Abstract: An endoscope includes a pulley provided in an operation portion, having an outer diameter larger than an inner diameter of an endoscope insertion portion, and configured to wind a wire connected to a bending portion; and a wire guard that is arranged to cover a predetermined range of an outer peripheral portion of the pulley, and includes a guide wall arranged to extend within a range of a radius of the pulley from a contact point position at which the wire in contact with the pulley is separated from the pulley in a longitudinal axis direction of the operation portion. The wire guard includes two members each formed in a substantially semicircular plate shape, and coupling parts formed in arc shapes extending from both end portions of the two members and configured to couple the two members.

Abstract: A bending operation mechanism for an endoscope, which is a pulley unit, includes: an up-down bending pulley which is a rotation body; an angle wire which is a bending-portion pulling member having a distal end side connected to a bending portion and a proximal end side that is pulled by the up-down bending pulley; and a spiral spring which is a slack absorption member having a first end connected to the an proximal end of the angle wire and a second end side connected to the up-down bending pulley and configured to pull the angle wire in the direction toward the up-down bending pulley.

Abstract: An insertion apparatus in the invention includes: a multi-lumen tube provided in an insertion portion and formed in a bendable manner, the insertion portion being inserted into a subject, a distal end member arranged so as to cover a distal end of the multi-lumen tube; a braided tube into which the multi-lumen tube is inserted, a distal end edge portion of the braided tube being disposed between the distal end member and the multi-lumen tube; and a wire configured to bend the multi-lumen tube by traction, in which the braided tube includes a gap through which the wire passes from an outside of the braided tube to an inside of the braided tube.

Abstract: An endoscope includes an image pickup module having an optical axis that defines a visual field direction and provided with an electric contact, a cable that is disposed on a proximal end side of the image pickup module and transfers an image pickup signal generated by the image pickup module, a channel provided beside the image pickup module, and a movable board electrically connecting the electric contact and the cable to transfer the image pickup signal and including a movable portion capable of forming a curved surface that is freely displaceable in an optical axis direction. The movable portion of the movable board is arranged at a position where a distance between the curved surface and the channel is longer than a distance between the curved surface and the optical axis.

Abstract: A bending operation mechanism includes a bending operation member configured to bend a bending portion, a wire pulling member configured to rotate along with rotation of the bending operation member, a lock operation member supported to a rotational axis, a cam member having a cam surface and integrally provided with the lock operation member, and a brake member having a cam follower surface capable of sliding relative to the cam surface. The cam member moves along with rotation of the lock operation member. The brake member moves in a direction in which a contact surface contacts a circumference of the wire pulling member as the cam follower surface slides on the cam surface in accordance with movement of the cam member.

Abstract: A Cu—Ti based copper alloy sheet material contains, in mass %, from 2.0 to 5.0% of Ti, from 0 to 1.5% Ni, from 0 to 1.0% Co, from 0 to 0.5% Fe, from 0 to 1.2% Sn, from 0 to 2.0% Zn, from 0 to 1.0% Mg, from 0 to 1.0% Zr, from 0 to 1.0% Al, from 0 to 1.0% Si, from 0 to 0.1% P, from 0 to 0.05% B, from 0 to 1.0% Cr, from 0 to 1.0% Mn, and from 0 to 1.0% V, the balance substantially being Cu. The sheet material has a metallic texture wherein in a cross section perpendicular to a sheet thickness direction, a maximum width of a grain boundary reaction type precipitate is not more than 500 nm, and a density of a granular precipitate having a diameter of 100 nm or more is not more than 105 number/mm2.

