Patents by Inventor Ming-Tang Hsu

Ming-Tang Hsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11017259
    Abstract: An optical inspection method for an optical inspection device comprising an optical lens is provided according to an embodiment of the disclosure. The optical inspection method includes: obtaining a first image of an object by the optical lens; performing an edge detection on the first image to obtain a second image comprising an edge pattern; and performing a defect inspection operation on the second image based on a neural network architecture to inspect a defect pattern in the second image. In addition, an optical inspection device and an optical inspection system are provided according to embodiments of the disclosure.
    Type: Grant
    Filed: June 27, 2019
    Date of Patent: May 25, 2021
    Assignee: UTECHZONE CO., LTD.
    Inventors: Arulmurugan Ambikapathi, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
  • Patent number: 10991088
    Abstract: A defect inspection system, connected to an automatic visual inspection device, is provided, including the followings. A re-inspection server (VRS) receives a defect image and a defect location. A training terminal stores trained modules. A classification terminal receives the defect image and the defect location, reads a target trained module corresponding to the defect image, classifies the defect image according to the target trained module to obtain a labeled defect image, and sends the labeled defect image to the VRS. A re-inspection terminal receives the labeled defect image from the VRS, and sends a verified operation corresponding to the labeled defect image to the VRS. A labeling re-inspection terminal receives the verified operation and the labeled defect image, and a labeling result corresponding to the labeled defect image. The VRS sends the labeling result and the labeled defect image to the training terminal to train a corresponding training module.
    Type: Grant
    Filed: June 26, 2019
    Date of Patent: April 27, 2021
    Assignee: UTECHZONE CO., LTD.
    Inventors: Arulmurugan Ambikapathi, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
  • Patent number: 10964004
    Abstract: The present invention is an automated optical inspection method using deep learning, comprising the steps of: providing a plurality of paired image combinations, wherein each said paired image combination includes at least one defect-free image and at least one defect-containing image corresponding to the defect-free image; providing a convolutional neural network to start a training mode of the convolutional neural network; inputting the plurality of paired image combinations into the convolutional neural network, and adjusting a weight of at least one fully connected layer of the convolutional neural network through backpropagation to complete the training mode of the convolutional neural network; and performing an optical inspection process using the trained convolutional neural network.
    Type: Grant
    Filed: December 14, 2018
    Date of Patent: March 30, 2021
    Assignee: UTECHZONE CO., LTD.
    Inventors: Chih-Heng Fang, Chia-Liang Lu, Ming-Tang Hsu, Arulmurugan Ambikapathi, Chien-Chung Lin
  • Publication number: 20200005070
    Abstract: An optical inspection method for an optical inspection device comprising an optical lens is provided according to an embodiment of the disclosure. The optical inspection method includes: obtaining a first image of an object by the optical lens; performing an edge detection on the first image to obtain a second image comprising an edge pattern; and performing a defect inspection operation on the second image based on a neural network architecture to inspect a defect pattern in the second image. In addition, an optical inspection device and an optical inspection system are provided according to embodiments of the disclosure.
    Type: Application
    Filed: June 27, 2019
    Publication date: January 2, 2020
    Applicant: UTECHZONE CO., LTD.
    Inventors: Arulmurugan Ambikapathi, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
  • Publication number: 20200005449
    Abstract: A defect inspection system, connected to an automatic visual inspection device, is provided, including the followings. A re-inspection server (VRS) receives a defect image and a defect location. A training terminal stores trained modules. A classification terminal receives the defect image and the defect location, reads a target trained module corresponding to the defect image, classifies the defect image according to the target trained module to obtain a labeled defect image, and sends the labeled defect image to the VRS. A re-inspection terminal receives the labeled defect image from the VRS, and sends a verified operation corresponding to the labeled defect image to the VRS. A labeling re-inspection terminal receives the verified operation and the labeled defect image, and a labeling result corresponding to the labeled defect image. The VRS sends the labeling result and the labeled defect image to the training terminal to train a corresponding training module.
    Type: Application
    Filed: June 26, 2019
    Publication date: January 2, 2020
    Applicant: UTECHZONE CO., LTD.
    Inventors: ARULMURUGAN AMBIKAPATHI, Ming-Tang Hsu, Chia-Liang Lu, Chih-Heng Fang
  • Publication number: 20190197679
    Abstract: The present invention is an automated optical inspection method using deep learning, comprising the steps of: providing a plurality of paired image combinations, wherein each said paired image combination includes at least one defect-free image and at least one defect-containing image corresponding to the defect-free image; providing a convolutional neural network to start a training mode of the convolutional neural network; inputting the plurality of paired image combinations into the convolutional neural network, and adjusting a weight of at least one fully connected layer of the convolutional neural network through backpropagation to complete the training mode of the convolutional neural network; and performing an optical inspection process using the trained convolutional neural network.
    Type: Application
    Filed: December 14, 2018
    Publication date: June 27, 2019
    Inventors: Chih-Heng FANG, Chia-Liang LU, Ming-Tang HSU, Arulmurugan AMBIKAPATHI, Chien-Chung LIN
  • Patent number: 6427862
    Abstract: A self-opening can includes a container, and a rim member which has an outer peripheral portion sealingly joined to an edge of the container and an inner peripheral portion extending inwardly of the outer peripheral portion and confining an opening. The inner peripheral portion has a groove which extends around the opening. A filler of non-metallic plastic material fills and is exposed from the groove. A cover panel closes the opening and extends to the inner peripheral portion of the rim member. The cover panel has a layer of non-metallic plastic material which is connected sealingly to the filler.
    Type: Grant
    Filed: November 7, 2000
    Date of Patent: August 6, 2002
    Inventor: Ming-Tang Hsu