Abstract: An integrated circuit handling, packaging and testing apparatus in the form of a testable chip carrier comprising a rigid substrate onto which a chip may be bonded, and which provides a high density interconnect pattern orthogonally aligned to the chip bond pads for wire bonding thereto. The interconnect also provides external bonding points patterned for similar orthogonal alignment to the external device to which the chip is to be connected, and the dimensions of the carrier are substantially smaller than an equivalent standard or custom package type. A hermetic or non-hermetic seal lidding operation may be carried out on the chip and carrier. The carrier also provides a detachable test perimeter allowing full-functional testing and burn-in of the attached wire-bonded chip prior to placement on a printed circuit board or multi-chip module.