Patents by Inventor Naoki Isogai

Naoki Isogai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6616278
    Abstract: An eye examination device includes an eye examination unit for examining or measuring an eye of an examinee; a carrying case including a first housing part for housing the eye examination unit and a base part which mounts thereon the eye examination unit; a horizontal movement unit which moves the eye examination unit in a horizontal direction with respect to the base part; and a vertical movement unit which moves the eye examination unit in a vertical direction with respect to the base part.
    Type: Grant
    Filed: August 27, 2001
    Date of Patent: September 9, 2003
    Assignee: Nidek Co., Ltd.
    Inventors: Mitsuhiro Gohno, Mikio Kurachi, Naoki Isogai
  • Patent number: 6588902
    Abstract: An ophthalmic apparatus provided with an ophthalmic unit for examination, measurement, or treatment, the unit having a center axis which is aligned with respect to an examinee's eye, is disclosed. This apparatus includes an observation unit through which an image of an anterior part of the examinee's eye is observed; a position detection unit which projects light to the examinee's eye and detects reflection light from the examinee's eye to obtain a position of a center of a cornea or a pupil of the examinee's eye; and a display which displays a graphic mark showing the corneal center or the pupil center with an aiming mark based on a detection result by the position detection means, the marks being superimposed on the anterior part image formed by the observation means.
    Type: Grant
    Filed: September 25, 2001
    Date of Patent: July 8, 2003
    Assignee: Nidek Co., Ltd.
    Inventor: Naoki Isogai
  • Publication number: 20030107708
    Abstract: A shape measurement apparatus capable of saving time and effort of an examiner and improving measurement accuracy. The apparatus for measuring a spherical shape of an object to be examined comprising a measurement unit where a first projection optical system projects first targets for measurement onto a spherical surface to be measured, a first detection optical system detects images of the projected first targets and a calculation unit obtains a shape of the surface based on the detected images, an output unit which outputs the obtained shape, a mode setting unit which sets any one of a first measurement mode for a convex shape and a second measurement mode for a concave shape, and a condition setting unit which sets at least one of a measurement condition and an output condition based on a mode setting result, the conditions being different between the first and second measurement modes.
    Type: Application
    Filed: December 6, 2002
    Publication date: June 12, 2003
    Applicant: NIDEK CO., LTD.
    Inventor: Naoki Isogai
  • Publication number: 20020036749
    Abstract: An ophthalmic apparatus provided with an ophthalmic unit for examination, measurement, or treatment, the unit having a center axis which is aligned with respect to an examinee's eye, is disclosed. This apparatus includes an observation unit through which an image of an anterior part of the examinee's eye is observed; a position detection unit which projects light to the examinee's eye and detects reflection light from the examinee's eye to obtain a position of a center of a cornea or a pupil of the examinee's eye; and a display which displays a graphic mark showing the corneal center or the pupil center with an aiming mark based on a detection result by the position detection means, the marks being superimposed on the anterior part image formed by the observation means.
    Type: Application
    Filed: September 25, 2001
    Publication date: March 28, 2002
    Applicant: Nidek Co., Ltd.
    Inventor: Naoki Isogai
  • Publication number: 20020027639
    Abstract: An eye examination device includes an eye examination unit for examining or measuring an eye of an examinee; a carrying case including a first housing part for housing the eye examination unit and a base part which mounts thereon the eye examination unit; a horizontal movement unit which moves the eye examination unit in a horizontal direction with respect to the base part; and a vertical movement unit which moves the eye examination unit in a vertical direction with respect to the base part.
    Type: Application
    Filed: August 27, 2001
    Publication date: March 7, 2002
    Applicant: NIDEK CO., LTD.