Abstract: A Cu—Ti based copper alloy sheet material contains, in mass %, from 2.0 to 5.0% of Ti, from 0 to 1.5% Ni, from 0 to 1.0% Co, from 0 to 0.5% Fe, from 0 to 1.2% Sn, from 0 to 2.0% Zn, from 0 to 1.0% Mg, from 0 to 1.0% Zr, from 0 to 1.0% Al, from 0 to 1.0% Si, from 0 to 0.1% P, from 0 to 0.05% B, from 0 to 1.0% Cr, from 0 to 1.0% Mn, and from 0 to 1.0% V, the balance substantially being Cu. The sheet material has a metallic texture wherein in a cross section perpendicular to a sheet thickness direction, a maximum width of a grain boundary reaction type precipitate is not more than 500 nm, and a density of a granular precipitate having a diameter of 100 nm or more is not more than 105 number/mm2.

Abstract: There is provided a conductive material comprising a base material made up of a Cu strip, a Cu—Sn alloy covering layer formed over a surface of the base material, containing Cu in a range of 20 to 70 at. %, and having an average thickness in a range of 0.1 to 3.0 ?m, and an Sn covering layer formed over the Cu—Sn alloy covering layer having an average thickness in a range of 0.2 to 5.0 ?m, disposed in that order, such that portions of the Cu—Sn alloy covering layer are exposed the surface of the Sn covering layer, and a ratio of an exposed area of the Cu—Sn alloy covering layer to the surface of the Sn covering layer is in a range of 3 to 75%.

Abstract: There is provided a conductive material comprising a base material made up of a Cu strip, a Cu—Sn alloy covering layer formed over a surface of the base material, containing Cu in a range of 20 to 70 at. %, and having an average thickness in a range of 0.1 to 3.0 ?m, and an Sn covering layer formed over the Cu—Sn alloy covering layer having an average thickness in a range of 0.2 to 5.0 ?m, disposed in that order, such that portions of the Cu—Sn alloy covering layer are exposed the surface of the Sn covering layer, and a ratio of an exposed area of the Cu—Sn alloy covering layer to the surface of the Sn covering layer is in a range of 3 to 75%. The surface of the conductive material is subjected to a reflow process, and preferably, an arithmetic mean roughness Ra of the surface of the material, in at least one direction, is not less than 0.15 ?m while the arithmetic mean roughness Ra thereof, in all directions, is not more than 3.

Abstract: There is provided a conductive material comprising a base material made up of a Cu strip, a Cu—Sn alloy covering layer formed over a surface of the base material, containing Cu in a range of 20 to 70 at.%, and having an average thickness in a range of 0.1 to 3.0 ?m and an Sn covering layer formed over the Cu—Sn alloy covering layer having an average thickness in a range of 0.2 to 5.0 ?m, disposed in that order, such that portions of the Cu—Sn alloy covering layer are exposed the surface of the Sn covering layer, and a ratio of an exposed area of the Cu—Sn alloy covering layer to the surface of the Sn covering layer is in a range of 3 to 75%.

Abstract: A laser microscope comprises a laser light source which emits a laser light, an objective lens which condenses the laser light from the laser light source onto a specimen, an optical scanning unit which two-dimensionally scans the laser light on the specimen, a beamsplitter which separates light emitted from a condensed position on the specimen of the laser light from the laser light source, the beamsplitter being disposed between the objective lens and the optical scanning unit, an optical fiber in which an incident end is disposed at an optical path separated by the beamsplitter, and to which the light from the specimen is made to be incident, and a spectroscope which is disposed at an exit end of the optical fiber, and to which light from the specimen which is emitted from the exit end is made to be incident.

Abstract: There is provided a conductive material comprising a base material made up of a Cu strip, a Cu—Sn alloy covering layer formed over a surface of the base material, containing Cu in a range of 20 to 70 at.%, and having an average thickness in a range of 0.1 to 3.0 ?m, and an Sn covering layer formed over the Cu—Sn alloy covering layer having an average thickness in a range of 0.2 to 5.0 ?m, disposed in that order, such that portions of the Cu—Sn alloy covering layer are exposed the surface of the Sn covering layer, and a ratio of an exposed area of the Cu—Sn alloy covering layer to the surface of the Sn covering layer is in a range of 3 to 75%. The surface of the conductive material is subjected to a reflow process and preferably, an arithmetic mean roughness Ra of the surface of the material in at least one direction, is not less than 0.15 ?m while the arithmetic mean roughness Ra thereof, in all directions, is not more than 3.

