Patents by Inventor Naokazu Sakoda
Naokazu Sakoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9097514Abstract: Boundary lines which are contours of uneven marks are detected in a sample original image of the sidewall surface of a sample tire, and a mask image showing the position of the boundary lines is generated. Thereupon, a height offset image which shows a height of the uneven marks is generated by, in use of a plurality of discrete height threshold values, classifying the height of regions in the sample original image which remain after excluding regions corresponding to the positions of the boundary lines shown in the mask image. An unevenness-excluded image is generated by excluding the uneven marks from an inspection image of a sidewall surface of a tire under inspection, by subtracting the height offset image from the inspection image. A shape defect in the sidewall surface of the tire under inspection is inspected on the basis of the unevenness-excluded image.Type: GrantFiled: December 2, 2010Date of Patent: August 4, 2015Assignee: Kobe Steel, Ltd.Inventors: Eiji Takahashi, Naokazu Sakoda, Toshiyuki Tsuji, Hajime Takeda, Masao Murakami
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Patent number: 8952338Abstract: The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom.Type: GrantFiled: September 1, 2011Date of Patent: February 10, 2015Assignees: Kobe Steel, Ltd., Kobelco Research Institute Inc.Inventors: Naokazu Sakoda, Hiroyuki Takamatsu, Masahiro Inui, Futoshi Ojima
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Publication number: 20130153778Abstract: The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom.Type: ApplicationFiled: September 1, 2011Publication date: June 20, 2013Applicants: KOBELCO RESEARCH INSTITUTE, INC., KABUSHIKI KAISHA KOBE SEIKO SHO (Kobe Steel, Ltd.)Inventors: Naokazu Sakoda, Hiroyuki Takamatsu, Masahiro Inui, Futoshi Ojima
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Patent number: 8284393Abstract: Disclosed is a tire shape inspection method that can reliably and without misidentification perform accurate shape defect inspection in a short period of time by excluding measurement values in a range in which embossed marks are formed from distribution information for surface height measurement values on the sidewall surface of a tire. In the method, a processor automatically detects the positions of the embossed marks based on sample surface shape information obtained from a sample of the tire, and automatically sets coordinate information for a mask range surrounding the area where said marks are present (S2-S15). The processor also causes a surface shape image based on the sample surface shape information and a mask range image based on the coordinate information for the mask range to be displayed superimposed on a display means, and changes the coordinate information for the mask range according to an operating input (S16).Type: GrantFiled: June 3, 2009Date of Patent: October 9, 2012Assignee: Kobe Steel, Ltd.Inventors: Eiji Takahashi, Naokazu Sakoda
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Publication number: 20120242824Abstract: Boundary lines which are contours of uneven marks are detected in a sample original image of the sidewall surface of a sample tyre, and a mask image showing the position of the boundary lines is generated. Thereupon, a height offset image which shows a height of the uneven marks is generated by, in use of a plurality of discrete height threshold values, classifying the height of regions in the sample original image which remain after excluding regions corresponding to the positions of the boundary lines shown in the mask image. An unevenness-excluded image is generated by excluding the uneven marks from an inspection image of a sidewall surface of a tyre under inspection, by subtracting the height offset image from the inspection image. A shape defect in the sidewall surface of the tyre under inspection is inspected on the basis of the unevenness-excluded image.Type: ApplicationFiled: December 2, 2010Publication date: September 27, 2012Applicant: KABUSHIKI KAISHA KOBE SEIKO SHO (Kobe Steel, Ltd.)Inventors: Eiji Takahashi, Naokazu Sakoda, Toshiyuki Tsuji, Hajime Takeda, Masao Murakami
