Patents by Inventor Michiyasu Itoh

Michiyasu Itoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4939030
    Abstract: Provided is a film for retaining freshness of vegetables and fruits which comprises a synthetic resin film, a microporous resin film and a water-absorbing layer interposed between both said films, said microporous resin film having a maximum pore diameter not larger than 30 microns and a moisture permeability not lower than 100 g/m.sup.2 /24 hr.
    Type: Grant
    Filed: August 17, 1989
    Date of Patent: July 3, 1990
    Assignees: Mitsui Toatsu Chemicals, Inc., Ferric Inc.
    Inventors: Shoichi Tsuji, Hazime Musika, Michiyasu Itoh, Junko Hayakawa, Eiji Miyashita
  • Patent number: 4219730
    Abstract: A charged-particle energy analyzer having means for irradiating a sample with a primary electron beam, deflecting electrode means which focus charged particle flux emitted from the sample onto a center axis of the primary electron beam or onto an identical circumference with its center on the axis, a slit disposed at the focus point of the charged particles, an energy analyzer whose object point lies at the focus point, a detector for detecting the charged particles analyzed by the energy analyzer, and charged particle flux deflecting means provided between the sample and the detector, for shielding by one part of the charged particle flux focused in a true circular form, to thereby make it possible not only to set a wide accepted solid angle for signals but also to get an information as to the concave or convex surface condition of the sample at the measured portion.
    Type: Grant
    Filed: August 25, 1978
    Date of Patent: August 26, 1980
    Assignee: Hitachi, Ltd.
    Inventors: Isao Ishikawa, Yoshitaka Goto, Michiyasu Itoh
  • Patent number: 4135088
    Abstract: A charged-particle beam correction arrangement for a charged-particle analyzer having deflecting electrodes which focus charged particles emitted from a sample onto a center axis, an extension thereof, or onto an identical circumference with its center on the axis, a slit which is disposed at the focus point, and an energy analyzer whose object point lies at the focus point. The charged-particle beam correction arrangement is disposed axially symmetrically in the vicinity of the path of the charged particles between the sample and the slit to correct a deformation in the focusing of the charged-particle beam. BACKGROUND OF THE INVENTIONThe present invention relates to a charged-particle analyzer.For the analysis of a feeble electron beam of low energy, such as Auger electrons and photoelectrons in the surface analysis, it is important to efficiently utilize the electrons emitted from a sample.
    Type: Grant
    Filed: June 28, 1977
    Date of Patent: January 16, 1979
    Assignee: Hitachi, Ltd.
    Inventors: Isao Ishikawa, Michiyasu Itoh, Katsuhisa Usami
  • Patent number: 4031496
    Abstract: A variable inductor wherein two closed magnetic circuits each having a predetermined gap in one place are constructed of a movable magnetic core and a fixed magnetic core. When the movable magnetic core is moved, the opposite area between both the magnetic cores in one of the closed magnetic circuits increases, while the opposite area between both the magnetic cores in the other closed magnetic circuit decreases. Thus, the inductances of coils wound around parts of the respective closed magnetic circuits vary complementarily.
    Type: Grant
    Filed: July 3, 1974
    Date of Patent: June 21, 1977
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Fujiwara, Yukio Ichinose, Satoshi Taniguchi, Tsutomu Kobayashi, Kazuo Ichino, Michiyasu Itoh, Yasutaro Uesaka, Fumiyuki Inose, Sadayasu Ueno
  • Patent number: 4005396
    Abstract: A digital displacement sensor includes a plurality of zigzag coils provided with projecting or convex portions having different pitches and arranged on the surface of a flat plate. A magnetic head consisting of a magnetic body and a coil is wound around part of the magnetic body, the magnetic head being supported so as to be moved, while maintaining a given gap from the surface of the flat plate, whereby a digital signal corresponding to the displacement of the magnetic head is sensed by means of a plurality of zigzag coils.
    Type: Grant
    Filed: November 18, 1974
    Date of Patent: January 25, 1977
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Fujiwara, Yukio Ichinose, Kazuo Ichino, Isamu Orita, Yasutaro Uesaka, Michiyasu Itoh, Hisashi Thuruoka