April 30, 2007Publication date: October 30, 2008Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Patrick K. Egan, Michael L. Miller, Todd J. Rosedahl
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Patent number: 7242858Abstract: An external reset device that is operable in combination with an electric water heater is disclosed. The external reset device is attached to an element cover that is mounted to the water heater and conceals the water heater's control device, such as a manual reset thermostat. The external reset device comprises a bushing member and a key member attached to the element cover. The bushing member is aligned with a reset button on the control device. The key member is adapted for insertion into the bushing member to depress the reset button and close a switch, enabling the heating elements of the electric water heater to power ON and heat the water within the electric water heater.Type: GrantFiled: March 13, 2006Date of Patent: July 10, 2007Assignee: Therm-O-Disc IncorporatedInventors: Richard E. Welch, Michael L. Miller
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Patent number: 7103439Abstract: A method for initializing process controllers based on tool event data includes providing a tool having a process controller adapted to employ a control model to control an operating recipe of the tool; receiving a tool event notification; and initializing the control model in response to receiving the tool event notification. A manufacturing system includes a tool and a process controller. The tool is adapted to process wafers in accordance with an operating recipe. The process controller is adapted to employ a control model to control the operating recipe in accordance with a control algorithm. The process controller is further adapted to receive a tool event notification and initialize the control model in response to receiving the tool event notification.Type: GrantFiled: April 2, 2001Date of Patent: September 5, 2006Assignee: Advanced Micro Devices, Inc.Inventors: Christopher A. Bode, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Anastasia Oshelski Peterson, Thomas J. Sonderman, Michael L. Miller
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Patent number: 7064647Abstract: A method and apparatus for an air core reactor including a plurality of straight members and a plurality of offset members, the plurality of straight and offset members are interconnected to form an orthogonal spiral having an air core therethrough.Type: GrantFiled: June 22, 2004Date of Patent: June 20, 2006Assignee: General Electric CompanyInventors: Howard Ross Edmunds, Brian Matthew Alken, Andrew Phillip, Christopher McMenamin, Christopher T. Moore, John Earl Bittner, Stephen Daniel Nash, Michael L. Miller
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Patent number: 7051250Abstract: A method and apparatus is provided for routing workpieces based upon detecting a fault. The method comprises routing a workpiece to a first processing tool identified by a dispatch system, detecting a fault condition associated with the first processing tool and notifying the dispatch system of the detected fault condition. The method further comprises routing a second workpiece to a second processing tool in response to the dispatch system being notified of the fault condition.Type: GrantFiled: June 6, 2002Date of Patent: May 23, 2006Assignee: Advanced Micro Devices, Inc.Inventors: Sam H. Allen, Jr., Michael R. Conboy, Michael L. Miller, Elfido Coss, Jr.
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Patent number: 6991945Abstract: A method and apparatus is provided for fault detection spanning multiple processes. The method comprises receiving operational data associated with a first process, receiving operational data associated with a second process, which is downstream to the first process and performing fault detection analysis based on the operational data associated with the first process and second process using a common fault detection unit.Type: GrantFiled: August 30, 2002Date of Patent: January 31, 2006Assignee: Advanced Micro Devices, Inc.Inventors: Howard E. Castle, Matthew A. Purdy, Gregory A. Cherry, Richard J. Markle, Eric O. Green, Michael L. Miller, Brian K. Cusson
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Patent number: 6970757Abstract: A method for controlling a manufacturing process includes processing a plurality of workpieces in a tool; monitoring a rework rate associated with the workpieces processed in the tool; and initiating an automatic corrective action in response to the rework rate being greater than a predetermined threshold. A manufacturing system includes a tool adapted to process a plurality of workpieces and a rework controller adapted to monitor a rework rate associated with the workpieces processed in the tool and initiate an automatic corrective action in response to the rework rate being greater than a predetermined threshold.Type: GrantFiled: April 19, 2001Date of Patent: November 29, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Joyce S. Oey Hewett, Anthony J. Toprac, Christopher A. Bode, Alexander J. Pasadyn, Anastasia Oshelski Peterson, Thomas J. Sonderman, Michael L. Miller
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Patent number: 6957120Abstract: A method and an apparatus for implementing enhancing data population based upon manufacturing data. A first and a second workpiece are processed. Metrology data relating to the first workpiece is acquired. The metrology data is extrapolated to generate representative metrology data relating to the second workpiece.Type: GrantFiled: January 6, 2003Date of Patent: October 18, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Christopher A. Bode, Michael L. Miller