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Publication number: 20120203473Abstract: In a semiconductor carrier lifetime measuring apparatus A1 of the present invention, at least two types of light having mutually different wavelengths are irradiated onto a semiconductor X to be measured, a predetermined measurement wave is irradiated onto the semiconductor X to be measured, a reflected wave of the measurement wave that has been reflected by the semiconductor X to be measured or a transmitted wave of the measurement wave that has transmitted through the semiconductor X to be measured is detected, and the carrier lifetime in the semiconductor X to be measured is obtained based on the detection results so as to minimize the error. Accordingly, the semiconductor carrier lifetime measuring apparatus A1 configured as described above can more accurately measure the carrier lifetime.Type: ApplicationFiled: October 1, 2010Publication date: August 9, 2012Applicants: KOBELCO RESEARCH INSTITUTE, INC., KABUSHIKI KAISHA KOBE SEIKO SHOInventors: Kazushi Hayashi, Hiroyuki Takamatsu, Yoshito Fukumoto, Naokazu Sakoda, Masahiro Inui, Shingo Sumie
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Publication number: 20110069323Abstract: Disclosed is a tire shape inspection method that can reliably and without misidentification perform accurate shape defect inspection in a short period of time by excluding measurement values in a range in which embossed marks are formed from distribution information for surface height measurement values on the sidewall surface of a tire. In the method, a processor automatically detects the positions of the embossed marks based on sample surface shape information obtained from a sample of the tire, and automatically sets coordinate information for a mask range surrounding the area where said marks are present (S2-S15). The processor also causes a surface shape image based on the sample surface shape information and a mask range image based on the coordinate information for the mask range to be displayed superimposed on a display means, and changes the coordinate information for the mask range according to an operating input (S16).Type: ApplicationFiled: June 3, 2009Publication date: March 24, 2011Inventors: Eiji Takahashi, Naokazu Sakoda
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Patent number: 7755772Abstract: A tire shape measuring system measures a surface shape on the basis of an image of a line of light (a light section line) emitted to a surface of a relatively rotating tire using a light-section method. The shape measuring system includes a light projector for emitting a plurality of lines of light onto a tire surface in directions different from a direction in which the height of the surface is detected so as to form a plurality of separate light section lines and a camera for capturing images of the light section lines in directions in which chief rays of the lines of light are specularly reflected by the tire surface. The shape measuring system individually detects the coordinates of the light section lines from images of pre-defined independent image processing target areas for each captured image and calculates the distribution of the surface height using the detected coordinates.Type: GrantFiled: July 30, 2008Date of Patent: July 13, 2010Assignee: Kobe Steel, Ltd.Inventors: Eiji Takahashi, Naokazu Sakoda, Tsutomu Morimoto
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Patent number: 7724377Abstract: A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface.Type: GrantFiled: September 17, 2007Date of Patent: May 25, 2010Assignee: Kobe Steel, Ltd.Inventors: Naokazu Sakoda, Eiji Takahashi, Tsutomu Morimoto, Yasuhiro Matsushita, Toshikatsu Nonaka, Shiro Horiguchi
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Patent number: 7522287Abstract: A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.Type: GrantFiled: February 10, 2006Date of Patent: April 21, 2009Assignee: Kobe Steel, Ltd.Inventors: Eiji Takahashi, Hiroyuki Takamatsu, Masato Kannaka, Naokazu Sakoda, Tsutomu Morimoto
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Publication number: 20090046566Abstract: Provided is a recording layer for optical information storage media, which not only excels in initial reflectivity and creativity of recording marks, but also extremely excels in durability under high temperature and high humidity conditions, and which can be adequately applied to next-generation optical discs using blue-violet laser. The recording layer for optical information storage media is a recording layer to create recording marks upon irradiation with a laser beam. This recording layer is composed of a tin-based alloy containing a total of 1.0 atomic percent or more and 15 atomic percent or less of at least one selected from neodymium (Nd), gadolinium (Gd), and lanthanum (La).Type: ApplicationFiled: October 17, 2006Publication date: February 19, 2009Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel Ltd.)Inventors: Hideo Fujii, Tatewaki Ido, Yuki Tauchi, Naokazu Sakoda
