Abstract: A power delivery network (PDN) including a battery, a set of regulators for generating supply voltages, and an integrated circuit (IC) including power rails configured to receive the supply voltages. The IC further includes an IC chip having a set of cores. The power rails includes a larger rail configured to provide a full range of currents, and the other smaller power rails each configured to provide lower range of currents. The IC includes multiplexers having first inputs coupled respectively to the smaller rails, second inputs coupled to the larger rail, and outputs coupled to the cores. When the smaller rail is able to supply the current needed by a core, the multiplexer is configured to couple the smaller rail to the core. When the smaller rail cannot supply the current needed by the core, the multiplexer is configured to couple the larger rail to the core.

Abstract: The place and route stage for a hard macro including a plurality of tiles is modified so that some of the tiles are assigned a more robust power-grid tier and so that others ones of the tiles are assigned a less robust power-grid tier.

Abstract: Aspects of an integrated circuit are disclosed. The integrated circuit includes a first circuit configured to be powered by a first voltage source, a second circuit configured to be powered by a second voltage source, a decoupling capacitor, and a controller configured to switch the decoupling capacitor between the first and second voltage source.

Abstract: A power delivery network (PDN) including a battery, a set of regulators for generating supply voltages, and an integrated circuit (IC) including power rails configured to receive the supply voltages. The IC further includes an IC chip having a set of cores. The power rails includes a larger rail configured to provide a full range of currents, and the other smaller power rails each configured to provide lower range of currents. The IC includes multiplexers having first inputs coupled respectively to the smaller rails, second inputs coupled to the larger rail, and outputs coupled to the cores. When the smaller rail is able to supply the current needed by a core, the multiplexer is configured to couple the smaller rail to the core. When the smaller rail cannot supply the current needed by the core, the multiplexer is configured to couple the larger rail to the core.

Abstract: In one embodiment, an apparatus comprises a capacitor and a die. The die comprises a resistor switch coupled between a power line and the capacitor, wherein the resistor switch has an adjustable resistance, and the power line and the capacitor are both external to the die. The die also comprises a circuit configured to receive power from the power line, and a controller configured to open the resistor switch if the power line is powered down.

Abstract: In one embodiment, an apparatus comprises a capacitor and a die. The die comprises a resistor switch coupled between a power line and the capacitor, wherein the resistor switch has an adjustable resistance, and the power line and the capacitor are both external to the die. The die also comprises a circuit configured to receive power from the power line, and a controller configured to open the resistor switch if the power line is powered down.

Abstract: In one embodiment, an apparatus comprises a capacitor and a die. The die comprises a resistor switch coupled between a power line and the capacitor, wherein the resistor switch has an adjustable resistance, and the power line and the capacitor are both external to the die. The die also comprises a circuit configured to receive power from the power line.

Abstract: Aspects of an integrated circuit are disclosed. The integrated circuit includes a first circuit configured to be powered by a first voltage source, a second circuit configured to be powered by a second voltage source, a decoupling capacitor, and a controller configured to switch the decoupling capacitor between the first and second voltage source.

Abstract: In one embodiment, an apparatus comprises a capacitor and a die. The die comprises a resistor switch coupled between a power line and the capacitor, wherein the resistor switch has an adjustable resistance, and the power line and the capacitor are both external to the die. The die also comprises a circuit configured to receive power from the power line.

Abstract: A block power switch may be embedded with electrostatic discharge (ESD) protection circuitry. A transistor portion of the block power switch may be allocated to act as part of ESD protection circuitry and may be combined with an RC clamp to provide ESD protection. Adaptive body biasing (ABB) may be applied to the block power switch to reduce on-chip area and decrease leakage current of the block power switch.

Abstract: A system and method to regulate voltage is disclosed. In a particular embodiment, a voltage regulator includes an error amplifier, a voltage buffer responsive to the error amplifier, and a first transistor responsive to the voltage buffer and coupled to a voltage supply source. A second transistor is coupled to the voltage supply source and further coupled to an output node. A third transistor is coupled to the first transistor and has a gate coupled to a capacitor. The capacitor is coupled to a node between the error amplifier and the voltage buffer.

Abstract: An on-chip sensor measures dynamic power supply noise, such as voltage droop, on a semiconductor chip. In-situ logic is employed, which is sensitive to noise present on the power supply of functional logic of the chip. Exemplary functional logic includes a microprocessor, adder, and/or other functional logic of the chip. The in-situ logic performs some operation, and the amount of time required for performing that operation (i.e., the operational delay) is sensitive to noise present on the power supply. Thus, by evaluating the operational delay of the in-situ logic, the amount of noise present on the power supply can be measured.

Abstract: An on-chip sensor measures dynamic power supply noise, such as voltage droop, on a semiconductor chip. In-situ logic is employed, which is sensitive to noise present on the power supply of functional logic of the chip. Exemplary functional logic includes a microprocessor, adder, and/or other functional logic of the chip. The in-situ logic performs some operation, and the amount of time required for performing that operation (i.e., the operational delay) is sensitive to noise present on the power supply. Thus, by evaluating the operational delay of the in-situ logic, the amount of noise present on the power supply can be measured.

Abstract: A block power switch may be embedded with electrostatic discharge (ESD) protection circuitry. A transistor portion of the block power switch may he allocated to act as part of ESD protection circuitry and may be combined with an RC clamp to provide ESD protection. Adaptive body biasing (ABB) may be applied to the block power switch to reduce on-chip area and decrease leakage current of the block power switch.

Abstract: A system and method to regulate voltage is disclosed. In a particular embodiment, a voltage regulator includes an error amplifier, a voltage buffer responsive to the error amplifier, and a first transistor responsive to the voltage buffer and coupled to a voltage supply source. A second transistor is coupled to the voltage supply source and further coupled to an output node. A third transistor is coupled to the first transistor and has a gate coupled to a capacitor. The capacitor is coupled to a node between the error amplifier and the voltage buffer.

Abstract: An on-chip sensor measures dynamic power supply noise, such as voltage droop, on a semiconductor chip. In-situ logic is employed, which is sensitive to noise present on the power supply of functional logic of the chip. Exemplary functional logic includes a microprocessor, adder, and/or other functional logic of the chip. The in-situ logic performs some operation, and the amount of time required for performing that operation (i.e., the operational delay) is sensitive to noise present on the power supply. Thus, by evaluating the operational delay of the in-situ logic, the amount of noise present on the power supply can be measured.

Abstract: The maximum effective radii of an on-chip decoupling capacitor based on a target impedance (discharge) and charge time are determined. To be effective, an on-chip decoupling capacitor should be placed such that both the power supply and the current load are located inside the appropriate effective radius. If this allocation is not feasible, the current load is partitioned into several circuit blocks, reducing and distributing the localized current demands. The on-chip decoupling capacitors are allocated to each block while satisfying both effective radii criteria.

Abstract: A system-on-chip or other circuit has an on-chip noise-free ground which is added to divert ground noise from the sensitive nodes. An on-chip decoupling capacitor, tuned in resonance with the parasitic inductance of the interconnects, can be provided to add an additional low impedance ground path.