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Patent number: 6937914Abstract: A method for controlling a tool adapted to process workpieces in accordance with an operating recipe based on a process target value is provided. The method includes collecting manufacturing characteristic data associated with the workpieces; correlating the manufacturing characteristic data with a first manufacturing metric to generate a first manufacturing metric distribution for the workpieces; and adjusting the process target value based on the first manufacturing metric distribution. A manufacturing system includes a processing tool and a target monitor. The processing tool is adapted to process workpieces in accordance with an operating recipe based on a process target value.Type: GrantFiled: February 21, 2001Date of Patent: August 30, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Christopher A. Bode, Thomas J. Sonderman, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Anastasia Oshelski Peterson, Michael L. Miller
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Patent number: 6923789Abstract: There is provided a multiple-component tampon applicator formed from at least three separate components including a barrel, a plunger, a fingergrip, an insertion tip. The at least three separate components are formed independently from one another, prior to forming the applicator. The multiple components may be formed from materials including, for example, biopolymer including starches and proteins, cardboard, heat shrink plastic, paper slurry, plastic, plastic tubing, pulp slurry, pulp-molded paper, or any combinations thereof. Methods for making a multiple component tampon applicator are also provided.Type: GrantFiled: February 22, 2002Date of Patent: August 2, 2005Assignee: Playtex Products, Inc.Inventors: Jessica E. LeMay, Dane R. Jackson, Michael L. Miller, Wayne D. Melvin
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Patent number: 6925347Abstract: A method and apparatus is provided for a process control based on an estimated process result. The method comprises processing a workpiece using a processing tool, receiving trace data associated with the processing of the workpiece from the processing tool and estimating at least one process result of the workpiece based on at least a portion of the received trace data. The method further comprises adjusting processing of a next workpiece based on the estimated at least one process result.Type: GrantFiled: August 19, 2002Date of Patent: August 2, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Michael L. Miller, Thomas J. Sonderman, Alexander J. Pasadyn, Richard J. Markle, Brian K. Cusson, Patrick M. Cowan, Timothy L. Jackson, Naomi M. Jenkins
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Patent number: 6922595Abstract: A method and apparatus is provided for selecting control algorithms based on business rules. The method comprises processing a workpiece using a processing tool. The processing tool is capable of processing the workpiece under a control of at least a first and a second control algorithm. The method further comprises detecting an occurrence of an event that affects an operation of the processing tool, selecting at least one of the first and second control algorithm based on detecting the occurrence of the event and processing a workpiece using the processing tool in accordance with the selected control algorithm.Type: GrantFiled: April 29, 2002Date of Patent: July 26, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Anastasia O. Peterson, Michael L. Miller
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Patent number: 6912433Abstract: A method and apparatus are provided for determining a next tool state based on fault detection information. The method comprises receiving operational data associated with processing of a workpiece by a processing tool, determining at least a portion of noise associated with the processing of the workpiece based on analyzing the operational data and estimating a next state of the processing tool based on at least the determined portion of the noise.Type: GrantFiled: December 18, 2002Date of Patent: June 28, 2005Assignee: Advanced Mirco Devices, Inc.Inventors: Robert J. Chong, Michael L. Miller, Alexander J. Pasadyn, Eric O. Green
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Patent number: 6901340Abstract: A method for distinguishing between sources of process variation includes processing a plurality of manufactured items in a process flow; storing a set of production environment data associated with each of the manufactured items; identifying manufactured items associated with a process drift; generating a plurality of characteristic threads based on the production environment data; comparing the characteristic threads for at least those manufactured items associated with the process drift; and determining at least one potential cause for the process drift based on the comparison of the characteristic threads. A manufacturing system for distinguishing between sources of process variation is also provided. The manufacturing system includes a plurality of tools for processing manufactured items in a process flow, a database server, and a drift monitor.Type: GrantFiled: April 2, 2001Date of Patent: May 31, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Alexander J. Pasadyn, Joyce S. Oey Hewett, Christopher A. Bode, Anthony J. Toprac, Anastasia Oshelski Peterson, Thomas J. Sonderman, Michael L. Miller
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Patent number: 6868512Abstract: A method includes receiving incoming fault detection and correction (FDC) data. The incoming FDC data is stored in a real-time database, A first subscriber list designating a first subscriber for at least a portion of the incoming FDC data is provided. The portion of the incoming FDC data designated in the first subscriber list is sent to the first subscriber. A system includes at least one data collection source, a real-time database, and a database management unit. The data collection source is configured to generate incoming fault detection and correction (FDC) data. The database management unit is configured to store the incoming FDC data in the real-time database, provide a first subscriber list designating a first subscriber for at least a portion of the incoming FDC data, and send the portion of the incoming FDC data designated in the first subscriber list to the first subscriber.Type: GrantFiled: August 27, 2002Date of Patent: March 15, 2005Assignee: Advanced Micro Devices, Inc.Inventors: Michael L. Miller, Elfido Coss, Jr.
