Abstract: The image of an object is improved by estimating the scattered radiation that it transmits to the detectors. To achieve this, one uses the scattered radiation effectively measured through an imitation of the object, having analogous attenuation properties, and which one modifies by the weighting coefficients obtained by a transformation of the values of the total radiation received through the object (3) and the selected imitation (8). One thus manages to improve the image without subjecting the object to a double irradiation in order to measure the scattered radiation separately. The principal applications are tomography, bone densitometry and non-destructive controls.

Abstract: The image of an object is improved by estimating the scattered radiation that it transmits to the detectors. To achieve this, one uses the scattered radiation effectively measured through an imitation of the object, having analogous attenuation properties, and which one modifies by the weighting coefficients obtained by a transformation of the values of the total radiation received through the object (3) and the selected imitation (8). One thus manages to improve the image without subjecting the object to a double irradiation in order to measure the scattered radiation separately. The principal applications are tomography, bone densitometry and non-destructive controls.

Abstract: The radiography of a subject is improved by estimating the scattered radiation it transmits to the detectors. For this, one uses scattered radiation measured effectively through a simulacrum of the subject, with analogous attenuation properties, and which are modified by weighted coefficients obtained through a transformation of the values of total radiation received through the subject (3) and the simulacrum (8) selected. Thus it is also possible to improve radiographs without double irradiation of the subject to measure the scattered radiation separately.

Abstract: The radiography of a subject is improved by estimating the scattered radiation it transmits to the detectors. For this, one uses scattered radiation measured effectively through a simulacrum of the subject, with analogous attenuation properties, and which are modified by weighted coefficients obtained through a transformation of the values of total radiation received through the subject (3) and the simulacrum (8) selected. Thus it is also possible to improve radiographs without double irradiation of the subject to measure the scattered radiation separately.

Abstract: The present invention relates to a process for correcting scatter energy in which:using an X-ray and a first three-dimensional model of the object, a second model of the object is generated adapted to its geometry;the source energy spectrum is made discrete and an average density value is allocated to each zone of this object;primary energy is mapped;along the source-point tracklength of the primary energy map, a new average density value is determined for each of the zones and for each source-point tracklength of the detector;a coherent distribution coefficient and an incoherent distribution coefficient are obtained per energy, per tracklength and per zone;scatter energy is mapped;primary energy is mapped and an image of the object is obtained.

Abstract: A process for synthesizing a reference image of an object by applying real image characteristic element data to characteristic elements of a descriptive (CAD based generated) image. The process includes preprocessing the descriptive image data by identifying characteristic elements of the object in the descriptive dam and determining the coordinates of the characteristic elements. The first format of the descriptive image data and the coordinates of the characteristic elements are subsequently changed to an equivalent descriptive image and equivalent coordinates of the characteristic elements having a second format.

Abstract: The process consists of producing a first binary image (104) from descriptive data of an integrated circuit (or another type of object) to be inspected, the data being stored in a data base (102). Real images of characteristic elements of the integrated circuit to be inspected are then acquired (200) and processed so as to be applicable (300) to the binary image, as a function of their associated positions. A this obtained synthesis image is considered as a reference image with which are compared the images of the circuits to be inspected. This process is applicable to numerous types of industrially produced objects requiring a very precise inspection.

Abstract: This invention concerns a method for optimizing contrast in an image of a sample.This sample (5) comprises a whole number of zones having different reflection or transmittance factors. These zones are illuminated by a light source (7) and the image is obtained at the output of an optical system (4) to be analyzed by a sensor (10) supplying on the outputs recording signals of this image. Contrast optimization consists of determining the characteristics of an optimal fiber to be inserted between the source (7) and the sample (5) to be controlled.Application in particular for the control of in-production integrated circuits.