Patents by Inventor Myungchul Jun

Myungchul Jun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Array testing method using electric bias stress for TFT array
    Patent number: 7327158
    Abstract: A method of detecting thin film transistor (TFT) defects in a TFT-liquid crystal display (LCD) panel, includes, in part, applying a stress bias to the TFTs disposed on the panel; and detecting a change in electrical characteristics of the TFTs. The change in the electrical characteristics of the TFTs may be detected using a voltage imaging optical system or an electron beam. The panel temperature may be varied while the bias stress is being applied. The change in the electrical characteristics is optionally detected across an array of the TFTs.
    Type: Grant
    Filed: July 31, 2006
    Date of Patent: February 5, 2008
    Assignee: Photon Dynamics, Inc.
    Inventor: Myungchul Jun
  • ARRAY TESTING METHOD USING ELECTRIC BIAS STRESS FOR TFT ARRAY
    Publication number: 20080024157
    Abstract: A method of detecting thin film transistor (TFT) defects in a TFT-liquid crystal display (LCD) panel, includes, in part, applying a stress bias to the TFTs disposed on the panel; and detecting a change in electrical characteristics of the TFTs. The change in the electrical characteristics of the TFTs may be detected using a voltage imaging optical system or an electron beam. The panel temperature may be varied while the bias stress is being applied. The change in the electrical characteristics is optionally detected across an array of the TFTs.
    Type: Application
    Filed: July 31, 2006
    Publication date: January 31, 2008
    Applicant: Photon Dynamics, Inc.
    Inventor: Myungchul Jun