Patents by Inventor Miguel Angel Pleitez Rafael

Miguel Angel Pleitez Rafael has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11639894
    Abstract: A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Grant
    Filed: January 4, 2021
    Date of Patent: May 2, 2023
    Assignee: DiaMonTech AG
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Patent number: 11193886
    Abstract: The invention relates to a device (1) and a corresponding method for mid-infrared microscopy and/or analysis, the device (1) comprising at least one radiation unit (10) configured to generate radiation (11) of time-varying intensity, the radiation (11) comprising one or more wavelengths in the mid-infrared spectral range, at least one refractive and/or reflective optical unit (12) which is configured to focus and/or direct the radiation (11) to at least one region or point of interest (20) located on and/or with-in an object (2), at least one detection unit (18) configured to detect ultrasound waves (17) emitted by the object (2) at the at least one region or point of interest (20) in response to an interaction of the radiation (11) with the object (2) and to generate according detection signals, and an evaluation unit (25) configured to derive infor-mation regarding at least one property of the object (2) from the detection signals and/or to generate a spatial and/or spatio-temporal distribution of the detec
    Type: Grant
    Filed: January 30, 2019
    Date of Patent: December 7, 2021
    Inventors: Vasilis Ntziachristos, Miguel Angel Pleitez Rafael
  • Publication number: 20210148817
    Abstract: A method and apparatus for analyzing a substance is disclosed. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface (to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Application
    Filed: January 4, 2021
    Publication date: May 20, 2021
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Patent number: 10883933
    Abstract: The invention relates to analyzing a substance. An optical medium is arrange on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: January 5, 2021
    Assignee: DiaMonTech AG
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl
  • Publication number: 20200355604
    Abstract: The invention relates to a device (1) and a corresponding method for mid-infrared microscopy and/or analysis, the device (1) comprising at least one radiation unit (10) configured to generate radiation (11) of time-varying intensity, the radiation (11) comprising one or more wavelengths in the mid-infrared spectral range, at least one refractive and/or reflective optical unit (12) which is configured to focus and/or direct the radiation (11) to at least one region or point of interest (20) located on and/or within an object (2), at least one detection unit (18) configured to detect ultrasound waves (17) emitted by the object (2) at the at least one region or point of interest (20) in response to an interaction of the radiation (11) with the object (2) and to generate according detection signals, and an evaluation unit (25) configured to derive information regarding at least one property of the object (2) from the detection signals and/or to generate a spatial and/or spatio-temporal distribution of the detecti
    Type: Application
    Filed: January 30, 2019
    Publication date: November 12, 2020
    Inventors: Vasilis Ntziachristos, Miguel Angel Pleitez Rafael
  • Publication number: 20170146455
    Abstract: The invention relates to analyzing a substance. An optical medium is arranged on a substance surface with at least one region of the optical medium surface in contact with the substance surface. An excitation light beam is emitted through the contacting region of the medium surface to the substance surface. A measurement light beam is emitted through the optical medium to the contacting region of the medium surface such that the measurement light beam and the excitation light beam overlap on the interface of the optical medium and of the substance surface, on which the measurement light beam is reflected. A deflection of the reflected measurement light beam is detected in dependence on the wavelength of the excitation light beam. The substance is then analyzed based on the detected deflection of the measurement light beam in dependence on the wavelength of the excitation light beam.
    Type: Application
    Filed: June 16, 2015
    Publication date: May 25, 2017
    Inventors: Werner Mäntele, Miguel Angel Pleitez Rafael, Tobias Lieblein, Otto Hertzberg, Alexander Bauer, Hermann Von Lilienfeld-Toal, Arne Küderle, Tabea Pfuhl