Abstract: A method for measuring a distributed physical value of an optical device under test (DUT), includes the steps of: launching into the DUT a probe signal that includes a plurality of optical pulses at at least one test wavelength, and receiving at least one optical signal backscattered by the DUT, wherein the optical pulses are obtained with at least the following steps: generating a first time sequence of first pulses that corresponds to a word of a first code, the first time sequence lasting not shorter than a time of flight and being formed by a number of time slots that is equal to the number of bits of the word of the first code; generating a second time sequence of second pulses that corresponds to a word of a second code; and amplitude modulating the second time sequence with the first time sequence.

Abstract: A method for measuring a distributed physical value of an optical device under test (DUT), includes the steps of: launching into the DUT a probe signal that includes a plurality of optical pulses at at least one test wavelength, and receiving at least one optical signal backscattered by the DUT, wherein the optical pulses are obtained with at least the following steps: generating a first time sequence of first pulses that corresponds to a word of a first code, the first time sequence lasting not shorter than a time of flight and being formed by a number of time slots that is equal to the number of bits of the word of the first code; generating a second time sequence of second pulses that corresponds to a word of a second code; and amplitude modulating the second time sequence with the first time sequence.