    Inventors: Mitsuhiro Gohno, Mikio Kurachi, Naoki Isogai
  • Patent number: 6123423
    Abstract: An ophthalmic apparatus comprising a measurement unit and a peripheral unit each of which is contained in a separate housing, wherein the measurement unit includes a measurement device for measuring a characteristic of an eye to be examined and a sending device capable of sending a signal for sending measurement data obtained by the measurement device in an unformatted state for output, and the peripheral unit includes a receiving device for receiving the signal sent by the sending device, an output device for outputting the measurement data received by the receiving device, a storage device for storing output format data used to format the measurement data upon output by the output device and an output control device for formatting the measurement data using the output format data and for controlling the output device so as to produce output.
    Type: Grant
    Filed: November 3, 1999
    Date of Patent: September 26, 2000
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Hiroyoshi Nakanishi
  • Patent number: 6056404
    Abstract: An ophthalmic apparatus for examining or measuring an eye to be examined, having an alignment optical system for aligning a position of the eye and that of a measuring system so as to be the predetermined positional relationship therebetween, the apparatus comprising a projecting device having a light source for projecting a pencil onto an examinee's face, a photo-receiving device which is an optical system having a positional detector for receiving reflex caused by the projecting device, the photo-receiving device having a detecting area which includes a right boundary of the examinee's face under the condition of being aligned with a right eye and a left boundary of the examinee's face under the condition of being aligned with a left eye, and a judging device for judging whether the eye is a right eye or a left eye in a manner of judging whether a face's boundary is the right boundary or the left boundary based on results detected by the photo-receiving device.
    Type: Grant
    Filed: July 1, 1998
    Date of Patent: May 2, 2000
    Assignee: Nidek Co., Ltd.
    Inventors: Noriji Kawai, Naoki Isogai
  • Patent number: 5940165
    Abstract: An ophthalmic apparatus including measurement device for measuring visual performance of an eye to be examined and alignment device for aligning the measurement device relative to the eye, the apparatus comprising condition setting device for setting a finish condition capable of finishing measurement, which indicates that the necessary measured result is obtained, judging device for judging whether the result obtained by the measurement device satisfies the finish condition or not, and informing device for informing an operator that the finish condition is satisfied at the time when it is judged by the judging device.
    Type: Grant
    Filed: January 29, 1998
    Date of Patent: August 17, 1999
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Noriji Kawai
  • Patent number: 5909269
    Abstract: An ophthalmic apparatus comprising a measuring device for inspecting or measuring a patient's eye, a moving device for moving the measuring device relative to the patient's eye, a designating device for designating an eye to be measured, photographing device capable of photographing a face including both eyes, first detecting device for detecting positional relationship between the measuring device and each of right and left eyes respectively based on an image signal from the photographing device, an alignment detecting device for detecting an alignment condition of the measuring device relative to the eye, and a leading device for leading the moving device so that the measuring device may be alined within the predetermined range relative to the eye based on results detected by the first detecting device and the alignment detecting device.
    Type: Grant
    Filed: February 10, 1998
    Date of Patent: June 1, 1999
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Mikio Kurachi
  • Patent number: 5909268
    Abstract: An alignment detecting apparatus for detecting an alignment condition between an eye to be examined having approximately spherical surface or approximately toric surface and a device having a standard axial lines the apparatus comprising a target projecting optical system which includes a first target projecting optical system for projecting a first target with a predetermined angle relative to the standard axial line, and a second target projecting optical system for projecting a second target with a different angle compared with the angle of the first target projecting optical system relative to the standard axial lines of which at least one between the first and second targets is a target of a finite distances a detecting optical system for detecting positions of images of the first and second targets which are projected onto the eye by the first and second target projecting optical systems, and a judging device for judging the alignment condition based on results detected by the detecting optical system.
