Abstract: A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and cause a display unit to display the first image and a range of the map region on the first image.

Abstract: A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

Abstract: An image processing device is configured to: generate a histogram of pixel values of a plurality of pixels contained in an image; set a background pixel value by using a peak value of the generated histogram; set a noise range with respect to the set background pixel value; and replace the pixel values that fall in the set noise range with a single arbitrary pixel value.

Abstract: A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and cause a display unit to display the first image and a range of the map region on the first image.

Abstract: A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

Abstract: An image processing device is configured to: generate a histogram of pixel values of a plurality of pixels contained in an image; set a background pixel value by using a peak value of the generated histogram; set a noise range with respect to the set background pixel value; and replace the pixel values that fall in the set noise range with a single arbitrary pixel value.

Abstract: The invention provides a microscope system including a correction-gain storage portion that calculates a correction gain for performing shading correction of an image related to optical images of a specimen, obtained by a microscope, and stores specimen information indicating features of the specimen and optical information at the time of obtaining the image in association with the correction gain; a correction-gain selecting portion that selects the correction gain for use when performing the shading correction of the image to be corrected; and a correction portion that performs the shading correction of the image to be corrected, on the basis of the selected correction gain, wherein the correction-gain selecting portion selects, on the basis of the specimen information or a result of the shading correction with the plurality of correction gains, the correction gain to be used in the shading correction of the image to be corrected.

Abstract: A microscope system comprises: a stage carrying a sample; an optical system forming an sample image; a driver driving at least the optical system or stage to relatively moves the sample and optical system; an imaging section capturing a reference viewing field image as an image of a predetermined viewing field range of the sample and peripheral viewing field images each being an image of a peripheral viewing field range containing a predetermined region in the predetermined viewing field range and different from the predetermined viewing field range, by the driver moving the relative position of the sample; a correction gain calculator calculating a correction gain of each pixel of the reference viewing field image based on the reference viewing field image and peripheral viewing field image; and a corrector performing shading correction on the reference viewing field image based on the calculated correction gain.

Abstract: In order to properly perform smoothing depending on depth-of-field so as to provide a 3D image with improved display image quality, a microscope system comprises: a microscope device 1 for acquiring a plurality of observation images with different focal points; a 3D image constructing unit 17 for constructing 3D image data based on the observation images; a smoothing strength calculating unit 18 for calculating smoothing strength for smoothing the 3D image data, based on optical information of the microscope device 1; and a smoothing unit 19 for smoothing the 3D image data with the smoothing strength calculated in the smoothing strength calculating unit 18.

Abstract: The invention provides a microscope system including a correction-gain storage portion that calculates a correction gain for performing shading correction of an image related to optical images of a specimen, obtained by a microscope, and stores specimen information indicating features of the specimen and optical information at the time of obtaining the image in association with the correction gain; a correction-gain selecting portion that selects the correction gain for use when performing the shading correction of the image to be corrected; and a correction portion that performs the shading correction of the image to be corrected, on the basis of the selected correction gain, wherein the correction-gain selecting portion selects, on the basis of the specimen information or a result of the shading correction with the plurality of correction gains, the correction gain to be used in the shading correction of the image to be corrected.

Abstract: In order to properly perform smoothing depending on depth-of-field so as to provide a 3D image with improved display image quality, a microscope system comprises: a microscope device 1 for acquiring a plurality of observation images with different focal points; a 3D image constructing unit 17 for constructing 3D image data based on the observation images; a smoothing strength calculating unit 18 for calculating smoothing strength for smoothing the 3D image data, based on optical information of the microscope device 1; and a smoothing unit 19 for smoothing the 3D image data with the smoothing strength calculated in the smoothing strength calculating unit 18.

Abstract: A microscope system comprises: a stage carrying a sample; an optical system forming an sample image; a driver driving at least the optical system or stage to relatively moves the sample and optical system; an imaging section capturing a reference viewing field image as an image of a predetermined viewing field range of the sample and peripheral viewing field images each being an image of a peripheral viewing field range containing a predetermined region in the predetermined viewing field range and different from the predetermined viewing field range, by the driver moving the relative position of the sample; a correction gain calculator calculating a correction gain of each pixel of the reference viewing field image based on the reference viewing field image and peripheral viewing field image; and a corrector performing shading correction on the reference viewing field image based on the calculated correction gain.

Abstract: An image processing device forms an omnifocal image and/or a three-dimensional image based on a group of images captured while moving along a fixed axis. The image processing device includes a detecting unit that detects a shift in a plane vertical to the axis of images in the group of the image; a correcting unit that corrects the shift according to a result detected at the detecting unit; and an image forming unit that forms an omnifocal image and/or a three-dimensional image based on the group of the images including images captured while moving along the fixed axis and/or an image corrected at the correcting unit.

Abstract: A method for operating a blast furnace by inferring the operating conditions in the blast furnace, on the basis of data supplied from sensors set in the blast furnace and also on the basis of the knowledge base formed by experience on the operation of the furnace by a small-scale computer and various processing units provided within the computer. Prior to the inference, the data from the sensors are processed by a large-scale computer and various processing units provided within the large-scale computer. The inference is performed by using certainty factor values, thereby making diagnosis of slip, hanging and channeling.

Abstract: A method for controlling heat conditions in a blast furnace wherein the heat conditions are inferred and judged in comparison of data output from sensor means provided for the blast furnace with knowledge base means formed by accumulated experience on the operation of the blast furnace. The heat conditions are inferred and judged from levels of heat conditions and from levels of transition of heat conditions, wherein data regarding molten metal temperature and those regarding sensors are used. The inference and judgement are carried out by inference engine means included in a small-scale computer.