Abstract: An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.

Abstract: A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.

Abstract: An electromagnetic wave measurement device includes an electromagnetic wave outputter that outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changer changes a relative position of an intersection of an optical path of the electromagnetic wave transmitting through the device under test and the device under test, with respect to the device under test, so that the intersection is at a predetermined relative position due to the refraction of the electromagnetic wave by the device under test. A characteristic value deriver derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector, the characteristic value being associated with the predetermined relative position.

Abstract: A detector detects an electromagnetic wave having a frequency of 0.01 THz?f?100 THz and transmitted through a device under test (DUT). A changer changes a relative position of an intersection of an optical path of the electromagnetic wave and the DUT, with respect to the DUT. A deriver derives a characteristic value of the electromagnetic wave based on a detection result of the detector, while the characteristic value is associated with an assumed relative position, which is the relative position if the electromagnetic wave is not refracted by the DUT. A corrector changes the assumed relative position to an actual relative position, which is the relative position if the refraction of the electromagnetic wave by the DUT is considered. A corrected deriver derives the characteristic value associated with a predetermined relative position based on an output from the corrector.

Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 THz and equal to or less than 100 THz toward a device under test and a container storing at least a part of the device under test.

Abstract: A carrier includes attachment holes to which a catalyst attaches, and non-attachment holes to which the catalyst does not attach. An attachment quantity measurement device includes an electromagnetic wave output device that outputs a terahertz wave toward the carrier, an electromagnetic wave detector that detects the terahertz wave which has transmitted through the carrier, a reference value obtainer that obtains, based on a result detected by the electromagnetic wave detector, any one of an absorption rate, a group delay, and a dispersion of the terahertz wave in the non-attachment holes, and an attachment quantity obtainer that obtains, based on the result detected by the electromagnetic wave detector and the result obtained by the reference value obtainer, a weight or a density of the catalyst present in the attachment holes.

Abstract: An object is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device includes a first photoconductive switch that receives predetermined pulse light from a first laser light source, and outputs terahertz light having the same repetition frequency as the repetition frequency of the predetermined pulse light. The optical measurement device also includes a second photoconductive switch that receives the terahertz light and a sampling light pulse, and outputs a signal corresponding to a power of the terahertz light at a time point when the sampling light pulse is received.

Abstract: The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.

Abstract: According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.

Abstract: A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.

Abstract: The present invention measures a quantity of attachment (such as density) of a material (such as catalyst and promoter) attached to a carrier. A carrier 1 includes attachment holes 12 to which a catalyst 24 attaches, and non-attachment holes 14 to which the catalyst 24 does not attach, where extension directions of the attachment holes 12 and the non-attachment holes 14 are parallel with each other (perpendicular to a first end surface 1a), and are opened on the first end surface 1a and a second end surface 1b. An attachment quantity measurement device includes an electromagnetic wave output device 2 that outputs a terahertz wave at a frequency equal to or more than 0.

Abstract: The present invention precisely measures characteristic values (such as the absorption coefficient) of an electromagnetic wave when a density of a PM in a DPF which collects the PM in an exhaust gas. The DPF receives the exhaust gas, and collects the PM in the exhaust gas. The DPF includes first hole portions which are open at a first end on a side for receiving the exhaust gas, and are closed at a second end on a side opposite to the first end, second hole portions which are closed at the first end and are open at the second end, and third hole portions which are closed at the first end. The first hole portion and the second hole portion are adjacent to each other. The third hole portions are adjacent to each other. The PM in the exhaust gas passing through partition walls which partition the first hole portion and the second hole portion adjacent to each other is collected by the partition walls.

Abstract: A desired spatial resolution upon a measurement can be attained by making an electromagnetic wave including a terahertz wave (frequency thereof is equal to or more than 0.01 [THz], and equal to or less than 100 [THz]) incident to a device under test. An electromagnetic wave measurement device includes an incident lens which makes an electromagnetic wave to be measured having a frequency equal to or more than 0.

Abstract: According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device, an electromagnetic wave detector, a relative position changing unit, a delay period recording unit, a phase deriving unit, a delay-corrected phase deriving unit, a sinogram deriving unit, and an image deriving unit. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test and a container storing at least a part of the device under test. The electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. The relative position changing unit changes a relative position of an intersection at which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test.

Abstract: According to the electromagnetic wave measurement device of the present invention, an electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [THz] and equal to or less than 100 [THz] toward a device under test. An electromagnetic wave detector detects the electromagnetic wave which has transmitted through the device under test. A relative position changing unit changes a relative position of an intersection across which an optical path of the electromagnetic wave transmitting through the device under test and the device under test intersect with respect to the device under test. A characteristic value deriving unit derives a characteristic value of the electromagnetic wave based on a detection result of the electromagnetic wave detector while the characteristic value is associated with an assumed relative position which is the relative position if it is assumed that the electromagnetic wave is not refracted by the device under test.

Abstract: According to the present invention, the CT is carried out based on parameters other than the absorption rate. An electromagnetic wave measurement device includes an electromagnetic wave output device 2 which outputs an electromagnetic wave at a frequency equal to or more than 0.

Abstract: An object of the present invention is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer.

Abstract: A device for measuring ?PMD includes a polarization controller (12) that allows first (second) incident light, in a synthetic incident light to an object to be measured (30), to be in line with a p-polarization (s-polarization) axis in a polarization separator (16). The phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first (second) incident light component in an output from the polarization separator (16) measured by a first (second) measuring unit (20a, 20b) are respectively the phase shift equivalent value and amplitude equivalent value of a first column T11, T21 (second column T12, T22) when the transfer function matrix of the object (30) is a 2×2 matrix to thereby allow a control unit (2) to determine the polarization mode dispersion ?PMD of the object (30).

Abstract: A polarization mode dispersion measuring device reduced in time required to measure polarization mode dispersion ?PMD. A polarization controller (12) allows a first (second) incident light to apply a synthetic incident light to an object to be measured (30) in line with a p-polarization axis (s-polarization axis) in a polarization separator (16). Accordingly, the phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first incident light component (second incident light component) in an output from the polarization separator (16) measured by a first measuring unit (20a) (second measuring unit (20b)) are respectively the phase shift equivalent value and amplitude equivalent value of a first column T11, T21 (second column T12, T22) when the transfer function matrix of the object to be measured (30) is a 2×2 matrix to thereby allow a control unit (2) to determine the polarization mode dispersion r PMD of the object to be measured (30).

Abstract: An apparatus capable of reducing a waveform distortion of outgoing light when light of an optical wavelength in a certain specific narrow range is incident upon optical fiber comprises optical source 10 for supplying the incident light to optical fiber line 110, waveform monitor 42 for measuring a waveform distortion of the transmitted light and adjusting unit 44 for adjusting an output of the incident light so that the measured waveform distortion falls within a predetermined range. By adjusting the output of the incident light, a S/N ration is lowered. Since the noise exists within a relatively wide range of wavelength, the rang of wavelength of the incident light is widened. Therefore, it is possible to reduce the waveform distortion of the outgoing light.