Abstract: Methods, systems, and apparatus for an improved antenna, specifically a T-match bowtie antenna system, including a t-match antenna having a first side and a second side, wherein the antenna is dual loaded; a first load soldered to the first side of the antenna; a second load soldered to the second side of the antenna; and a gap defined by the space between the first load and the second load, wherein the gap is approximately one millimeter; where the antenna is capable of providing quasi-32-QAM encoding.

Abstract: A switched-slot sensor for use in a sensor array for microwave and/or millimeter wave imaging. The locations of a plurality of sensors in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the sensors has an out-of-plane transmission line and outputs a signal representative of the measured field and the location of the sensor. A processor decodes the signals and generates an image of the object.

Abstract: A sensor array having a plurality of modulated slots for microwave and/or millimeter wave imaging. The locations of the slots in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the slots outputs a signal representative of the measured field and the location of the slot. A processor decodes the signals and generates an image of the object.

Abstract: A sensor array having a plurality of modulated slots for microwave and/or millimeter wave imaging. The locations of the slots in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the slots outputs a signal representative of the measured field and the location of the slot. A processor decodes the signals and generates an image of the object.

Abstract: An apparatus for inspecting a sample for defects includes a signal generator for generating a signal and a device for splitting the signal into two separate signals which have substantially equal phase and magnitude. A sensor radiates the two signals on the sample and receives the two signals reflected from the sample. A device is provided for determining a difference between the two signals reflected from the sample without unwanted influence of variations of distance between the sensor and sample, and reflections from nearby sample edges and boundaries. A defect is determined to exist when a difference is found between the two reflected signals.