Abstract: A sensor device includes a flexible instrument (20) including a lumen (22). A plurality of shape or strain sensing optical fibers (14, 16, 18) is integrated in the flexible instrument in the lumen and extends over a length of the flexible instrument. The plurality of optical fibers is configured to measure movement relative to one another to sense a change in distance between the plurality of optical fibers to detect a state of a reconfigurable portion (24) of the flexible instrument.

Abstract: A shape sensing system comprises a processor coupled to a memory storage device and a predictive model module stored in the memory storage device and configured to receive shape sensing measurements and predict next shape sensing measurements based upon current state data for a shape sensing enabled device, the predictive model module including a Kalman filter and at least one reference model employed by the Kalman filter. The Kalman filter employs the reference model(s) and the current state data to predict new shape data by weighting the reference model(s) versus the current state data to improve shape data measurements.

Abstract: A sensor device includes a flexible instrument (20) including a lumen (22). A plurality of shape or strain sensing optical fibers (14, 16, 18) is integrated in the flexible instrument in the lumen and extends over a length of the flexible instrument. The plurality of optical fibers is configured to measure movement relative to one another to sense a change in distance between the plurality of optical fibers to detect a state of a reconfigurable portion (24) of the flexible instrument.

Abstract: There is presented an optical frequency domain reflectometry (OFDR) system (100) comprising a first coupling point (15) arranged for splitting radiation into two parts, so that radiation may be emitted into a reference path (16) and a measurement path (17). The system further comprises an optical detection unit (30) capable of obtaining a signal from the combined optical radiation from the reference path and the measurement path via a second coupling point (25). The measurement path (17) comprises a polarization dependent optical path length shifter (PDOPS, PDFS, 10), which may create a first polarization (PI) and a second polarization (P2) for the radiation in the measurement path, where the optical path length is different for the first and second polarizations in the measurement path. This may be advantageous for obtaining an improved optical frequency domain reflectometry (OFDR) system where e.g. the two measurements for input polarizations may be performed in the same scan of a radiation source.

Abstract: A shape sensing system includes a processor (303) coupled to a memory storage device (116) A predictive model module (150) is stored in the memory storage device and is configured to receive shape sensing measurements and predict next shape sensing measurements based upon current state data for a shape sensing enabled device. The predictive model module includes a Kalman filter (326) and a reference model (306). The Kalman filter employs the at least one reference model and the current state data to predict new shape data by weighting the at least one reference model versus the current state data to Improve shape data measurements.

Abstract: The present invention relates to an optical sensing system (1) for determining the position and/or shape of an associated object (O), the system comprises an optical fibers (10) having one or more optical fiber cores (9) with one or more fiber Bragg gratings (FBG, 8) extending along the full length where the position and/or shape is be to determined of said object (O). A reflectometer (REFL, 12) measures strain at a number of sampling points along the optical fiber cores, and a processor (PROC, 14) determines the position and/or shape based on said measured strains from the plurality of optical fiber cores. The fiber Bragg grating(s) (FBG, 8) extends along the full length of said optical fiber cores (9), the fiber core having a spatially modulated reflection (r) along the said full length of the optical fiber core so that the corresponding reflection spectrum is detectable in said wavelength scan.

Abstract: There is presented an optical frequency domain reflectometry (OFDR) system (100) comprising a first coupling point (15) arranged for splitting radiation into two parts, so that radiation may be emitted into a reference path (16) and a measurement path (17). The system further comprises an optical detection unit (30) capable of obtaining a signal from the combined optical radiation from the reference path and the measurement path via a second coupling point (25). The measurement path (17) comprises a polarization dependent optical path length shifter (PDOPS, PDFS, 10), which may create a first polarization (PI) and a second polarization (P2) for the radiation in the measurement path, where the optical path length is different for the first and second polarizations in the measurement path. This may be advantageous for obtaining an improved optical frequency domain reflectometry (OFDR) system where e.g. the two measurements for input polarizations may be performed in the same scan of a radiation source.

Abstract: The present invention relates to an optical sensing system (1) for determining the position and/or shape of an associated object (O), the system comprises an optical fibers (10) having one or more optical fiber cores (9) with one or more fiber Bragg gratings (FBG, 8) extending along the full length where the position and/or shape is be to determined of said object (O). A reflectometer (REFL, 12) measures strain at a number of sampling points along the optical fiber cores, and a processor (PROC, 14) determines the position and/or shape based on said measured strains from the plurality of optical fiber cores. The fiber Bragg grating(s) (FBG, 8) extends along the full length of said optical fiber cores (9), the fiber core having a spatially modulated reflection (r) along the said full length of the optical fiber core so that the corresponding reflection spectrum is detectable in said wavelength scan.