Patents by Inventor Mohamed B. Slima

Mohamed B. Slima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7084974
    Abstract: An apparatus and method for in situ spectral measurement is disclosed. The apparatus uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: August 1, 2006
    Assignee: Measurement Microsystems A-Z, Inc.
    Inventors: Andrzej Barwicz, Roman Z. Morawski, Mohamed B. Slima
  • Patent number: 6002479
    Abstract: An apparatus and method for in situ spectral measurement is disclosed. The apparatus uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data.
    Type: Grant
    Filed: May 19, 1998
    Date of Patent: December 14, 1999
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Andrzej Barwicz, Roman Z. Morawski, Mohamed B. Slima
  • Patent number: 5991023
    Abstract: A method for spectral measurement is disclosed. The method uses a low-resolution grating to disperse light and thereby image a spectrum thereof. The imaged spectrum is converted into a digital electrical signal and is processed in order to enhance the spectral information. The resulting spectral information is analogous to that captured using a higher resolution spectral imager with optical processing of the spectral data. The method is equally applicable to enhancing resolution of spectra captured using high resolution spectral imaging devices.
    Type: Grant
    Filed: May 19, 1998
    Date of Patent: November 23, 1999
    Assignee: Measurement Microsystems A-Z Inc.
    Inventors: Roman Z. Morawski, Andrzej Barwicz, Mohamed B. Slima, Andrzej Miekina