    Type: Grant
    Filed: October 27, 1997
    Date of Patent: June 1, 1999
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Koki Kato, Nobuharu Kobayashi, Mitsuhiro Gono, Noriyuki Ishihara
  • Patent number: 5905562
    Abstract: In an ophthalmic apparatus for measuring an eye to be examined, an picture image photographed by a TV camera is processed by image processing circuit, and a position of alignment target image is detected so as to detect an alignment condition of measuring unit opposite to the eye to be examined. The suitability of the alignment condition is judged by a microcomputer, and when it is judged that the alignment condition is proper, a trigger signal is generated so as to start a measurement. Upon the measurement or after the measurement is completed, in case that the alignment condition is detected, the suitability of the alignment condition is judged, and it is judged that the alignment condition deviates from a predetermined allowable condition, a measured result which is obtained by a measurement performance is cancelled, or the measured result is corrected based on a detected result by an alignment detection.
    Type: Grant
    Filed: July 18, 1997
    Date of Patent: May 18, 1999
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Noriji Kawai
  • Patent number: 5844659
    Abstract: An ophthalmic apparatus for measuring a refractive power of an eye to be examined, the ophthalmic apparatus providing an alignment detecting device for detecting an alignment condition of the apparatus corresponding to the eye to be examined by projecting a light so as to form a target onto the eye to be examined and detecting the target, a first judging device for judging whether the alignment condition of up-down/left-right directions is within a predetermined allowable condition based on the detected result of the alignment detecting device, a refractive power temporary measuring device for measuring a temporary refractive power value of the eye to be examined by generating a measurement start signal when it is judged by the first judging device that the alignment condition of up-down/ left-right directions is within the predetermined allowable condition, variable means for varying an allowable condition of working distance based on a measured result of the refractive power temporary measuring device, and
    Type: Grant
    Filed: June 16, 1997
    Date of Patent: December 1, 1998
    Assignee: Nidek Co., LTD.
    Inventor: Naoki Isogai
  • Patent number: 5764341
    Abstract: An ophthalmic apparatus in which a measuring part for inspecting-or-measuring an eye to be examined is disposed so as to move relatively against a fixation stand, the ophthalmic apparatus comprises light source for use in detecting a relative movement, which is disposed in the one between the fixation stand side and the measuring part side, photo detecting elements for detecting a light bundle emitted from the light source for use in detecting a relative movement, which is disposed in the other between the fixation stand side and the measuring part side, target forming device for forming at least two target-images, that are transmitted from the light source for use in detecting a relative movement onto the photo detecting elements plane, upon before and after the movement according to the relative movement by the measuring device against the fixation stand, and calculating device for calculating a relative position of the measuring part against the fixation stand based on a detecting information of the target
    Type: Grant
    Filed: November 25, 1996
    Date of Patent: June 9, 1998
    Assignee: Nidek Co., Ltd.
    Inventors: Masanao Fujieda, Naoki Isogai
  • Patent number: 5689325
    Abstract: A measuring unit is mounted on a movable stage, which is movable in the right-left and front-rear directions relative to a fixed base stage. When an examiner moves the movable stage to the right or to the left by manipulating a joy stick, a micro switch detects that movement. Upon reception of a detection signal from the micro switch, a microcomputer allows power to be supplied to measurement circuits, to initiate a measurement mode. When judging that proper alignment has been established, the microcomputer automatically calculates a cornea shape. Measurement and calculation of a cornea shape are repeated until a standard deviation of measurement data falls within a given value. Upon completion of the measurement operation, the microcomputer stops the supply of power to the measurement circuits, to cancel the measurement mode.
    Type: Grant
    Filed: April 19, 1996
    Date of Patent: November 18, 1997
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Masamichi Suzuki
  • Patent number: 5625428
    Abstract: An ophthalmic apparatus for measuring and observing an eye of an examinee comprising an observing optical system through which an examiner observes the examinee's eye, and a displaying device for providing indication marks to the cornea of the eye, the indication marks showing necessary information for the operator, wherein images of the indication marks reflected by the cornea are observed as superimposed on the examinee's eye.
    Type: Grant
    Filed: March 30, 1994
    Date of Patent: April 29, 1997
    Assignee: Nidek Co., Ltd.
