Abstract: A reflection phase microscope is disclosed. The reflection phase microscope includes: a light source unit irradiating light; a polarization beam splitter splitting the light irradiated from the light source unit into a sample beam and a reference beam; a sample unit reflecting the sample beam toward the polarization beam splitter; a reference mirror reflecting the reference beam toward the polarization beam splitter; a scanning mirror adjusting the angle of incidence of the light from the light source unit on the polarization beam splitter such that the angle of incidence of the sample beam on the sample unit and the angle of incidence of the reference beam on the reference mirror are adjusted; a diffraction grating diffracting the sample beam reflected by the sample unit and the reference beam reflected by the reference mirror; and an image acquisition unit receiving the beams diffracted by the diffraction grating.

Abstract: A reflection phase microscope is disclosed. The reflection phase microscope includes: a light source unit irradiating light; a polarization beam splitter splitting the light irradiated from the light source unit into a sample beam and a reference beam; a sample unit reflecting the sample beam toward the polarization beam splitter; a reference mirror reflecting the reference beam toward the polarization beam splitter; a scanning mirror adjusting the angle of incidence of the light from the light source unit on the polarization beam splitter such that the angle of incidence of the sample beam on the sample unit and the angle of incidence of the reference beam on the reference mirror are adjusted; a diffraction grating diffracting the sample beam reflected by the sample unit and the reference beam reflected by the reference mirror; and an image acquisition unit receiving the beams diffracted by the diffraction grating.