Patents by Inventor Minoru Ishima

Minoru Ishima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Weight balance method of surgical microscope and mechanism thereof
    Patent number: 10830979
    Abstract: A weight balance method of a surgical microscope is able to automatically align, in response to a switching operation, a center of gravity G of the surgical microscope 5 with a rotary shaft S. A weight balance of the surgical microscope is easily attained only by slanting the surgical microscope, and therefore, no part of the surgical microscope protrudes upward to interfere with a supporting structure of the surgical microscope.
    Type: Grant
    Filed: June 7, 2018
    Date of Patent: November 10, 2020
    Assignee: MITAKA KOHKI CO., LTD.
    Inventor: Minoru Ishima
  • WEIGHT BALANCE METHOD OF SURGICAL MICROSCOPE AND MECHANISM THEREOF
    Publication number: 20190377149
    Abstract: A weight balance method of a surgical microscope is able to automatically align, in response to a switching operation, a center of gravity G of the surgical microscope 5 with a rotary shaft S. A weight balance of the surgical microscope is easily attained only by slanting the surgical microscope, and therefore, no part of the surgical microscope protrudes upward to interfere with a supporting structure of the surgical microscope.
    Type: Application
    Filed: June 7, 2018
    Publication date: December 12, 2019
    Applicant: MITAKA KOHKI CO., LTD.
    Inventor: Minoru ISHIMA
  • Noncontact surface shape measuring method and apparatus thereof
    Patent number: 8570532
    Abstract: Even if a return beam from a work to be measured does not agree with the center of a two-piece sensor, a correction value is calculated according to a voltage difference between two sensors of the two-piece sensor if the voltage difference is within a neighborhood range. The correction value is added to an actual position of an objective lens in an up-down direction, to calculate a movement amount of the objective lens up to a focused state (a state in which the return beam agrees with the center of the two-piece sensor).
    Type: Grant
    Filed: January 28, 2010
    Date of Patent: October 29, 2013
    Assignee: Mitaka Kohki Co., Ltd.
    Inventors: Katsuhiro Miura, Hajime Hirose, Hideo Kotajima, Takao Tsukamoto, Minoru Ishima
  • NONCONTACT SURFACE SHAPE MEASURING METHOD AND APPARATUS THEREOF
    Publication number: 20110279826
    Abstract: Even if a return beam from a work to be measured does not agree with the center of a two-piece sensor, a correction value is calculated according to a voltage difference between two sensors of the two-piece sensor if the voltage difference is within a neighborhood range. The correction value is added to an actual position of an objective lens in an up-down direction, to calculate a movement amount of the objective lens up to a focused state (a state in which the return beam agrees with the center of the two-piece sensor).
    Type: Application
    Filed: January 28, 2010
    Publication date: November 17, 2011
    Applicant: MITAKA KOHKI CO., LTD.
    Inventors: Katsuhiro Miura, Hajime Hirose, Hideo Kotajima, Takao Tsukamoto, Minoru Ishima