Patents by Inventor Morgan Dempsey

Morgan Dempsey has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7562264
    Abstract: A method and apparatus for detecting soft errors in a storage subsystem is provided. Write data generated for a write operation in a first controller is concurrently generated in a second controller and written to a storage device by the first controller. Soft errors are detected by comparing the two sets of write data by comparing respective checksums or the write data read back from the storage device by the second controller.
    Type: Grant
    Filed: September 6, 2006
    Date of Patent: July 14, 2009
    Assignee: Intel Corporation
    Inventors: Matthew B. Tangvald, Morgan Dempsey, Scott T. Peiffer
  • Publication number: 20090096664
    Abstract: An apparatus for providing stabilization during a tracking operation may include a processing element configured to define an inertial pointing vector relative to a point of interest, receive tracking information related to the point of interest, and determine compensation of the inertial pointing vector based on the received tracking information and motion of a platform conducting the tracking operation.
    Type: Application
    Filed: October 10, 2007
    Publication date: April 16, 2009
    Inventors: Carlton William Carroll, Daniel Morgan Dempsey
  • Publication number: 20080126885
    Abstract: A method and apparatus for detecting soft errors in a storage subsystem is provided. Write data generated for a write operation in a first controller is concurrently generated in a second controller and written to a storage device by the first controller. Soft errors are detected by comparing the two sets of write data by comparing respective checksums or the write data read back from the storage device by the second controller.
    Type: Application
    Filed: September 6, 2006
    Publication date: May 29, 2008
    Inventors: Matthew B. Tangvald, Morgan Dempsey, Scott T. Peiffer
  • Publication number: 20070165477
    Abstract: According to embodiments of the present invention, an integrated circuit such as a processor includes a counter to count an actual number of unreliable storage locations in the processor cache, at least one register to store an acceptable number of unreliable storage locations for the cache, a detector to measure a thermal environment of the processor, and circuitry to raise an operating voltage of the processor if the actual number of unreliable storage locations exceeds the acceptable number of unreliable storage locations, and if the thermal environment is acceptable.
    Type: Application
    Filed: December 30, 2005
    Publication date: July 19, 2007
    Inventor: Morgan Dempsey
  • Publication number: 20070168836
    Abstract: A method and apparatus for repairing cache memories/arrays is described herein. A cache includes a plurality of lines and logically viewable in columns. A repair cache coupled to the cache includes a repair bit mapped to each logically viewable column. A repair module determines a bad bit to be repaired within a column based on any individual or combination of factors, such as the number of errors per line of the cache, the number of errors correctable per line of the cache due to error correction code (ECC), the failure rate of bits, or other considerations. The bad bit is transparently repaired by the repair bit mapped to the column including the bad bit, upon an access to a cache line including the bad bit.
    Type: Application
    Filed: December 30, 2005
    Publication date: July 19, 2007
    Inventors: Morgan Dempsey, Jose Maiz