Patents by Inventor Michael Patrick Hassel-Shearer
Michael Patrick Hassel-Shearer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230373028Abstract: A pulsed laser apparatus for milling a sample is described. The apparatus includes a pulsed laser, a scan head for scanning a beam from the pulsed laser across the sample an F-theta lens for focusing the scanned beam onto the sample and a confocal detector for detection of ablation depth. Methods of pulsed laser milling are also described.Type: ApplicationFiled: October 8, 2021Publication date: November 23, 2023Applicant: Gatan, Inc.Inventors: Steven Thomas COYLE, Thijs C. HOSMAN, John Andrew HUNT, Michael Patrick HASSEL-SHEARER
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Publication number: 20230311244Abstract: A pulsed laser apparatus for milling a sample is described. The apparatus includes a pulsed laser, a scan head for scanning a beam from the pulsed laser across the sample and an F-theta lens for focusing the scanned beam onto the sample. The apparatus may also include a liquid bath for milling the sample under the liquid, such as water. Methods of pulsed laser milling are also described.Type: ApplicationFiled: August 27, 2021Publication date: October 5, 2023Applicant: Gatan, Inc.Inventors: Steven Thomas COYLE, Thijs C. HOSMAN, John Andrew HUNT, Michael Patrick HASSEL-SHEARER
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Patent number: 11004656Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: GrantFiled: October 13, 2015Date of Patent: May 11, 2021Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C Hosman
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Patent number: 10731246Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: GrantFiled: July 24, 2015Date of Patent: August 4, 2020Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C Hosman
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Patent number: 10110854Abstract: Disclosed are embodiments of an ion beam sample preparation apparatus and methods. The methods operate on a sample disposed in a vacuum chamber and include steps of directing an intensity-controllable, tilt-angle controllable ion beam at a sample holder coupled to a rotation stage. The methods further include illuminating and capturing one or more images of the sample, extracting useful features from one or more images and thereafter adjusting the sample preparation steps. Further methods are disclosed for capturing sequences of images, programmatically rotating images, and displaying sequences of images with similar rotation angles. Further methods include extracting useful features from sequences of images that may change with respect to time as ion beam preparation continues.Type: GrantFiled: July 24, 2013Date of Patent: October 23, 2018Assignee: Gatan, Inc.Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer
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Publication number: 20160111249Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: ApplicationFiled: October 13, 2015Publication date: April 21, 2016Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C. Hosman
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Publication number: 20160024645Abstract: Disclosed are embodiments of an ion beam sample preparation and coating apparatus and methods. A sample may be prepared in one or more ion beams and then a coating may be sputtered onto the prepared sample within the same apparatus. A vacuum transfer device may be used with the apparatus in order to transfer a sample into and out of the apparatus while in a controlled environment. Various methods to improve preparation and coating uniformity are disclosed including: rotating the sample retention stage; modulating the sample retention stage; variable tilt ion beam irradiating means, more than one ion beam irradiating means, coating thickness monitoring, selective shielding of the sample, and modulating the coating donor holder.Type: ApplicationFiled: July 24, 2015Publication date: January 28, 2016Inventors: John Andrew Hunt, Steven Thomas Coyle, Michael Patrick Hassel-Shearer, Thijs C. Hosman
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Patent number: 9196455Abstract: Ion beam sample preparation apparatus and methods are described. The apparatus has disposed in a vacuum chamber at least one tilting ion beam irradiating means with intensity control, a rotation stage with rotation control, a sample holder, and an adjustable positioning stage that has two axes of positional adjustment that are operable to move the region of the sample being prepared by the ion beam relative to the ion beam. The apparatus may also include a vacuum-tight optical window for observing the sample and a shutter for protecting the optical window from debris while the sample is prepared in the ion beam. The apparatus may also include an instrument controller responsive to the state of the apparatus and to the condition of the sample and is operable to control the preparation of the sample.Type: GrantFiled: July 27, 2014Date of Patent: November 24, 2015Assignee: Gatan, Inc.Inventors: Steven Thomas Coyle, John Andrew Hunt, Michael Patrick Hassel-Shearer
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Publication number: 20140332699Abstract: Ion beam sample preparation apparatus and methods are described. The apparatus has disposed in a vacuum chamber at least one tilting ion beam irradiating means with intensity control, a rotation stage with rotation control, a sample holder, and an adjustable positioning stage that has two axes of positional adjustment that are operable to move the region of the sample being prepared by the ion beam relative to the ion beam. The apparatus may also include a vacuum-tight optical window for observing the sample and a shutter for protecting the optical window from debris while the sample is prepared in the ion beam. The apparatus may also include an instrument controller responsive to the state of the apparatus and to the condition of the sample and is operable to control the preparation of the sample.Type: ApplicationFiled: July 27, 2014Publication date: November 13, 2014Inventors: Steven Thomas Coyle, John Andrew Hunt, Michael Patrick Hassel-Shearer
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Patent number: 8791438Abstract: Disclosed are embodiments of an ion beam sample preparation apparatus and methods. The apparatus has disposed in a vacuum chamber at least one tilting ion beam irradiating means with intensity control, a rotation stage with rotation control, a sample holder, and an adjustable positioning stage that has two axes of positional adjustment that are operable to move the region of the sample being prepared by the ion beam relative to the ion beam. The apparatus may also include a vacuum-tight optical window for observing the sample and a shutter for protecting the optical window from debris while the sample is prepared in the ion beam.Type: GrantFiled: July 24, 2013Date of Patent: July 29, 2014Assignee: Gatan Inc.Inventors: Steven Thomas Coyle, John Andrew Hunt, Michael Patrick Hassel-Shearer
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Publication number: 20140091237Abstract: Disclosed are embodiments of an ion beam sample preparation apparatus and methods. The apparatus has disposed in a vacuum chamber at least one tilting ion beam irradiating means with intensity control, a rotation stage with rotation control, a sample holder, and an adjustable positioning stage that has two axes of positional adjustment that are operable to move the region of the sample being prepared by the ion beam relative to the ion beam. The apparatus may also include a vacuum-tight optical window for observing the sample and a shutter for protecting the optical window from debris while the sample is prepared in the ion beam.Type: ApplicationFiled: July 24, 2013Publication date: April 3, 2014Applicant: Gatan, Inc.Inventors: Steven Thomas Coyle, John Andrew Hunt, Michael Patrick Hassel-Shearer