Patents by Inventor Mohammed Ouali
Mohammed Ouali has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8219940Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: GrantFiled: July 6, 2005Date of Patent: July 10, 2012Assignee: Semiconductor Insights Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Patent number: 7886258Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: GrantFiled: June 15, 2010Date of Patent: February 8, 2011Assignee: Semiconductor Insights, Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Publication number: 20100257501Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: ApplicationFiled: June 15, 2010Publication date: October 7, 2010Applicant: Semiconductor Insights Inc.Inventors: Mohammed OUALI, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Patent number: 7765517Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: GrantFiled: October 24, 2007Date of Patent: July 27, 2010Assignee: Semiconductor Insights Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Publication number: 20080059920Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: ApplicationFiled: October 24, 2007Publication date: March 6, 2008Applicant: Semiconductor Insights Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Patent number: 7278121Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.Type: GrantFiled: August 23, 2004Date of Patent: October 2, 2007Assignee: Semiconductor Insights Inc.Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale McIntyre, Mohammed Ouali, Vyacheslav Zavadsky
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Publication number: 20070011628Abstract: A method and apparatus to reduce occurrences of electrically non-functional elements, known as dummy features, from a source data structure is described. The source data structure may be image data, a vector based data structure or some other data format. Dummy features in the source data structure are detected and then deleted. Dummy features may be detected by selecting a representative dummy feature, using it as a reference pattern or polygon and comparing it to features in the source data structure. The step of comparing the selected reference to the comprises selecting a cut-off correlation threshold value, and computing the correlation coefficients between the reference and the feature. Features are selectively removed based on a comparison between their correlation coefficients and the selected cut-off correlation threshold value. This threshold value may require updating to remove all dummy features in the source data structure.Type: ApplicationFiled: July 6, 2005Publication date: January 11, 2007Applicant: Semiconductor Insights Inc.Inventors: Mohammed Ouali, Jason Abt, Edward Keyes, Vyacheslav Zavadsky
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Publication number: 20060041849Abstract: The method and apparatus in accordance with the present invention reduces the data size of a layout data structure by reducing the amount of electrically redundant interconnects within a bank of interconnects. Electrically redundant interconnects are the repetitive interconnects within a bank of interconnects which do not contribute to the understanding of the IC. Therefore, a number of these interconnects may be deleted from the banks in the layout data structure, provided that enough interconnects remain to maintain the electrical connectivity and the visual representation of the bank.Type: ApplicationFiled: August 23, 2004Publication date: February 23, 2006Applicant: Semiconductor Insights Inc.Inventors: Elmehdi Aitnouri, Edward Keyes, Stephen Begg, Val Gont, Dale Mclntyre, Mohammed Ouali, Vyacheslav Zavadsky