Abstract: In some embodiments, a register file circuit design process includes instructing an automated integrated circuit design program to generate a register file circuit design, including providing a cell circuit design and instructing the automated integrated circuit design program to generate a selection design, a pre-decode design, and a data gating design. The cell circuit design describes a plurality of selection circuits that have a particular arrangement. The selection design describes a plurality of replica circuits that include respective pluralities of selection circuits having the particular arrangement. The pre-decode design describes a pre-decode circuit configured to identify a plurality of entries identified by a portion of a write instruction. The data gating design describes data gating circuits configured, in response to the pre-decode circuit not identifying respective entries, to disable data inputs to respective write selection circuits connected to the respective entries.

Abstract: In some embodiments, a register file circuit design process includes instructing an automated integrated circuit design program to generate a register file circuit design, including providing a cell circuit design and instructing the automated integrated circuit design program to generate a selection design, a pre-decode design, and a data gating design. The cell circuit design describes a plurality of selection circuits that have a particular arrangement. The selection design describes a plurality of replica circuits that include respective pluralities of selection circuits having the particular arrangement. The pre-decode design describes a pre-decode circuit configured to identify a plurality of entries identified by a portion of a write instruction. The data gating design describes data gating circuits configured, in response to the pre-decode circuit not identifying respective entries, to disable data inputs to respective write selection circuits connected to the respective entries.

Abstract: A process utilized in an integrated circuit design methodology may be used to assess and organize individual bits (e.g., flip-flops) within multi-bit clocked storage devices (e.g., multi-bit flip-flops) for use in the integrated circuit design. The process may include assessing timing slacks of the bits, sorting and/or assigning the bits based on the assessed timing slacks, and remapping the multi-bit clocked storage devices using the sorted and/or assigned bits. One or more timing corrections may be applied to the remapped multi-bit clocked storage devices. The timing corrections may include useful clock skewing or resizing (e.g., upsizing or downsizing) of the remapped multi-bit clocked storage devices.

Abstract: A process utilized in an integrated circuit design methodology may be used to assess and organize individual bits (e.g., flip-flops) within multi-bit clocked storage devices (e.g., multi-bit flip-flops) for use in the integrated circuit design. The process may include assessing timing slacks of the bits, sorting and/or assigning the bits based on the assessed timing slacks, and remapping the multi-bit clocked storage devices using the sorted and/or assigned bits. One or more timing corrections may be applied to the remapped multi-bit clocked storage devices. The timing corrections may include useful clock skewing or resizing (e.g., upsizing or downsizing) of the remapped multi-bit clocked storage devices.

Abstract: In an embodiment, a methodology for designing an integrated circuit that attempts to improve power efficiency is provided. The methodology includes simulating the design under one or more power stimuli, where the power stimuli are known to cause high power consumption (e.g. in previous designs of the integrated circuit, the power stimuli may have caused power consumption). A set of nets within the integrated circuit may be identified that have the highest activity in the simulation (e.g. the highest amount of switching). The methodology may include providing data to the routing tool that is to route the nets in the integrated circuit. The data may indicate constraints for the set of nets, to help reduce dynamic power on these nets. Power efficiency of the integrated circuit may be improved if the routing tool is able to honor the constraints.

Abstract: In an embodiment, a methodology for designing an integrated circuit that attempts to improve power efficiency is provided. The methodology includes simulating the design under one or more power stimuli, where the power stimuli are known to cause high power consumption (e.g. in previous designs of the integrated circuit, the power stimuli may have caused power consumption). A set of nets within the integrated circuit may be identified that have the highest activity in the simulation (e.g. the highest amount of switching). The methodology may include providing data to the routing tool that is to route the nets in the integrated circuit. The data may indicate constraints for the set of nets, to help reduce dynamic power on these nets. Power efficiency of the integrated circuit may be improved if the routing tool is able to honor the constraints.

Abstract: In an embodiment, a design methodology and tools to implement the methodology are used to perform scan insertion in an integrated circuit design. The physical location of the scan chains within the boundaries of the integrated circuit may be determined, and the methodology may use the physical information to perform the scan insertion. For example, the physical information may include the location of the inputs and outputs of the scan chains, as well as routability data indicating the ability to insert interconnect in the integrated circuit to make the desired scan connections. The location and routability information may be used to group scan chain inputs and outputs for, e.g., compression/decompression logic. Using physical data to insert scan compression/decompression logic may reduce the amount of area occupied by the scan logic and connectivity, in some embodiments.

Abstract: In one embodiment, a design methodology is described in which a functional description of each macro may be synthesized along with the other logic in a block. The resulting circuitry, including synthesized circuitry corresponding to each macro, may be placed within an area designated for the integrated circuit. The result may be analyzed, determining a location for the macro based on the location of the corresponding synthesized circuitry. For example, the geometric center of the synthesized circuitry may be located, and the geometric center of the custom circuitry associated with the macro may be placed at the same point as the geometric center of the synthesized circuitry. Because the macros are not placed in advance, the location of the macro may be controlled by other factors such as timing, space, wiring congestion, etc.

Abstract: In one embodiment, a design methodology is described in which a functional description of each macro may be synthesized along with the other logic in a block. The resulting circuitry, including synthesized circuitry corresponding to each macro, may be placed within an area designated for the integrated circuit. The result may be analyzed, determining a location for the macro based on the location of the corresponding synthesized circuitry. For example, the geometric center of the synthesized circuitry may be located, and the geometric center of the custom circuitry associated with the macro may be placed at the same point as the geometric center of the synthesized circuitry. Because the macros are not placed in advance, the location of the macro may be controlled by other factors such as timing, space, wiring congestion, etc.

Abstract: In an embodiment, a design methodology and tools to implement the methodology are used to perform scan insertion in an integrated circuit design. The physical location of the scan chains within the boundaries of the integrated circuit may be determined, and the methodology may use the physical information to perform the scan insertion. For example, the physical information may include the location of the inputs and outputs of the scan chains, as well as routability data indicating the ability to insert interconnect in the integrated circuit to make the desired scan connections. The location and routability information may be used to group scan chain inputs and outputs for, e.g., compression/decompression logic. Using physical data to insert scan compression/decompression logic may reduce the amount of area occupied by the scan logic and connectivity, in some embodiments.