Abstract: The present invention relates to a method of performing a write access phase for a memory device and comprising: transferring a write data from a local input and output line to a bit line to write the data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during asecond period; wherein the first period is longer than the second period.

Abstract: The present invention relates to a method of performing a write access phase for a memory device and comprising: transferring a write data from a local input and output line to a bit line to write the data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period; wherein the first period is longer than the second period.

Abstract: The present invention relates to a method of performing a write access phase for a memory device and comprising: transferring a write data from a local input and output line to a bit line to write the data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period; wherein the first period is longer than the second period.

Abstract: The present invention relates to a method of performing a write access phase for a memory device and comprising: transferring a write data from a local input and output line to a bit line to write the data into a memory cell via the bit line by activating a column switch provided between the bit line and the local input and output line during a first period; and transferring a read data read out from the memory cell to the local input and output line via the bit line by activating the column switch during a second period; wherein the first period is longer than the second period.

Abstract: A method and apparatus for an integrated circuit with programmable memory cells which are arranged between a first and a second conductor for supplying first and second voltage is provided. A control circuit is arranged between the memory cells and the second conductor. The control circuit controls a change time during which at least one of the memory cells is supplied with a changing current from the second supply changing a state of the memory cell. The control circuit senses the state of the memory cell and stops the erasing current when the memory cell is in a changed state. Furthermore an embodiment refers to a data system with a programmable memory and a method of operating an integrated circuit. Another embodiment refers to a method of operating an integrated circuit.

Abstract: A memory chip with a plurality of FB DRAM cells, having a word line coupled to a first FB DRAM cell and a second FB DRAM cell is disclosed. The memory chip further has a first bit line coupled to the first FB DRAM cell, and a first state memory circuit coupled to the first bit line. The memory chip further includes a second bit line coupled to the second FB DRAM cell, and a second state memory circuit coupled to the second bit line. The memory chip further includes a sense amplifier, which can be coupled to the first FB DRAM cell, the second FB DRAM cell, the first state memory circuit or the second state memory circuit.

Abstract: A memory chip with a plurality of FB DRAM cells, having a word line coupled to a first FB DRAM cell and a second FB DRAM cell is disclosed. The memory chip further has a first bit line coupled to the first FB DRAM cell, and a first state memory circuit coupled to the first bit line. The memory chip further includes a second bit line coupled to the second FB DRAM cell, and a second state memory circuit coupled to the second bit line. The memory chip further includes a sense amplifier, which can be coupled to the first FB DRAM cell, the second FB DRAM cell, the first state memory circuit or the second state memory circuit.

Abstract: A method and apparatus for an integrated circuit with programmable memory cells which are arranged between a first and a second conductor for supplying first and second voltage is provided. A control circuit is arranged between the memory cells and the second conductor. The control circuit controls a change time during which at least one of the memory cells is supplied with a changing current from the second supply changing a state of the memory cell. The control circuit senses the state of the memory cell and stops the erasing current when the memory cell is in a changed state. Furthermore an embodiment refers to a data system with a programmable memory and a method of operating an integrated circuit. Another embodiment refers to a method of operating an integrated circuit.