Patents by Inventor Naoji Horiuchi

Naoji Horiuchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7383143
    Abstract: A correction method for correcting measurement error in data obtained when a stylus tip of a measurement apparatus that moves following the height of a workpiece traces the workpiece along a measurement axis, the measurement error having occurred due to stylus movement in a plane defined by the measurement axis and height directions, the method includes a calibration measurement process of obtaining calibration measurement data that includes shift information on the position of the stylus tip, corresponding to the position of the stylus tip in the height directions while the stylus is moved in the correction target plane and a correction-parameter setting process obtaining a correction parameter value optimal to correct the shift information on the position of the stylus tip, included in the calibration measurement data, for each of the sectors obtained by dividing a measurement range in the height directions.
    Type: Grant
    Filed: January 30, 2007
    Date of Patent: June 3, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Tomonori Goto, Soichi Kadowaki, Naoji Horiuchi, Jyota Miyakura
  • Publication number: 20070192052
    Abstract: A correction method for correcting measurement error in data obtained when a stylus tip of a measurement apparatus that moves following the height of a workpiece traces the workpiece along a measurement axis, the measurement error having occurred due to stylus movement in a plane defined by the measurement axis and height directions, the method comprising the step of: a calibration measurement process of obtaining calibration measurement data that includes shift information on the position of the stylus tip, corresponding to the position of the stylus tip in the height directions while the stylus is moved in the correction target plane; and a correction-parameter setting process of simultaneously obtaining a correction parameter value optimal to correct the shift information on the position of the stylus tip, included in the calibration measurement data, for each of the sectors obtained by dividing a measurement range in the height directions.
    Type: Application
    Filed: January 30, 2007
    Publication date: August 16, 2007
    Applicant: MITUTOYO CORPORATION
    Inventors: Tomonori Goto, Soichi Kadowaki, Naoji Horiuchi, Jyota Miyakura
  • Patent number: 7096149
    Abstract: Method for determining a coordinate system including a preliminary measurement step in which a detector of a coordinate measuring apparatus is used to scan first measurement areas of the device to obtain position coordinate information and the detector is used to scan a second measurement area that is not on a straight line connecting the first measurement areas to obtain position coordinate information; a feature-point detection step of obtaining the position of a feature point in each of the measurement areas according to a result of measurement; a reference-line determination step of obtaining a first reference line according to the position of each feature point in the first measurement areas, and obtaining a second reference line perpendicular to the first reference line and passing through a feature point located in the second measurement area; an origin-setting step; and an axis setting step.
    Type: Grant
    Filed: January 18, 2005
    Date of Patent: August 22, 2006
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Fumihiro Takemura, Naoji Horiuchi
  • Publication number: 20050155242
    Abstract: A method for determining a coordinate system for a device under measurement comprises: a preliminary measurement step in which a detector of a coordinate measuring apparatus is used to scan first measurement areas which include two or more feature portions of the device under measurement to obtain position coordinate information and the detector is used to scan a second measurement area which includes one or more feature portions that are not on a straight line connecting the first measurement areas to obtain position coordinate information; a feature-point detection step of obtaining the position of a feature point in each of the measurement areas according to a result of measurement; a reference-line determination step of obtaining a first reference line according to the position of each feature point in the first measurement areas, and of obtaining a second reference line perpendicular to the first reference line and passing through a feature point located in the second measurement area; an origin-setting
    Type: Application
    Filed: January 18, 2005
    Publication date: July 21, 2005
    Applicant: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Fumihiro Takemura, Naoji Horiuchi
  • Patent number: 6701266
    Abstract: The measurement data fairing method includes: determining an interval in which a geometrical element is to be fitted to measurement data; extracting, from the data, interval measurement data of the fitting interval and robustly fitting the element; removing, on the basis of a result of the robust fitting, outlier from the interval measurement data; computing a statistic of a residual of the interval measurement data after the outlier removing step; and removing, as invalid data, measurement data that exceeds a predetermined limit value of the statistic of the residual from the interval measurement data after the outlier removing step on the basis of the statistic of the residual computed in the computing step.
    Type: Grant
    Filed: March 17, 2003
    Date of Patent: March 2, 2004
    Assignee: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Naoji Horiuchi, Tomonori Goto
  • Publication number: 20030188445
    Abstract: The measurement data fairing method comprises: a fitting interval determination step (S14) for determining an interval in which a geometrical element is to be fitted to measurement data; a geometrical element fitting step (S22) for extracting, from the data, interval measurement data of the fitting interval and robustly fitting the element; an outlier removal step (S24) for removing, on the basis of a result of the robust fitting, outlier from the interval measurement data; a statistic computation step (S26) for computing a statistic of a residual of the interval measurement data after the step (S24); and an invalid data removal step (S28) for removing, as invalid data, measurement data that exceeds a predetermined limit value of the statistic of the residual from the interval measurement data after the step (S24) on the basis of the statistic of the residual computed in the step (S26).
    Type: Application
    Filed: March 17, 2003
    Publication date: October 9, 2003
    Applicant: Mitutoyo Corporation
    Inventors: Soichi Kadowaki, Naoji Horiuchi, Tomonori Goto