Abstract: A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observation specimen is to be placed. The temperature adjustment element is located in the groove of the specimen stage.

Abstract: A specimen temperature adjusting apparatus includes a specimen stage that the observation specimen is to be placed on and a temperature adjustment element that is attached to the specimen stage. The specimen stage has a groove surrounding a portion where the observation specimen is to be placed. The temperature adjustment element is located in the groove of the specimen stage.

Abstract: A laser microscope includes a pulse laser which generates irradiation light having a pulse string, a laser scanner which irradiates a specimen by scanning the irradiation light on the specimen, a detector which detects emitted light generated from the specimen, a shutter which is inserted in an optical path of the irradiation light, and intercepts and transmits the irradiation light for a time period shorter than a scanning time during which a small region on the specimen is scanned, wherein the detector obtains a light amount for each scanning time, and a controller which controls the shutter to intercept a predetermined number of pulses of the pulse string of the irradiation light for each scanning time.

Abstract: A laser microscope according to the present invention is characterized by comprising a laser light source configured to emit an ultra-short pulse laser beam, a storage unit configured to store at least one of dispersion data and chirp amounts of a plurality of optical members inserted in an optical path, a pulse width adjuster configured to adjust a pulse width of the ultra-short pulse laser beam, and a controller configured to control the pulse width adjuster based on at least one of the dispersion data and the chirp amounts of at least one of a laser wavelength of the laser light source and at least one optical member so that the pulse width is shortened on a sample surface.

Abstract: A laser microscope comprises a laser light source which emits a laser light, an objective lens which condenses the laser light from the laser light source onto a specimen, an optical scanning unit which two-dimensionally scans the laser light on the specimen, a beamsplitter which separates light emitted from a condensed position on the specimen of the laser light from the laser light source, the beamsplitter being disposed between the objective lens and the optical scanning unit, an optical fiber in which an incident end is disposed at an optical path separated by the beamsplitter, and to which the light from the specimen is made to be incident, and a spectroscope which is disposed at an exit end of the optical fiber, and to which light from the specimen which is emitted from the exit end is made to be incident.

Abstract: A laser microscope according to the present invention is characterized by comprising a laser light source configured to emit an ultra-short pulse laser beam, a storage unit configured to store at least one of dispersion data and chirp amounts of a plurality of optical members inserted in an optical path, a pulse width adjuster configured to adjust a pulse width of the ultra-short pulse laser beam, and a controller configured to control the pulse width adjuster based on at least one of the dispersion data and the chirp amounts of at least one of a laser wavelength of the laser light source and at least one optical member so that the pulse width is shortened on a sample surface.

Abstract: A laser microscope according to the present invention is characterized by comprising a laser light source configured to emit an ultra-short pulse laser beam, a storage unit configured to store at least one of dispersion data and chirp amounts of a plurality of optical members inserted in an optical path, a pulse width adjuster configured to adjust a pulse width of the ultra-short pulse laser beam, and a controller configured to control the pulse width adjuster based on at least one of the dispersion data and the chirp amounts of at least one of a laser wavelength of the laser light source and at least one optical member so that the pulse width is shortened on a sample surface.

Abstract: A laser microscope includes a beam scanning mechanism to scan a laser beam. An objective lens condenses the beam, and receives from a specimen the light by a linear and a non-linear phenomenon evoked by condensation of the beam, and a reflect light. A first beam splitter is arranged between the objective lens and the scanning mechanism, and separates the laser beam, the light by the linear phenomenon and the reflected light, from the light by the non-linear phenomenon. A first photodetector detects the light by the non-linear phenomenon. A second beam splitter is arranged between a light source and the scanning mechanism to separate the beam from the light by the linear phenomenon. A second photodetector detects the light passing a pinhole arranged at a position conjugative to the focal point of the objective lens among the light by the linear phenomenon and the reflected light.