Patents by Inventor Muneo Yoshida
Muneo Yoshida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10514345Abstract: An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence X-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unit 110 for measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit 100) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit 110.Type: GrantFiled: October 14, 2014Date of Patent: December 24, 2019Assignee: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Kazuhiko Omote, Yoshiyasu Ito, Hiroshi Motono, Muneo Yoshida, Hideaki Takahashi
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Patent number: 10473598Abstract: An X-ray thin film inspection device of the present invention includes an X-ray irradiation unit 40 installed on a first rotation arm 32, an X-ray detector 50 installed on a second rotation arm 33, and a fluorescence X-ray detector 60 for detecting fluorescence X-rays generated from an inspection target upon irradiation of X-rays. The X-ray irradiation unit 40 includes an X-ray optical element 43 comprising a confocal mirror for receiving X-rays radiated from an X-ray tube 42, reflects plural focused X-ray beams monochromatized at a specific wavelength and focuses the plural focused X-ray beams to a preset focal point, and a slit mechanism 46 for passing therethrough any number of focused X-ray beams out of the plural focused X-ray beams reflected from the X-ray optical element 43.Type: GrantFiled: October 14, 2014Date of Patent: November 12, 2019Assignee: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Sei Yoshihara, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada, Muneo Yoshida, Hiroshi Motono, Hideaki Takahashi, Akifusa Higuchi, Kazuhiko Omote, Yoshiyasu Ito, Naoki Kawahara, Asao Nakano
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Publication number: 20170299528Abstract: An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence x-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due to irradiation of X-ray, a temperature measuring unit 110 for measuring the temperature corresponding to the temperature of the X-ray thin film inspection device, and a temperature correcting system (central processing unit 100) for correcting an inspection position on the basis of the temperature measured by the temperature measuring unit 110.Type: ApplicationFiled: October 14, 2014Publication date: October 19, 2017Applicant: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Kazuhiko Omote, Yoshiyasu Ito, Hiroshi Motono, Muneo Yoshida, Hideaki Takahashi
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Publication number: 20170234814Abstract: An X-ray thin film inspection device of the present invention includes an X-ray irradiation unit 40 installed on a first rotation arm 32, an X-ray detector 50 installed on a second rotation arm 33, and a fluorescence X-ray detector 60 for detecting fluorescence X-rays generated from an inspection target upon irradiation of X-rays. The X-ray irradiation unit 40 includes an X-ray optical element 43 comprising a confocal mirror for receiving X-rays radiated from an X-ray tube 42, reflects plural focused X-ray beams monochromatized at a specific wavelength and focuses the plural focused X-ray beams to a preset focal point, and a slit mechanism 46 for passing therethrough any number of focused X-ray beams out of the plural focused X-ray beams reflected from the X-ray optical element 43.Type: ApplicationFiled: October 14, 2014Publication date: August 17, 2017Applicant: RIGAKU CORPORATIONInventors: Kiyoshi Ogata, Sei Yoshihara, Takao Kinefuchi, Shiro Umegaki, Shigematsu Asano, Katsutaka Horada, Muneo Yoshida, Hiroshi Motono, Hideaki Takahashi, Akifusa Higuchi, Kazuhiko Omote, Yoshiyasu Ito, Naoki Kawahara, Asao Nakano
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Patent number: 4557816Abstract: A chlor-alkali electrolytic cell with a cation exchange membrane is improved, with respect to eliminating local differences of electrolyte, by providing a duct to facilitate downward flow of electrolyte. The duct of this invention serves, without increase of current leakage, with results comparable to conventional forced circulation.Type: GrantFiled: June 24, 1983Date of Patent: December 10, 1985Assignee: Asahi Kasei Kogyo Kabushiki KaishaInventors: Muneo Yoshida, Yoshitomo Tamura
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Patent number: 4111779Abstract: A bipolar system electrolytic cell having a partition wall made of explosion-bonded titanium plate and iron plate which is electrically connected to anode of titanium substrate at its titanium side and to cathode of iron at its iron side, space is preferably given between anode and the partition wall and also between cathode and the partition wall. An assembly having a number of such unit cells arranged in series is useful for electrolysis of sodium chloride which can be performed under a low voltage per unit cell.Type: GrantFiled: April 26, 1977Date of Patent: September 5, 1978Assignee: Asahi Kasei Kogyo Kabushiki KaishaInventors: Maomi Seko, Shinsaku Ogawa, Nobuo Ajiki, Muneo Yoshida
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Patent number: 4108742Abstract: In an electrolytic cell having cation exchange membrane as diaphragm to partition said cell into cathode and anode chambers, electrolysis of an electrolyte aqueous solution is conducted while generating gas from anode by keeping the inner pressure in cathode chamber higher than that in anode chamber. Some disadvantages caused in the case of electrolyzing an aqueous alkali metal halide solution to form alkali metal hydroxide in cathode chamber are overcome by adjusting the anolyte at pH <3.5. The electrolytic cell preferably employable for the present process is also disclosed.Type: GrantFiled: February 25, 1977Date of Patent: August 22, 1978Assignee: Asahi Kasei Kogyo Kabushiki KaishaInventors: Maomi Seko, Shinsaku Ogawa, Muneo Yoshida
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Patent number: 4105515Abstract: In carrying out electrolysis of alkali halide in an electrolytic cell having anode and cathode chambers separated by a cation exchange membrane by feeding an aqueous alkali halide solution into the anode chamber to produce halogen gas in the anode chamber and caustic alkali and hydrogen gas in the cathode chamber, the electrolytic cell is pressurized at higher than atmospheric pressure to obtain various improved results.Type: GrantFiled: June 29, 1977Date of Patent: August 8, 1978Assignee: Asahi Kasei Kogyo Kabushiki KaishaInventors: Shinsaku Ogawa, Muneo Yoshida