Patents by Inventor Ming-Dai Lei

Ming-Dai Lei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6955984
    Abstract: Methods and apparatus for forming a semiconductor structure comprising a first layer on top of a substrate wherein the first layer defines conductive regions such as copper interconnect lines and non-conductive regions such as dielectric materials. The conductive regions are covered by a second layer of a material different than the first layer such as for example nickel and then the structure is heat treated such that the interconnect lines and second metal, such as a copper interconnect line and a nickel second layer, interact with each other to form an alloy layer. The alloy layer has superior qualities for adhering to both the copper interconnect lines and a subsequently deposited dielectric material.
    Type: Grant
    Filed: May 16, 2003
    Date of Patent: October 18, 2005
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Wen-Kai Wan, Yih-Hsiung Lin, Ming-Dai Lei, Baw-Ching Perng, Cheng-Chung Lin, Chia-Hui Lin, Ai-Sen Liu