Abstract: A system and method for recording conversation voice signals in a wireless terminal. The wireless terminal determines whether a current conversation state is a silence state or a voice state. If the current conversation state is a voice state, the wireless terminal stores packet data. If the current conversation state is a silence state, the wireless terminal stores information regarding the number of silence frames.

Abstract: A fast search method for searching for an optimum codeword for nearest neighbor vector quantization. An upper boundary value and a lower boundary value between which an optimum codeword will exist in a codebook are calculated using a distortion of a designated element in an input vector and an experimentally determined threshold. Further, a start point and an end point for codebook search are determined using a binary search method from a codebook rearranged in descending order, and a full search scheme is applied only within a search range calculated by the determined start point and end point, thereby determining an optimum codeword for nearest neighbor vector quantization.

Abstract: A fast search method for searching for an optimum codeword for nearest neighbor vector quantization. An upper boundary value and a lower boundary value between which an optimum codeword will exist in a codebook are calculated using a distortion of a designated element in an input vector and an experimentally determined threshold. Further, a start point and an end point for codebook search are determined using a binary search method from a codebook rearranged in descending order, and a full search scheme is applied only within a search range calculated by the determined start point and end point, thereby determining an optimum codeword for nearest neighbor vector quantization.

Abstract: In order to verify whether defects generated when the manufacturing process is in progress results in the electric failures during the operation of the devices, and to verify which process the defects which cause electric failures are generated in, there is provided a method for analyzing defects in a semiconductor device, including the steps of: measuring the positions of physical defects generated in each process; converting the positions of said the physical defects into logic row/column address data; and comparing said logic row/column address data converted from positions of said physical defects with electric failure data which are measured after the overall processes are completed.