Abstract: In an embodiment, an apparatus includes an input circuit coupled to a first power supply with a first voltage level, a power circuit coupled to a second power supply with a second voltage level, and an output driver. The input circuit may receive an input signal, and generate an inverted signal dependent upon the input signal. The power circuit may generate a power signal in response to first values of the input and the inverted signals, wherein a voltage level of the power signal may be dependent upon the second voltage level. The power circuit may also generate a third voltage level on the power signal in response to second values of the input and the inverted signals. The output driver may generate an output signal dependent upon the input signal. The output signal may transition between the voltage level of the power signal and the ground reference level.

Abstract: In an embodiment, an apparatus includes an input circuit coupled to a first power supply with a first voltage level, a power circuit coupled to a second power supply with a second voltage level, and an output driver. The input circuit may receive an input signal, and generate an inverted signal dependent upon the input signal. The power circuit may generate a power signal in response to first values of the input and the inverted signals, wherein a voltage level of the power signal may be dependent upon the second voltage level. The power circuit may also generate a third voltage level on the power signal in response to second values of the input and the inverted signals. The output driver may generate an output signal dependent upon the input signal. The output signal may transition between the voltage level of the power signal and the ground reference level.

Abstract: A method of testing critical paths in integrated circuits begins by simulating at least one operation of an integrated circuit chip design to produce chip timing data. Next, critical paths of the integrated circuit chip design are identified based on the chip timing data. The method applies functional test signals to simulations of the critical paths and monitors the number of times each of the functional test signals propagate from the beginning to the end of each of the critical paths. This allows the method to identify stress producing test signals as those that propagate along the critical paths more than other test signals. These stress producing test signals are applied to integrated circuit chip hardware manufactured according to the integrated circuit chip design to stress test the hardware.

Abstract: A system and method of shifting a clock frequency of an integrated circuit device from a first frequency to a second frequency, including alternating between the first frequency and the second frequency according to a dithering pattern, the alternating occurring for a predetermined number of cycles; and setting the clock frequency to the second frequency after the predetermined number of cycles.

Abstract: A method and circuit for adjusting the read margin of a self-timed memory array. The electronic circuit, including: a memory cell array including a sense amplifier self-timed decode circuit adapted to set a base read time delay of the memory cell array; and a read delay adjustment circuit coupled to the memory cell array, the read delay adjustment circuit adapted to adjust the base read time delay of the memory array based on an operating frequency of the memory cell array.

Abstract: In a method and apparatus for result forwarding, a source operand compare circuit for a reservation station for a superscalar processor having a plurality of execution units, includes a source identifier for identifying an execution unit that will produce a needed result. The source identifier is included with a rename tag associated with a respective source operand. A multiplexor controlled by the source identifier directs the result of an execution unit to a comparator. The comparator compares the rename tag with a specific reservation station identity. As a result of this comparison, the needed data result is supplied to the respective source operand.

Abstract: A chip can be provide with circuits to electrically read, blow and latch fuses. The circuit allows use of existing I/O pads used for other functions on a chip to drastically reduce the number of I/O required to blow fuses. The circuits also share critical high current carrying lines with no impact on fuse functionality and device reliability. By offering of complex fuse operations such as electrical override, even after they had been blown, essential for product screening and product diagnostics. The circuit provides a fuse blow circuit fed by a fuse sense circuit and fuse latch circuit. Stored addresses in an address buffer addresses the fuses with two sets of inputs: one providing electrical override and/or fuse blow information; and the second one, normal fuse status. Fuse integrity before and after blow is maximized with a dual voltage source drive and low current sensing.