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Publication number: 20090040533Abstract: A tire shape measuring system measures a surface shape on the basis of an image of a line of light (a light section line) emitted to a surface of a relatively rotating tire using a light-section method. The shape measuring system includes a light projector for emitting a plurality of lines of light onto a tire surface in directions different from a direction in which the height of the surface is detected so as to form a plurality of separate light section lines and a camera for capturing images of the light section lines in directions in which chief rays of the lines of light are specularly reflected by the tire surface. The shape measuring system individually detects the coordinates of the light section lines from images of pre-defined independent image processing target areas for each captured image and calculates the distribution of the surface height using the detected coordinates.Type: ApplicationFiled: July 30, 2008Publication date: February 12, 2009Inventors: Eiji Takahashi, Naokazu Sakoda, Tsutomu Morimoto
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Publication number: 20080218742Abstract: A tire shape detecting apparatus includes a projector that applies a plurality line light beams in a continuously joined manner, from a direction different from the detection height direction (Z-axis direction) in one light section line, or that applies one line light beam in a condensed manner in the line length direction thereof in order that the one light section line may be formed on the one line Ls on the surface of the tire; and a camera for picking up images of the plurality of line light beams applied to the tire surface in the direction in which the principal ray of each of the plurality of line light beams performs specular reflection with respect to the tire surface, or in the direction in which the principal ray of the condensed one line light beam performs specular reflection with respect to the tire surface.Type: ApplicationFiled: September 17, 2007Publication date: September 11, 2008Inventors: Naokazu Sakoda, Eiji Takahashi, Tsutomu Morimoto, Yasuhiro Matsushita, Toshikatsu Nonaka, Shiro Horiguchi
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Publication number: 20060181708Abstract: A liquid sample is irradiated with excitation light and measurement light, and a measurement position at which a traveling path of the measurement light passes through an excitation section of the excitation light in the sample is changed while the sample is being irradiated with the excitation light and the measurement light. Then, the phase change of the measurement light is measured for each measurement by optical interferometry on the basis of the measurement light after the measurement light passes through the sample. The measurement position is changed by, for example, scanning the excitation light, moving the sample, moving a lens that collects the excitation light in the sample so as to change the light-collecting position (focal position) in the sample, etc.Type: ApplicationFiled: February 10, 2006Publication date: August 17, 2006Inventors: Eiji Takahashi, Hiroyuki Takamatsu, Masato Kannaka, Naokazu Sakoda, Tsutomu Morimoto
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Patent number: 5439866Abstract: A novel silver-containing tobermorite usable in place of silver-, copper- or zing-incorporating zeolites and having ethylene-adsorbing ability and antibacterial properties. Stated more particularly, a silver-containing tobermorite having a composition of [Ca.sub.5-Y/2 Ag.sub.Y+Z M.sub.x-z (Si.sub.6-x Al.sub.x O.sub.18 H.sub.2).4H.sub.2 O, 0.ltoreq.X.ltoreq.1, 0.001.ltoreq.Y.ltoreq.2, 0.ltoreq.Z.ltoreq.0.1, M is a monovalent cation] and prepared from a tobermorite [Ca.sub.5 M.sub.x (Si.sub.6-x Al.sub.x O.sub.18 H.sub.2).4H.sub.2 O, 0.ltoreq.X.ltoreq.1, M is as defined above] by exchanging Ca.sup.2+, or Ca.sup.2+ and a monovalent cation which are interlayer ions of the tobermorite for silver ion. The silver-containing tobermorite is excellent in heat resistance, water resistance and mechanical strength, and also outstanding in ethylene-adsorbing ability and antibacterial properties.Type: GrantFiled: November 1, 1993Date of Patent: August 8, 1995Assignee: Rengo Co., Ltd.Inventors: Naokazu Sakoda, Kouju Sugiyama