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Patent number: 6801817Abstract: A method for controlling a manufacturing system includes processing workpieces in a plurality of tools; initiating a baseline control script for a selected tool of the plurality of tools; providing context information for the baseline control script; determining a tool type based on the context information; selecting a group of control routines for the selected tool based on the tool type; determining required control routines from the group of control routines based on the context information; and executing the required control routines to generate control actions for the selected tool. A manufacturing system includes a plurality of tools adapted to process workpieces, a control execution manager, and a control executor. The control execution manager is adapted to initiate a baseline control script for a selected tool of the plurality of tools and provide context information for the baseline control script.Type: GrantFiled: February 20, 2001Date of Patent: October 5, 2004Assignee: Advanced Micro Devices, Inc.Inventors: Christopher A. Bode, Alexander J. Pasadyn, Anthony J. Toprac, Joyce S. Oey Hewett, Anastasia Oshelski Peterson, Thomas J. Sonderman, Michael L. Miller
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Patent number: 6785586Abstract: A method for adaptively scheduling tool maintenance includes controlling an operating recipe of a tool using a plurality of control actions, monitoring the control actions to identify a degraded tool condition, and automatically initiating a tool maintenance recommendation in response to identifying the degraded tool condition. A manufacturing system includes a tool, a process controller, and a tool health monitor. The tool is adapted to process a workpiece in accordance with an operating recipe. The process controller is adapted to control the operating recipe of the tool using a plurality of control actions. The tool health monitor is adapted to monitor the control actions to identify a degraded tool condition and automatically initiate a tool maintenance recommendation in response to identifying the degraded tool condition.Type: GrantFiled: February 23, 2001Date of Patent: August 31, 2004Assignee: Advanced Micro Devices, Inc.Inventors: Anthony J. Toprac, Thomas J. Sonderman, Christopher A. Bode, Alexander J. Pasadyn, Joyce S. Oey Hewett, Anastasia Oshelski Peterson, Michael L. Miller
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Patent number: 6778873Abstract: A method and apparatus is provided for identifying a cause of a fault based on controller output. The method comprises processing at least one workpiece under a direction of the controller and detecting a fault associated with the processing of the at least one workpiece. The method further includes determining a plurality of possible causes of the detected fault, identifying a more likely possible cause out of the plurality of possible causes, providing fault information associated with the identified more likely possible cause to the controller. The method further includes providing fault information associated with the identified more likely possible cause to the controller. The method further comprises adjusting the processing of one or more workpieces to be processed next based on the fault information provided to the controller.Type: GrantFiled: July 31, 2002Date of Patent: August 17, 2004Assignee: Advanced Micro Devices, Inc.Inventors: Jin Wang, Elfido Coss, Jr., Brian K. Cusson, Alexander J. Pasadyn, Michael L. Miller, Naomi M. Jenkins, Christopher A. Bode
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Patent number: 6706541Abstract: A processing system includes a sensor, a processing tool, and an automatic process controller. The sensor has a plurality of sensing regions. The processing tool is adapted to process at least one process layer on a wafer. The process tool includes a process control device controllable by a process control variable. The sensor is adapted to measure a process layer characteristic of the process layer in a selected one of the sensing regions. The automatic process controller is adapted to receive the process layer characteristics measured by the sensor and adjust the process control variable in response to the process layer characteristic measured in one sensing region differing from the process layer characteristic measured in another sensing region.Type: GrantFiled: October 20, 1999Date of Patent: March 16, 2004Assignee: Advanced Micro Devices, Inc.Inventors: Anthony J. Toprac, Michael L. Miller
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Patent number: 6699727Abstract: A method for prioritizing production flow includes processing a plurality of manufactured items in a process flow; measuring characteristics of a plurality of manufactured items in the process flow; estimating performance grades for the plurality of manufactured items based on the measured characteristics; grouping the manufactured items with like estimated performance grades; assigning priorities to groups of manufactured items with like estimated performance grades; and directing the plurality of manufactured items through the process flow based on the assigned priorities. A manufacturing system includes a plurality of processing tools adapted to process a plurality of manufactured items in a process flow, a metrology tool, and a process control server. The metrology tool is adapted to measure characteristics of a plurality of manufactured items in the process flow.Type: GrantFiled: March 29, 2001Date of Patent: March 2, 2004Assignee: Advanced Micro Devices Inc.Inventors: Anthony J. Toprac, Joyce S. Oey Hewett, Christopher A. Bode, Alexander J. Pasadyn, Anastasia Oshelski Peterson, Thomas J. Sonderman, Michael L. Miller