    Inventor: Naoki Isogai
  • Patent number: 5563667
    Abstract: An ophthalmic apparatus for measuring an eye of an examinee, includes a device for detecting whether the eye is located within a predetermined area with respect to the apparatus, an interval time producing device for producing a prescribed interval time, a power supply device for supplying power intermittently to the detecting device in accordance with signals for the interval time producing device, and power supply signal generating device for generating a signal to supply a power required by the ophthalmic apparatus when the detecting device judges that the eye exists within the predetermined area.
    Type: Grant
    Filed: October 28, 1994
    Date of Patent: October 8, 1996
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Yoshiaki Mimura, Masanao Fujieda
  • Patent number: 5532772
    Abstract: An ophthalmic apparatus for use by an examiner in examining an examinee's eye includes an optical system for examining the examinee's eye, an observing optical path for observing the examinee's eye directly in binocular vision, a beam splitter disposed in the observing optical path, and a mark forming device for forming an aiming mark at a position conjugate to a predetermined portion of the anterior part of the eye, the light of the aiming mark being reflected by the light splitting member into the eyes of the examiner, wherein the positional relationship along the observing optical path between the anterior part of the examinee's eye and the aiming mark is perceived through the examiner's eyes and the suitability of the working distance of the apparatus can be judged.
    Type: Grant
    Filed: March 30, 1994
    Date of Patent: July 2, 1996
    Assignee: Nidek Co., Ltd.
    Inventors: Masanao Fujieda, Nobuyuki Yano, Yoshiaki Mimura, Naoki Isogai
  • Patent number: 5528323
    Abstract: An ophthalmic apparatus is provided with a measurement unit that includes a measurement device that projects measurement light onto an examinee's eye and detects the measurement light reflected by the examinee's eye, a grip that supports the measurement device, so that the examiner can hold the device in his hand, a wireless transmitting device that transmits data about the examinee's eye to a receiving device separate from the measurement unit, the data being obtained based on light detected by the measurement device, and a signal generating device that generates a start signal to make the transmitting device start to transmit; the receiving device receives the transmitted data about the examinee's eye and has a holding device that detachably holds the measurement unit for transmission of measurement data.
    Type: Grant
    Filed: October 29, 1993
    Date of Patent: June 18, 1996
    Assignee: Nidek Co., Ltd.
    Inventors: Masanao Fujieda, Naoki Isogai, Yoshiaki Mimura, Masamichi Suzuki
  • Patent number: 5463430
    Abstract: An examination apparatus for examining an object having a spheroidal reflecting surface provides a first index projecting optical system for projecting a first measuring index onto the object to be examined at a designated angle, a second index projecting optical system for projecting a second measuring index having a different optical distance from the first index onto the object at the designated angle, so that each reflected images of the first and second measuring index have a designated image height relationship therebetween when the object is placed at a designated working distance, and respective image height of reflected images of the first and second measuring index are detected by a detecting optical system with a photoelectric conversion apparatus, whereby whether the working distance between the object and the apparatus is right or not is judged by processing a signal detected by the photoelectric conversion apparatus.
    Type: Grant
    Filed: July 29, 1993
    Date of Patent: October 31, 1995
    Assignee: Nidek Co., Ltd.
    Inventors: Naoki Isogai, Yoshiaki Mimura, Masanao Fujieda
  • Patent number: 5406076
    Abstract: A joy stick mechanism for an ophthalmic apparatus moving an optical device of the ophthalmic apparatus horizontally and vertically, which mechanism is simple in structure but excellent in operational efficiency. Therefore, this mechanism comprises a drive device for moving the optical device vertically, a rotating knob rotatably provided on a shaft which substantially extends through a central portion of the mechanism, a detection device for detecting a direction and an amount of rotation of the rotating knob, and a control device for controlling the drive device on the basis of detection results of the detection device.
    Type: Grant
    Filed: April 27, 1993
    Date of Patent: April 11, 1995
    Assignee: Nidek Co., Ltd.
    Inventors: Yoshiaki Mimura, Tomohito Ishikawa, Naoki Isogai, Hirohisa Terabe