Patents by Inventor Mitsuru Oonuma

Mitsuru Oonuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electron microscope
    Patent number: D625749
    Type: Grant
    Filed: June 30, 2009
    Date of Patent: October 19, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Electron microscope
    Patent number: D626579
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: November 2, 2010
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Sample buffer unit for clinical analyzer
    Patent number: D631975
    Type: Grant
    Filed: January 27, 2010
    Date of Patent: February 1, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Yoshimitsu Takagi, Takeshi Shibuya
  • Sampler unit for clinical analyzer
    Patent number: D631976
    Type: Grant
    Filed: January 27, 2010
    Date of Patent: February 1, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Yoshimitsu Takagi, Takeshi Shibuya
  • Electron microscope
    Patent number: D632323
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: February 8, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Electron microscope
    Patent number: D633537
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: March 1, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Electron microscope
    Patent number: D633538
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: March 1, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Portion of an electron microscope
    Patent number: D635167
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: March 29, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Portion of an electron microscope
    Patent number: D635168
    Type: Grant
    Filed: March 2, 2010
    Date of Patent: March 29, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masahiko Ajima, Tomohisa Ohtaki
  • Electron microscope
    Patent number: D636005
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: April 12, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Yoshifumi Taniguchi, Isao Nagaoki, Hiroshi Aoyagi
  • Semiconductor testing machine
    Patent number: D637098
    Type: Grant
    Filed: April 26, 2010
    Date of Patent: May 3, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kazuhiko Nishiyama, Hiroyuki Suzuki, Yasuhiko Nara
  • Controller for an electron microscope
    Patent number: D637638
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: May 10, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Noda, Mitsuru Oonuma, Akira Omachi, Masahiro Nemoto, Kiyoshi Sasagawa
  • ISE analytical unit for clinical analyzer
    Patent number: D637730
    Type: Grant
    Filed: January 27, 2010
    Date of Patent: May 10, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Hitoshi Tokieda, Yoshimitsu Takagi, Takeshi Shibuya
  • Controller for an electron microscope
    Patent number: D638045
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: May 17, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Noda, Mitsuru Oonuma, Akira Omachi, Masahiro Nemoto, Kiyoshi Sasagawa
  • Electron microscope
    Patent number: D638046
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: May 17, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Noda, Mitsuru Oonuma, Akira Omachi, Masahiro Nemoto, Kiyoshi Sasagawa
  • Molecular testing machine
    Patent number: D638952
    Type: Grant
    Filed: July 15, 2010
    Date of Patent: May 31, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Masato Ishizawa, Yoshiyuki Shoji
  • Spectrophotometer
    Patent number: D640581
    Type: Grant
    Filed: June 9, 2010
    Date of Patent: June 28, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Yoko Sato, Akira Omachi, Mitsuru Oonuma, Kouji Yamamoto, Takaya Sato
  • Handles of module for liquid chromatograph analyzer
    Patent number: D643130
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: August 9, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Controller for liquid chromatograph analyzer
    Patent number: D643936
    Type: Grant
    Filed: January 14, 2011
    Date of Patent: August 23, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Akira Omachi, Kantaro Maruoka, Shoji Tomida, Tomohiro Shoji
  • Electron microscope
    Patent number: D644258
    Type: Grant
    Filed: July 29, 2010
    Date of Patent: August 30, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Hiroyuki Noda, Mitsuru Oonuma, Akira Omachi, Masahiro Nemoto, Kiyoshi Sasagawa