Patents by Inventor Michael W. Mock

Michael W. Mock has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7835814
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. For example, the summary reports can quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: November 16, 2010
    Assignee: International Business Machines Corporation
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong
  • Patent number: 7805639
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment in order to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during certain events (i.e., certain transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports that quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: September 28, 2010
    Assignee: International Business Machines Corporation
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong
  • Patent number: 7793162
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. For example, the summary reports can quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: September 7, 2010
    Assignee: International Business Machines Corporation
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong
  • Publication number: 20100063610
    Abstract: A method and system employing said method for analyzing process module performance in semiconductor manufacturing. The method and system include process modules as part of a process tool. A process initiated in the process module includes steps. Each step includes specified performance parameters. A detection device detects at least one predetermined measurement in the process module. A program and processor generate data about the process module and steps and generates data about the steps and the process module. The program provides statistical analysis of the steps and the environment of the process module using the generated data and the performance parameters. The program determines variations between the process step performance parameters and the generated data about the process steps.
    Type: Application
    Filed: September 8, 2008
    Publication date: March 11, 2010
    Inventors: David Angell, Bruce Raymond Clemens, Michael W. Mock, Gary R. Moore, Kathy Shackett, Nancy Tovey, Justin Wai-chow Wong
  • Publication number: 20090048700
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Application
    Filed: August 16, 2007
    Publication date: February 19, 2009
    Inventors: Michael W. Mock, Gray R. Moore, Justin W. Wong
  • Publication number: 20090049011
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment in order to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during certain events (i.e., certain transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports that quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Application
    Filed: August 16, 2007
    Publication date: February 19, 2009
    Inventor: Michael W. Mock
  • Publication number: 20090048701
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. For example, the summary reports can quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Application
    Filed: August 16, 2007
    Publication date: February 19, 2009
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong
  • Publication number: 20090049345
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. For example, the summary reports can quantify the performance and/or the effectiveness of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Application
    Filed: August 16, 2007
    Publication date: February 19, 2009
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong
  • Patent number: 7493236
    Abstract: Disclosed are embodiments that provide near real-time monitoring of a control application in a manufacturing environment to detect and determine the root cause of faults within the control application. The embodiments monitor the flow of data within the control application during events (i.e., transactions, stages, process steps, etc.). By comparing a dataflow path for a near real-time event with historical dataflow path records, dataflow interruptions (i.e., fails) within the control application can be detected. By determining the location of such a dataflow interruption, the root cause of the control application fail can be determined. Additionally, the invention can generate summary reports indicating the status of the control application. These summary reports can further be generated with drill downs to provide a user with direct access to the records upon which the reports were based.
    Type: Grant
    Filed: August 16, 2007
    Date of Patent: February 17, 2009
    Assignee: International Business Machines Corporation
    Inventors: Michael W. Mock, Gary R. Moore, Justin W. Wong