Patents by Inventor Michel Souheil Tohme

Michel Souheil Tohme has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240144441
    Abstract: Various methods and systems are provided for training a denoising system for a digital imaging system. The denoising system can be a deep learning denoising system formed as a blind or non-blind denoising system in which the training dataset provided to the denoising system includes a noisy image formed with simulated noise added to a clean digital image, and a reference image formed of the clean image having residual noise added thereto, where the residual noise is a fraction of the simulated noise used to form the noisy image. The use of the residual noise within the reference image of the training dataset teaches the DL network in the training process to remove less than all the noise during subsequent inferencing of digital images from the digital imaging system. By leaving selected amounts of noise in the digital images, the denoiser can be tuned to improve image attributes and texture.
    Type: Application
    Filed: October 28, 2022
    Publication date: May 2, 2024
    Inventors: Michel Souheil Tohme, German Guillermo Vera Gonzalez, Ludovic Boilevin Kayl, Vincent Bismuth, Tao Tan
  • Patent number: 10733770
    Abstract: A method for performing fault-tolerant reconstruction of an image of an object is provided. The method includes acquiring a dataset corresponding to the object via a plurality of sensors, and detecting anomalous data within the dataset based at least in part on a statistical difference between the anomalous data and reference data within the dataset. The anomalous data is acquired by at least a first sensor of the plurality, and the reference data is acquired by at least a second sensor of the plurality that neighbors the first sensor.
    Type: Grant
    Filed: January 30, 2018
    Date of Patent: August 4, 2020
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Michel Souheil Tohme, Floribertus P. Heukensfeldt Jansen, Timothy Wayne Deller
  • Patent number: 10282836
    Abstract: According to one embodiment, a method of image analysis is provided. The method includes binning image data into a plurality of sinogram frames, identifying a plurality of initial stationary frames by applying a first analysis technique on the plurality of binned sinogram frames, extracting a plurality of first statistical parameters applying a second analysis technique on the plurality of binned sinogram frames, combining the plurality of first statistical parameters with boundaries of plurality of initial stationary frames to generate a presentation of a joint analysis combining at least some of the plurality of the first statistical parameters and at least some of the plurality of the second statistical parameter, identifying a plurality of final stationary frames from the presentation of the joint analysis, independently reconstructing each of the plurality of final stationary frames, and registering each of the plurality of final stationary frames to a first state.
    Type: Grant
    Filed: August 12, 2016
    Date of Patent: May 7, 2019
    Assignee: General Electric Company
    Inventors: Hariharan Ravishankar, Ravindra Mohan Manjeshwar, Floribertus PM Heukensfeldt Jansen, Michel Souheil Tohme
  • Publication number: 20180308262
    Abstract: A method for performing fault-tolerant reconstruction of an image of an object is provided. The method includes acquiring a dataset corresponding to the object via a plurality of sensors, and detecting anomalous data within the dataset based at least in part on a statistical difference between the anomalous data and reference data within the dataset. The anomalous data is acquired by at least a first sensor of the plurality, and the reference data is acquired by at least a second sensor of the plurality that neighbors the first sensor.
    Type: Application
    Filed: January 30, 2018
    Publication date: October 25, 2018
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: MICHEL SOUHEIL TOHME, FLORIBERTUS P. HEUKENSFELDT JANSEN, TIMOTHY WAYNE DELLER
  • Publication number: 20180047155
    Abstract: According to one embodiment, a method of image analysis is provided. The method includes binning image data into a plurality of sinogram frames, identifying a plurality of initial stationary frames by applying a first analysis technique on the plurality of binned sinogram frames, extracting a plurality of first statistical parameters applying a second analysis technique on the plurality of binned sinogram frames, combining the plurality of first statistical parameters with boundaries of plurality of initial stationary frames to generate a presentation of a joint analysis combining at least some of the plurality of the first statistical parameters and at least some of the plurality of the second statistical parameter, identifying a plurality of final stationary frames from the presentation of the joint analysis, independently reconstructing each of the plurality of final stationary frames, and registering each of the plurality of final stationary frames to a first state.
    Type: Application
    Filed: August 12, 2016
    Publication date: February 15, 2018
    Inventors: Hariharan Ravishankar, Ravindra Mohan Manjeshwar, Floribertus PM Heukensfeldt Jansen, Michel Souheil Tohme