Patents by Inventor Naohiko Nishigaki

Naohiko Nishigaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8028255
    Abstract: A semiconductor integrated circuit including a user logic circuit is disclosed in which circuit parts for shifting data are composed of registers other than scan cells except for the circuit part right after a combinational circuit, and the parts configured of the registers other than the scan cells are used as a scan path.
    Type: Grant
    Filed: February 21, 2008
    Date of Patent: September 27, 2011
    Assignee: Ricoh Company, Ltd.
    Inventors: Tomoki Satoi, Naohiko Nishigaki
  • Patent number: 7981903
    Abstract: Novel pyrrolopyrimidines as shown in formula (I): and pharmaceutically acceptable derivatives thereof. The compounds are useful in the inhibition of IGF-1R.
    Type: Grant
    Filed: August 6, 2008
    Date of Patent: July 19, 2011
    Assignee: GlaxoSmithKline LLC
    Inventors: Stanley Dawes Chamberlain, Felix Deanda, Jr., Roseanne Gerding, Masaichi Hasegawa, Kevin Kuntz, Huangshu Lei, Yasushi Miyazaki, Naohiko Nishigaki, Samarjit Patnaik, Aniko Redman, John Brad Shotwell, Kirk Stevens, Joseph Wilson, Bin Yang
  • Patent number: 7836370
    Abstract: A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.
    Type: Grant
    Filed: March 5, 2008
    Date of Patent: November 16, 2010
    Assignee: Ricoh Company, Ltd.
    Inventors: Tomoki Satoi, Naohiko Nishigaki
  • Publication number: 20100204196
    Abstract: Novel pyrrolopyrimidines as shown in formula (I): and pharmaceutically acceptable derivatives thereof. The compounds are useful in the inhibition of IGF-1R.
    Type: Application
    Filed: August 6, 2008
    Publication date: August 12, 2010
    Inventors: Stanley Dawes Chamberlain, Felix Deanda, JR., Roseanne Gerding, Masaichi Hasegawa, Kevin Kuntz, Huangshu Lei, Yasushi Miyazaki, Naohiko Nishigaki, Samarjit Patnaik, Aniko Redman, John Brad Shotwell, Kirk Stevens, Joseph Wilson, Bin Yang
  • Publication number: 20080222470
    Abstract: A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.
    Type: Application
    Filed: March 5, 2008
    Publication date: September 11, 2008
    Inventors: Tomoki Satoi, Naohiko Nishigaki
  • Publication number: 20080222592
    Abstract: A semiconductor integrated circuit including a user logic circuit is disclosed in which circuit parts for shifting data are composed of registers other than scan cells except for the circuit part right after a combinational circuit, and the parts configured of the registers other than the scan cells are used as a scan path.
    Type: Application
    Filed: February 21, 2008
    Publication date: September 11, 2008
    Inventors: Tomoki Satoi, Naohiko Nishigaki
  • Publication number: 20070249600
    Abstract: Benzimidazole derivatives, which are useful as TIE-2 and/or VEGFR2 inhibitors are described herein. The described invention also includes methods of making such benzimidazole derivatives as well as methods of using the same in the treatment of hyperproliferative diseases.
    Type: Application
    Filed: June 15, 2007
    Publication date: October 25, 2007
    Inventors: Mui Cheung, Philip Harris, Masaichi Hasegawa, Satoru Ida, Kazuya Kano, Naohiko Nishigaki, Hideyuki Sato, James Veal, Yoshiaki Washio, Rob West
  • Patent number: 7238813
    Abstract: Benzimidazole derivatives, which are useful as TIE-2 and/or VEGFR2 inhibitors are described herein. The described invention also includes methods of making such benzimidazole derivatives as well as methods of using the same in the treatment of hyperproliferative diseases.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: July 3, 2007
    Assignee: Smithkline Beecham Corporation
    Inventors: Mui Cheung, Philip Anthony Harris, Masaichi Hasegawa, Satoru Ida, Kazuya Kano, Naohiko Nishigaki, Hideyuki Sato, James Marvin Veal, Yoshiaki Washio, Rob I. West
  • Publication number: 20040082583
    Abstract: Benzimidazole derivatives, which are useful as TIE-2 and/or VEGFR2 inhibitors are described herein. The described invention also includes methods of making such benzimidazole derivatives as well as methods of using the same in the treatment of hyperproliferative diseases.
    Type: Application
    Filed: November 12, 2003
    Publication date: April 29, 2004
    Inventors: Mui Cheung, Philip Anthony Harris, Masaichi Hasegawa, Satoru Ida, Kazuya Kano, Naohiko Nishigaki, Hideyuki Sato, James Marvin Veal, Yoshiaki Washio, Rob I. West
  • Patent number: 5706294
    Abstract: A DC test point finding method includes steps of: displaying a list of all input and output terminals of an integrated circuit; inputting selected terminals among the terminals of the list; inputting a selected test pattern file among a number of stored test pattern files, each test pattern file including a plurality of sequentially occurred test vectors and identified by a name of the test pattern file, the test vectors identified by respective vector numbers; inputting a test point finding condition related to a DC test point; finding the DC test point of the circuit among the selected terminals by using the test vectors of the selected test pattern file and the test point finding condition; and inserting test point data of the DC test point into the list so that the resulting list including the test point data is displayed.
    Type: Grant
    Filed: June 25, 1996
    Date of Patent: January 6, 1998
    Assignee: Ricoh Company, Ltd.
    Inventors: Toshihiro Takahashi, Toshiya Murota, Naohiko Nishigaki